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Extract from the Register of European Patents

EP About this file: EP1498750

EP1498750 - REFLECTION ELEMENT OF EXPOSURE LIGHT AND PRODUCTION METHOD THEREFOR, MASK, EXPOSURE SYSTEM, AND PRODUCTION METHOD OF SEMICONDUCTOR DEVICE [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  29.06.2007
Database last updated on 07.10.2024
Most recent event   Tooltip29.06.2007Application deemed to be withdrawnpublished on 01.08.2007  [2007/31]
Applicant(s)For all designated states
Sony Corporation
7-35 Kitashinagawa 6-chome
Shinagawa-ku
Tokyo 141 / JP
[N/P]
Former [2005/03]For all designated states
SONY CORPORATION
7-35 Kitashinagawa 6-chome Shinagawa-ku
Tokyo 141 / JP
Inventor(s)01 / SUGAWARA, Minoru c/o SONY CORPORATION
7-35, Kitashinagawa 6-chome
Shinagawa-ku, Tokyo 141-0001 / JP
 [2005/03]
Representative(s)Thévenet, Jean-Bruno, et al
Cabinet Beau de Loménie
158, rue de l'Université
75340 Paris Cédex 07 / FR
[N/P]
Former [2005/03]Thévenet, Jean-Bruno, et al
Cabinet Beau de Loménie 158, rue de l'Université
75340 Paris Cédex 07 / FR
Application number, filing date03723149.518.04.2003
[2005/03]
WO2003JP05000
Priority number, dateJP2002011894122.04.2002         Original published format: JP 2002118941
[2005/03]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO03089964
Date:30.10.2003
Language:EN
[2003/44]
Type: A1 Application with search report 
No.:EP1498750
Date:19.01.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 30.10.2003 takes the place of the publication of the European patent application.
[2005/03]
Search report(s)International search report - published on:JP30.10.2003
(Supplementary) European search report - dispatched on:EP27.03.2006
ClassificationIPC:G02B5/20, G02B5/08, G03F7/20
[2006/19]
CPC:
G02B5/0891 (EP,KR,US); G03F1/24 (KR); G02B5/201 (EP,KR,US);
G03F7/702 (EP,KR,US); G03F7/70958 (EP,KR,US); G21K1/062 (EP)
Former IPC [2005/03]G02B5/26, G02B5/28, G02B5/08, G03F1/16, G03F7/20, H01L21/027, G21K1/06
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   RO,   SE,   SI,   SK,   TR [2005/03]
TitleGerman:REFLEXIONSELEMENT FÜR BELICHTUNGSLICHT UND HERSTELLUNGSVERFAHREN DAFÜR, MASKE , BELICHTUNGSSYSTEM UND HERSTELLUNGSVERFAHREN FÜR EIN HALBLEITERBAUELEMENT[2005/03]
English:REFLECTION ELEMENT OF EXPOSURE LIGHT AND PRODUCTION METHOD THEREFOR, MASK, EXPOSURE SYSTEM, AND PRODUCTION METHOD OF SEMICONDUCTOR DEVICE[2005/03]
French:ELEMENT DE REFLEXION DE LUMIERE D'EXPOSITION ET PROCEDE DE REALISATION A CET EFFET, DE MASQUE, DE SYSTEME D'EXPOSITION, ET PROCEDE DE PRODUCTION D'UN DISPOSITIF A SEMI-CONDUCTEUR[2005/03]
Entry into regional phase21.10.2004Translation filed 
19.10.2004National basic fee paid 
19.10.2004Search fee paid 
19.10.2004Designation fee(s) paid 
19.10.2004Examination fee paid 
Examination procedure21.10.2004Examination requested  [2005/03]
28.09.2006Despatch of a communication from the examining division (Time limit: M04)
09.02.2007Application deemed to be withdrawn, date of legal effect  [2007/31]
19.03.2007Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2007/31]
Fees paidRenewal fee
13.04.2005Renewal fee patent year 03
17.03.2006Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
30.04.200705   M06   Not yet paid
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Documents cited:Search   [ ] - No further relevant documents disclosed
International search[A]US6333961  (MURAKAMI KATSUHIKO [JP]);
 [A]JP2001237174  (OKI ELECTRIC IND CO LTD, et al);
 [A]JP2001027699  (NIKON CORP)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.