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Extract from the Register of European Patents

EP About this file: EP1484765

EP1484765 - High density magnetoresistance memory and manufacturing method thereof [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  02.09.2011
Database last updated on 04.06.2024
Most recent event   Tooltip02.09.2011No opposition filed within time limitpublished on 05.10.2011  [2011/40]
Applicant(s)For all designated states
Samsung Electronics Co., Ltd.
416 Maetan 3-dong
Yeongtong-gu
Suwon 442-742
Gyeonggi-do / KR
[N/P]
Former [2010/43]For all designated states
SAMSUNG ELECTRONICS CO., LTD.
416 Maetan 3-dong, Yeongtong-gu Suwon 442-742
Gyeonggi-do / KR
Former [2004/50]For all designated states
Samsung Electronics Co., Ltd.
416 Maetan 3-dong, Yeongtong-gu
Suwon 442-742, Gyeonggi-do / KR
Inventor(s)01 / Kim, Eun-sik
102-1102 Samsung Apt. Suyu 2-dong Gangbuk-gu
Seoul / KR
02 / Kim, Yong-su
1-404 Siyoung Apt. Gaepo 4-dong Gangnam-gu
Seoul / KR
 [2004/50]
Representative(s)Greene, Simon Kenneth
Elkington and Fife LLP
Prospect House
8 Pembroke Road
Sevenoaks, Kent TN13 1XR / GB
[N/P]
Former [2004/50]Greene, Simon Kenneth
Elkington and Fife LLP, Prospect House, 8 Pembroke Road
Sevenoaks, Kent TN13 1XR / GB
Application number, filing date03257514.428.11.2003
[2004/50]
Priority number, dateKR2003003530202.06.2003         Original published format: KR 2003035302
[2004/50]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1484765
Date:08.12.2004
Language:EN
[2004/50]
Type: B1 Patent specification 
No.:EP1484765
Date:27.10.2010
Language:EN
[2010/43]
Search report(s)(Supplementary) European search report - dispatched on:EP05.10.2004
ClassificationIPC:G11C11/15, G11C11/16
[2004/50]
CPC:
G11C11/15 (EP,KR,US); H10N50/10 (EP,US); G11C11/16 (EP,US)
Designated contracting statesDE,   FR,   GB [2005/35]
Former [2004/50]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Magnetoresistiver Speicher mit hoher Dichte und Herstellungsverfahren dafür[2009/17]
English:High density magnetoresistance memory and manufacturing method thereof[2004/50]
French:Mémoire magnétoresistive à haute densité et sa méthode de fabrication[2004/50]
Former [2004/50]Magnetoresitiver speicher mit hoher Dichte und Herstellungsverfahren dafür
Examination procedure22.12.2003Examination requested  [2004/50]
08.12.2006Despatch of a communication from the examining division (Time limit: M06)
13.06.2007Reply to a communication from the examining division
29.07.2009Despatch of a communication from the examining division (Time limit: M06)
05.02.2010Reply to a communication from the examining division
10.06.2010Communication of intention to grant the patent
08.09.2010Fee for grant paid
08.09.2010Fee for publishing/printing paid
Opposition(s)28.07.2011No opposition filed within time limit [2011/40]
Fees paidRenewal fee
14.11.2005Renewal fee patent year 03
14.11.2006Renewal fee patent year 04
15.11.2007Renewal fee patent year 05
31.03.2008Renewal fee patent year 06
12.11.2009Renewal fee patent year 07
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XA]EP1246191  (TOSHIBA KK [JP]) [X] 1,3-5,7,9-11 * column 21, paragraph 111 - column 23, paragraph 121 *[A] 6,12
ExaminationUS5659499
by applicantUS5656499
 US5659490
 US6174737
 EP1246191
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.