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Extract from the Register of European Patents

EP About this file: EP1400983

EP1400983 - Collimation system for dual slice electron beam tomography scanner [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.06.2014
Database last updated on 11.09.2024
Most recent event   Tooltip20.06.2014No opposition filed within time limitpublished on 23.07.2014  [2014/30]
Applicant(s)For all designated states
GE Medical Systems Global Technology Company LLC
3000 North Grandview Boulevard Waukesha
Wisconsin 53188-1696 / US
[2013/33]
Former [2004/13]For all designated states
GE Medical Systems Global Technology Company LLC
3000 North Grandview Boulevard
Waukesha, Wisconsin 53188-1696 / US
Inventor(s)01 / Rand, Roy E.
1028 McGregor Way
Palo Alto, California 94306 / US
 [2004/13]
Representative(s)Bedford, Grant Richard
GPO Europe
GE International Inc. The Ark
201 Talgarth Road
Hammersmith
London W6 8BJ / GB
[2013/33]
Former [2013/27]Bedford, Grant Richard
Global Patent Operation - Europe GE International Inc. 15 John Adam Street
London WC2N 6LU / GB
Former [2004/13]Pedder, James Cuthbert
London Patent Operation, General Electric International, Inc., 15 John Adam Street
London WC2N 6LU / GB
Application number, filing date03253606.206.06.2003
[2004/13]
Priority number, dateUS2002006418219.06.2002         Original published format: US 64182
[2004/13]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1400983
Date:24.03.2004
Language:EN
[2004/13]
Type: A3 Search report 
No.:EP1400983
Date:24.06.2009
[2009/26]
Type: B1 Patent specification 
No.:EP1400983
Date:14.08.2013
Language:EN
[2013/33]
Search report(s)(Supplementary) European search report - dispatched on:EP28.05.2009
ClassificationIPC:G21K1/02, A61B6/03
[2012/41]
CPC:
A61B6/4028 (EP,US); A61B6/032 (EP,US); G21K1/025 (EP,US);
A61B6/06 (EP,US); A61B6/4085 (EP,US)
Former IPC [2004/13]G21K1/02
Designated contracting statesDE,   NL [2010/09]
Former [2004/13]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Kollimatorvorrichtung zum Einsatz in einem Zweischicht ElektronenstrahlScanner[2004/13]
English:Collimation system for dual slice electron beam tomography scanner[2004/13]
French:Dispositif de collimation pour scanner de tomographie à rayons d'électrons à double coupe[2004/13]
Examination procedure28.12.2009Examination requested  [2010/06]
29.12.2009Loss of particular rights, legal effect: designated state(s)
27.01.2010Despatch of a communication from the examining division (Time limit: M06)
28.01.2010Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LU, MC, PT, RO, SE, SI, SK, TR
04.08.2010Reply to a communication from the examining division
26.04.2011Despatch of a communication from the examining division (Time limit: M06)
07.11.2011Reply to a communication from the examining division
03.01.2013Communication of intention to grant the patent
23.04.2013Fee for grant paid
23.04.2013Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  27.01.2010
Opposition(s)15.05.2014No opposition filed within time limit [2014/30]
Fees paidRenewal fee
30.06.2005Renewal fee patent year 03
30.06.2006Renewal fee patent year 04
02.07.2007Renewal fee patent year 05
30.06.2008Renewal fee patent year 06
30.06.2009Renewal fee patent year 07
30.06.2010Renewal fee patent year 08
30.06.2011Renewal fee patent year 09
02.07.2012Renewal fee patent year 10
01.07.2013Renewal fee patent year 11
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Documents cited:Search[A]US4352021  (BOYD DOUGLAS P, et al) [A] 6,8,10 * column 4, lines 32-40 ** column 5, lines 12-24 *;
 [X]US4610021  (PESCHMANN KRISTIAN R [US], et al) [X] 1-10 * column 3, line 32 - column 4, line 47; figures 3,4A-D,5,6A-D *;
 [A]US5442673  (RAND ROY E [US], et al) [A] 2-5,9 * column 1, lines 55-57 * * column 3, line 14 - column 6, line 42; figures 3-5 *;
 [X]WO0065333  (QUANTA VISION INC [US], et al) [X] 1 * abstract *
ExaminationUS5222114
 US6094469
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.