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Extract from the Register of European Patents

EP About this file: EP1400830

EP1400830 - Microscope system and method for multiple observers [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.12.2006
Database last updated on 30.09.2024
Most recent event   Tooltip07.08.2009Change - representativepublished on 09.09.2009  [2009/37]
Applicant(s)For all designated states
Carl Zeiss Surgical GmbH
Carl-Zeiss-Strasse 22
73447 Oberkochen / DE
[2006/02]
Former [2005/49]For:CH  DE  FR 
Carl Zeiss Surgical GmbH
Carl-Zeiss-Strasse 22
73447 Oberkochen / DE
Former [2004/31]For:CH  DE  FR 
Carl Zeiss
89518 Heidenheim (Brenz) / DE
For:GB 
Carl-Zeiss-Stiftung trading as Carl Zeiss
89518 Heidenheim (Brenz) / DE
Former [2004/13]For:CH  DE  FR 
Carl Zeiss
89518 Heidenheim (Brenz) / DE
For:GB 
Carl-Zeiss-Stiftung, trading as Carl Zeiss
89518 Heidenheim (Brenz) / DE
Inventor(s)01 / Hermann, Karlheinz
Weilerstrasse 88
73434 Aalen / DE
02 / Rudolph, Frank
Böhmerwaldstrasse 33
73431 Aalen / DE
03 / Schneider, Martin
Buchenweg 5
89551 Königsbronn / DE
04 / Steffen, Joachim, Dr.
Donauschwabenstrasse 9
73463 Westhausen / DE
05 / Wirth, Michael
Hasenweg 25
73434 Aalen / DE
 [2004/13]
Representative(s)Diehl & Partner
Patent- und Rechtsanwaltskanzlei mbB
Erika-Mann-Straße 9
80636 München / DE
[N/P]
Former [2009/37]Diehl & Partner
Patentanwälte Augustenstrasse 46
80333 München / DE
Former [2004/13]DIEHL GLAESER HILTL & PARTNER
Patentanwälte Augustenstrasse 46
80333 München / DE
Application number, filing date03021030.617.09.2003
[2004/13]
Priority number, dateDE2002104385220.09.2002         Original published format: DE 10243852
[2004/13]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1400830
Date:24.03.2004
Language:DE
[2004/13]
Type: A3 Search report 
No.:EP1400830
Date:06.05.2004
[2004/19]
Type: B1 Patent specification 
No.:EP1400830
Date:25.01.2006
Language:DE
[2006/04]
Search report(s)(Supplementary) European search report - dispatched on:EP18.03.2004
ClassificationIPC:G02B21/18, G02B21/22, G02B21/00
[2004/19]
CPC:
G02B21/18 (EP,US); G02B21/0012 (EP,US); G02B21/22 (EP,US);
G02B21/367 (EP,US)
Former IPC [2004/13]G02B21/18
Designated contracting statesCH,   DE,   FR,   GB,   LI [2005/04]
Former [2004/13]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Mikroskopiesystem und Mikroskopieverfahren für mehrere Beobachter[2004/13]
English:Microscope system and method for multiple observers[2004/13]
French:Système et méthode de microscopie pour plusieurs observateurs[2004/13]
Examination procedure14.06.2004Examination requested  [2004/33]
16.09.2004Despatch of a communication from the examining division (Time limit: M08)
10.05.2005Reply to a communication from the examining division
11.07.2005Communication of intention to grant the patent
18.11.2005Fee for grant paid
18.11.2005Fee for publishing/printing paid
Opposition(s)26.10.2006No opposition filed within time limit [2007/01]
Fees paidRenewal fee
15.09.2005Renewal fee patent year 03
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]DE4134481  (ZEISS CARL FA [DE]);
 [XA]WO9620421  (LEICA AG [CH], et al);
 [X]WO9813716  (LEICA INC [US], et al);
 [A]WO0068724  (LEICA MICROSYSTEMS [CH], et al);
 [A]WO0127659  (LEICA MICROSYSTEMS [CH], et al);
 [DA]US6327079  (NAMII YASUSHI [JP], et al);
 [A]US2001050808  (MORITA KAZUO [JP], et al);
 [A]EP1235094  (LEICA MICROSYSTEMS [CH]);
 [PA]US2003112509  (TAKAHASHI SUSUMU [JP])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.