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Extract from the Register of European Patents

EP About this file: EP1562037

EP1562037 - MEASURING INSTRUMENT AND FLUOROMETRIC METHOD [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  16.11.2012
Database last updated on 11.05.2024
Most recent event   Tooltip18.07.2014Lapse of the patent in a contracting state
New state(s): HU
published on 20.08.2014  [2014/34]
Applicant(s)For all designated states
ARKRAY, Inc.
57, Nishiaketa-cho
Higashikujo
Minami-ku
Kyoto-shi
Kyoto 601-8045 / JP
[N/P]
Former [2005/32]For all designated states
ARKRAY, Inc.
57, Nishi Aketa-Cho, Higashi-kujo, Minami-ku
Kyoto 691-8045 / JP
Inventor(s)01 / NAKAJIMA, Shinya, c/o ARKRAY, INC.
57, Nishiaketa-cho, Higashikujo, Minami-ku
Kyoto-shi, Kyoto 601-8045 / JP
 [2012/02]
Former [2005/32]01 / NAKAJIMA, Shinya, c/o ARKRAY, INC.
57, Nishiaketa-cho, Higashikujo, Minami-ku
Kyoto-shi, Kyoto 601-8045 / JP
Representative(s)Hall, Matthew Benjamin, et al
Dehns
St Bride's House
10 Salisbury Square
London EC4Y 8JD / GB
[N/P]
Former [2010/25]Hall, Matthew Benjamin, et al
Dehns St. Bride's House 10 Salisbury Square
London EC4Y 8JD / GB
Former [2010/22]Piésold, Alexander James, et al
Dehns St Bride's House 10 Salisbury Square London
EC4Y 8JD / GB
Former [2005/32]Power, Philippa Louise
Frank B. Dehn & Co., 179 Queen Victoria Street
London EC4V 4EL / GB
Application number, filing date03774006.513.11.2003
[2005/32]
WO2003JP14421
Priority number, dateJP2002033078714.11.2002         Original published format: JP 2002330787
[2005/32]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2004044564
Date:27.05.2004
Language:EN
[2004/22]
Type: A1 Application with search report 
No.:EP1562037
Date:10.08.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 27.05.2004 takes the place of the publication of the European patent application.
[2005/32]
Type: B1 Patent specification 
No.:EP1562037
Date:11.01.2012
Language:EN
[2012/02]
Search report(s)International search report - published on:JP27.05.2004
(Supplementary) European search report - dispatched on:EP15.10.2008
ClassificationIPC:G01N21/64
[2005/32]
CPC:
G01N21/6428 (EP,US); G01N21/645 (EP,US); G01N2021/6441 (EP,US);
G01N2021/6463 (EP,US); G01N2021/6471 (EP,US); G01N2021/6482 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   RO,   SE,   SI,   SK,   TR [2005/32]
TitleGerman:MESSINSTRUMENT UND FLUOROMETRISCHES VERFAHREN[2005/32]
English:MEASURING INSTRUMENT AND FLUOROMETRIC METHOD[2005/32]
French:INSTRUMENT DE MESURE ET PROCEDE FLUOROMETRIQUE[2005/32]
Entry into regional phase18.05.2005Translation filed 
18.05.2005National basic fee paid 
18.05.2005Search fee paid 
18.05.2005Designation fee(s) paid 
18.05.2005Examination fee paid 
Examination procedure22.03.2004Request for preliminary examination filed
International Preliminary Examining Authority: JP
18.05.2005Examination requested  [2005/32]
05.07.2010Despatch of a communication from the examining division (Time limit: M06)
14.01.2011Reply to a communication from the examining division
08.06.2011Date of oral proceedings
21.06.2011Minutes of oral proceedings despatched
01.07.2011Communication of intention to grant the patent
10.11.2011Fee for grant paid
10.11.2011Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  05.07.2010
Opposition(s)12.10.2012No opposition filed within time limit [2012/51]
Fees paidRenewal fee
23.11.2005Renewal fee patent year 03
24.11.2006Renewal fee patent year 04
23.11.2007Renewal fee patent year 05
28.11.2008Renewal fee patent year 06
25.11.2009Renewal fee patent year 07
23.11.2010Renewal fee patent year 08
28.11.2011Renewal fee patent year 09
Opt-out from the exclusive  Tooltip
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Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU13.11.2003
AT11.01.2012
BE11.01.2012
CY11.01.2012
CZ11.01.2012
DK11.01.2012
EE11.01.2012
FI11.01.2012
NL11.01.2012
RO11.01.2012
SE11.01.2012
SI11.01.2012
SK11.01.2012
TR11.01.2012
BG11.04.2012
GR12.04.2012
ES22.04.2012
PT11.05.2012
[2014/34]
Former [2014/21]AT11.01.2012
BE11.01.2012
CY11.01.2012
CZ11.01.2012
DK11.01.2012
EE11.01.2012
FI11.01.2012
NL11.01.2012
RO11.01.2012
SE11.01.2012
SI11.01.2012
SK11.01.2012
TR11.01.2012
BG11.04.2012
GR12.04.2012
ES22.04.2012
PT11.05.2012
Former [2013/22]AT11.01.2012
BE11.01.2012
CY11.01.2012
CZ11.01.2012
DK11.01.2012
EE11.01.2012
FI11.01.2012
NL11.01.2012
RO11.01.2012
SE11.01.2012
SI11.01.2012
SK11.01.2012
BG11.04.2012
GR12.04.2012
ES22.04.2012
PT11.05.2012
Former [2013/07]AT11.01.2012
BE11.01.2012
CY11.01.2012
CZ11.01.2012
DK11.01.2012
EE11.01.2012
FI11.01.2012
NL11.01.2012
RO11.01.2012
SE11.01.2012
SI11.01.2012
SK11.01.2012
BG11.04.2012
GR12.04.2012
PT11.05.2012
Former [2012/50]BE11.01.2012
CY11.01.2012
CZ11.01.2012
DK11.01.2012
EE11.01.2012
FI11.01.2012
NL11.01.2012
RO11.01.2012
SE11.01.2012
SI11.01.2012
SK11.01.2012
BG11.04.2012
GR12.04.2012
PT11.05.2012
Former [2012/49]BE11.01.2012
CY11.01.2012
CZ11.01.2012
DK11.01.2012
EE11.01.2012
FI11.01.2012
NL11.01.2012
RO11.01.2012
SE11.01.2012
SI11.01.2012
BG11.04.2012
GR12.04.2012
PT11.05.2012
Former [2012/48]BE11.01.2012
CY11.01.2012
EE11.01.2012
FI11.01.2012
NL11.01.2012
SE11.01.2012
SI11.01.2012
BG11.04.2012
GR12.04.2012
PT11.05.2012
Former [2012/41]BE11.01.2012
CY11.01.2012
FI11.01.2012
NL11.01.2012
SI11.01.2012
BG11.04.2012
GR12.04.2012
PT11.05.2012
Former [2012/37]BE11.01.2012
FI11.01.2012
NL11.01.2012
SI11.01.2012
BG11.04.2012
GR12.04.2012
PT11.05.2012
Former [2012/36]BE11.01.2012
NL11.01.2012
SI11.01.2012
BG11.04.2012
GR12.04.2012
Former [2012/35]BE11.01.2012
NL11.01.2012
SI11.01.2012
BG11.04.2012
Former [2012/33]BE11.01.2012
SI11.01.2012
Former [2012/24]SI11.01.2012
Documents cited:Search[X]WO9817992  (APPLIED IMAGING INC [US], et al) [X] 1-10* page 11, line 35 - page 12, line 42 *
International search[Y]JPH0572039  (HITACHI LTD);
 [X]US2002090630  (HAZAMA MAKOTO [JP]);
 [AP]JP2003083894  (SUMITOMO ELECTRIC INDUSTRIES)
ExaminationEP0175352
 WO0169211
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.