blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1418507

EP1418507 - Method and system for multiple cue integration [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  26.05.2006
Database last updated on 30.09.2024
Most recent event   Tooltip15.08.2008Change - applicantpublished on 17.09.2008  [2008/38]
Applicant(s)For all designated states
Eastman Kodak Company
343 State Street
Rochester, NY 14650-2201 / US
[N/P]
Former [2008/38]For all designated states
Eastman Kodak Company
343 State Street
Rochester NY 14650-2201 / US
Former [2004/20]For all designated states
EASTMAN KODAK COMPANY
343 State Street
Rochester, New York 14650 / US
Inventor(s)01 / Sun, Zhaohui c/o Eastman Kodak Company, P.L.S.
343 State Street
Rochester, New York 14650-2201 / US
 [2004/20]
Representative(s)Haile, Helen Cynthia, et al
Kodak Limited
Patent Department (W160-G)
Headstone Drive
Harrow, Middlesex
HA1 4TY / GB
[N/P]
Former [2004/20]Haile, Helen Cynthia, et al
Kodak Limited Patent, W92-3A, Headstone Drive
Harrow, Middlesex HA1 4TY / GB
Application number, filing date03078299.920.10.2003
[2004/20]
Priority number, dateUS2002028517131.10.2002         Original published format: US 285171
[2004/20]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1418507
Date:12.05.2004
Language:EN
[2004/20]
Type: A3 Search report 
No.:EP1418507
Date:29.12.2004
[2004/53]
Search report(s)(Supplementary) European search report - dispatched on:EP16.11.2004
ClassificationIPC:G06T5/00, G06F17/30, G06K9/62
[2004/51]
CPC:
G06F16/5838 (EP,US); G06F18/2323 (EP,US)
Former IPC [2004/20]G06F17/18, G06F17/30
Designated contracting states(deleted) [2005/38]
Former [2004/20]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Methode und System zur Integration mehrerer Merkmale[2004/20]
English:Method and system for multiple cue integration[2004/20]
French:Procéde et système d'integration de plusieurs charactéristiques[2004/20]
Examination procedure30.12.2004Application deemed to be withdrawn, date of legal effect  [2006/26]
16.11.2005Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2006/26]
Fees paidPenalty fee
Penalty fee Rule 85a EPC 1973
05.08.2005DE   M01   Not yet paid
05.08.2005FR   M01   Not yet paid
05.08.2005GB   M01   Not yet paid
Penalty fee Rule 85b EPC 1973
05.08.2005M01   Not yet paid
Additional fee for renewal fee
31.10.200503   M06   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[DXY]  - MEILA M ET AL., "Learning Segmentation by Random Walks", PROC. CONF. ON NEURAL INFORMATION PROCESSING SYSTEMS, (2000), pages 873 - 879, XP002300377 [DX] 1-10 * the whole document * [Y] 11,12
 [Y]  - LOUI A C ET AL, "Automatic image event segmentation and quality screening for albuming applications", MULTIMEDIA AND EXPO, 2000. ICME 2000. 2000 IEEE INTERNATIONAL CONFERENCE ON NEW YORK, NY, USA 30 JULY-2 AUG. 2000, PISCATAWAY, NJ, USA,IEEE, US, (20000730), ISBN 0-7803-6536-4, pages 1125 - 1128, XP010513207 [Y] 11,12 * the whole document *

DOI:   http://dx.doi.org/10.1109/ICME.2000.871558
 [DA]  - GDALYAHU Y ET AL, "SELF-ORGANIZATION IN VISION: STOCHASTIC CLUSTERING FOR IMAGE SEGMENTATION, PERCEPTUAL GROUPING, AND IMAGE DATABASE ORGANIZATION", IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, IEEE INC. NEW YORK, US, (200110), vol. 23, no. 10, ISSN 0162-8828, pages 1053 - 1074, XP001132545 [DA] * the whole document *

DOI:   http://dx.doi.org/10.1109/34.954598
 [A]  - MALIK J ET AL, "Contour and texture analysis for image segmentation", INTERNATIONAL JOURNAL OF COMPUTER VISION KLUWER ACADEMIC PUBLISHERS NETHERLANDS, (2001), vol. 43, no. 1, ISSN 0920-5691, pages 7 - 27, XP009039552 [A] * page 20, column R - page 25, column L *

DOI:   http://dx.doi.org/10.1023/A:1011174803800
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.