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Extract from the Register of European Patents

EP About this file: EP1385330

EP1385330 - Print quality measuring method and print quality measuring apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  18.10.2013
Database last updated on 11.09.2024
Most recent event   Tooltip09.05.2014Lapse of the patent in a contracting statepublished on 11.06.2014  [2014/24]
Applicant(s)For all designated states
Dainippon Screen Mfg. Co., Ltd.
1-1, Tenjinkitamachi, Teranouchi-agaru 4-chome, Horikawa-dori, Kamikyo-ku
Kyoto 602-8585 / JP
[2012/50]
Former [2004/05]For all designated states
Dainippon Screen Mfg. Co., Ltd.
1-1, Tenjinkitamachi, Teranouchi-agaru 4-chome, Horikawa-dori, Kamikyo-ku
Kyoto 602-8585 / JP
Inventor(s)01 / Murakami, Shigeo, @Dainippon Screen Mfg. Co. Ltd.
1-1 Tenjinkitamachi
Teranouchi-agaru 4-chome
Horikawa-dori, Kamikyo-ku, Kyoto 602-8585 / JP
 [2012/50]
Former [2004/05]01 / Murakami, Shigeo, Dainippon Screen Mfg. Co. Ltd.
1-1 Tenjinkitamachi, Teranouchi-agaru 4-chome
Horikawa-dori, Kamikyo-ku, Kyoto 602-8585 / JP
Representative(s)Kilian Kilian & Partner mbB
Zielstattstraße 23a
81379 München / DE
[N/P]
Former [2013/09]Kilian Kilian & Partner
Aidenbachstraße 54
81379 München / DE
Former [2012/50]Kilian, Helmut
Wilhelms, Kilian & Partner Patentanwälte Eduard-Schmid-Strasse 2
81541 München / DE
Former [2004/05]Kilian, Helmut, Dr.
Wilhelms, Kilian & Partner Patentanwälte Eduard-Schmid-Strasse 2
81541 München / DE
Application number, filing date03015450.409.07.2003
[2004/05]
Priority number, dateJP2002021087219.07.2002         Original published format: JP 2002210872
[2004/05]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1385330
Date:28.01.2004
Language:EN
[2004/05]
Type: A3 Search report 
No.:EP1385330
Date:28.02.2007
[2007/09]
Type: B1 Patent specification 
No.:EP1385330
Date:12.12.2012
Language:EN
[2012/50]
Search report(s)(Supplementary) European search report - dispatched on:EP30.01.2007
ClassificationIPC:H04N1/60
[2004/05]
CPC:
H04N1/6033 (EP,US); B41F33/0036 (EP,US); H04N1/00002 (EP,US);
H04N1/00023 (EP,US); H04N1/00045 (EP,US); H04N1/00055 (EP,US);
H04N1/00084 (EP,US); H04N1/00087 (EP,US) (-)
Designated contracting statesDE,   FR,   GB [2007/44]
Former [2004/05]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Messverfahren und -gerät für die Druckqualität[2004/05]
English:Print quality measuring method and print quality measuring apparatus[2004/05]
French:Méthode et appareil de mesure de la qualité d'impression[2004/05]
Examination procedure25.05.2007Examination requested  [2007/28]
05.11.2007Despatch of a communication from the examining division (Time limit: M04)
17.03.2008Reply to a communication from the examining division
10.02.2011Despatch of a communication from the examining division (Time limit: M04)
03.06.2011Reply to a communication from the examining division
29.06.2012Communication of intention to grant the patent
05.11.2012Fee for grant paid
05.11.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  05.11.2007
Opposition(s)13.09.2013No opposition filed within time limit [2013/47]
Fees paidRenewal fee
29.07.2005Renewal fee patent year 03
31.07.2006Renewal fee patent year 04
31.07.2007Renewal fee patent year 05
31.07.2008Renewal fee patent year 06
30.07.2009Renewal fee patent year 07
29.07.2010Renewal fee patent year 08
28.07.2011Renewal fee patent year 09
31.07.2012Renewal fee patent year 10
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Lapses during opposition  TooltipFR31.07.2013
[2014/24]
Documents cited:Search[X]EP0142470  (GRETAG AG [CH]) [X] 1,2,6,10,11,18,19,23,27,28 * pages 3-11 *;
 [A]US5450165  (HENDERSON THOMAS A [US]) [A] 1,10,18,27* column 5, line 59 - column 8, line 46 *;
 [X]EP0803356  (ADVANCED VISION TECHNOLOGY A V [IL]) [X] 1-4,6-13,15-21,23-30,32-34 * page 4, line 15 - page 8, line 19 *;
 [X]US5774635  (KUUSISTO MATTI [FI], et al) [X] 1,2,6,10,11,18,19,23,27,28 * the whole document *;
 [XA]US2001010191  (STEINBACHER EDUARD [DE]) [X] 1,2,6,10,11,18,19,23,27,28 * the whole document * [A] 7-9,15-17,24-26,32-34
by applicantJP2002205117
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