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EP1497861
European procedure
Extract from the Register of European Patents
EP About this file: EP1497861
| EP1497861 - SEMICONDUCTOR COMPONENT HAVING AN INTEGRATED CAPACITANCE STRUCTURE AND METHOD FOR PRODUCING THE SAME [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 21.03.2008 Database last updated on 05.07.2024 | Most recent event Tooltip | 21.03.2008 | No opposition filed within time limit | published on 23.04.2008 [2008/17] | Applicant(s) | For all designated states Infineon Technologies AG St.-Martin-Strasse 53 81669 München / DE | [2007/20] |
| Former [2005/03] | For all designated states Infineon Technologies AG St.-Martin-Strasse 53 81669 München / DE | Inventor(s) | 01 /
BENETIK, Thomas Thalkirchner Str.7 80337 München / DE | 02 /
RUDERER, Erwin Böhmerwaldstr. 31 85570 Markt Schwaben / DE | [2005/03] | Representative(s) | Graf Lambsdorff, Matthias Patentanwälte Lambsdorff & Lange Dingolfinger Strasse 6 81673 München / DE | [N/P] |
| Former [2005/03] | Graf Lambsdorff, Matthias, Dr. Patentanwälte Lambsdorff & Lange Dingolfinger Strasse 6 81673 München / DE | Application number, filing date | 03724840.8 | 24.03.2003 | [2005/03] | WO2003DE00964 | Priority number, date | DE2002117567 | 19.04.2002 Original published format: DE 10217567 | [2005/03] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | WO03090280 | Date: | 30.10.2003 | Language: | DE | [2003/44] | Type: | A1 Application with search report | No.: | EP1497861 | Date: | 19.01.2005 | Language: | DE | The application published by WIPO in one of the EPO official languages on 30.10.2003 takes the place of the publication of the European patent application. | [2005/03] | Type: | B1 Patent specification | No.: | EP1497861 | Date: | 16.05.2007 | Language: | DE | [2007/20] | Search report(s) | International search report - published on: | EP | 30.10.2003 | Classification | IPC: | H01L23/522 | [2005/03] | CPC: |
H01L23/5222 (EP,US);
H01L28/90 (EP,US);
H01L2924/0002 (EP,US)
| C-Set: |
H01L2924/0002, H01L2924/00 (EP,US)
| Designated contracting states | DE, FR, GB [2007/20] |
| Former [2005/03] | DE, FR, GB, IT | Title | German: | HALBLEITERBAUELEMENT MIT INTEGRIERTER KAPAZITÄTSSTRUKTUR UND VERFAHREN ZU DESSENHERSTELLUNG | [2005/03] | English: | SEMICONDUCTOR COMPONENT HAVING AN INTEGRATED CAPACITANCE STRUCTURE AND METHOD FOR PRODUCING THE SAME | [2005/03] | French: | COMPOSANT A SEMI-CONDUCTEUR A STRUCTURE DE CAPACITE INTEGREE ET PROCEDE PERMETTANT DE LE PRODUIRE | [2005/03] | Entry into regional phase | 06.10.2004 | National basic fee paid | 06.10.2004 | Designation fee(s) paid | 06.10.2004 | Examination fee paid | Examination procedure | 20.10.2003 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 06.10.2004 | Amendment by applicant (claims and/or description) | 06.10.2004 | Examination requested [2005/03] | 11.07.2006 | Despatch of a communication from the examining division (Time limit: M04) | 09.08.2006 | Reply to a communication from the examining division | 10.11.2006 | Communication of intention to grant the patent | 08.03.2007 | Fee for grant paid | 08.03.2007 | Fee for publishing/printing paid | Opposition(s) | 19.02.2008 | No opposition filed within time limit [2008/17] | Fees paid | Renewal fee | 31.03.2005 | Renewal fee patent year 03 | 30.03.2006 | Renewal fee patent year 04 | 30.03.2007 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [X]WO0199163 (KONINKL PHILIPS ELECTRONICS NV [NL]) [X] 1-20 * figure 2 *; | [X]US6037621 (WILSON WILLIAM BURDETT [US]) [X] 1-20 * the whole document *; | [X]DE10046910 (MITSUBISHI ELECTRIC CORP [JP]) [X] 1-20 * the whole document *; | [DX]US5583359 (NG ANTHONY C C [CA], et al) [DX] 1-20 * the whole document *; | [A]WO0191144 (CONEXANT SYSTEMS INC [US]) [A] * the whole document *; | [DA]DE19850915 (BOSCH GMBH ROBERT [DE]) [DA] * the whole document *; | [DA]US5208725 (AKCASU OSMAN E [US]) [DA] * the whole document *; | [A]US6297524 (VATHULYA VICKRAM [US], et al) [A] * the whole document * | [DA] - APARICIO R ET AL, "Capacity limits and matching properties of integrated capacitors", PROCEEDINGS OF THE IEEE 2001 CUSTOM INTEGRATED CIRCUITS CONFERENCE, SAN DIEGO, CA, USA, 6-9 MAY 2001, IEEE Journal of Solid-State Circuits, March 2002, IEEE, USA, vol. 37, no. 3, ISSN 0018-9200, pages 384 - 393, XP002252607 [DA] * the whole document * DOI: http://dx.doi.org/10.1109/4.987091 |