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Extract from the Register of European Patents

EP About this file: EP1535332

EP1535332 - SEMICONDUCTOR DEVICE INCLUDING A FIELD EFFECT TRANSISTOR AND A PASSIVE CAPACITOR HAVING REDUCED LEAKAGE CURRENT AND AN IMPROVED CAPACITANCE PER UNIT AREA [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  15.02.2013
Database last updated on 24.08.2024
Most recent event   Tooltip30.08.2013Lapse of the patent in a contracting statepublished on 02.10.2013  [2013/40]
Applicant(s)For all designated states
ADVANCED MICRO DEVICES, INC.
One AMD Place Mail Stop 68 P.O. Box 3453
Sunnyvale CA 94088-3453 / US
[2008/36]
Former [2005/22]For all designated states
ADVANCED MICRO DEVICES INC.
One AMD Place, Mail Stop 68, P.O. Box 3453
Sunnyvale, California 94088-3453 / US
Inventor(s)01 / WIECZOREK, Karsten
Am Schulfeld 24
01109 Dresden / DE
02 / BURBACH, Gert
Warnemuender Strasse 5A
01109 Dresden / DE
03 / FEUDEL, Thomas
Paulsbergweg 21
01445 Radebeul / DE
 [2007/09]
Former [2005/22]01 / WIECZOREK, Karsten
Am Schulfeld 24
01109 Dresden / DE
02 / BURBACH, Gert
Warnemuender Strasse 5A
01109 Dresden / DE
03 / FEUDEL, Thomas
Zillerstrasse 13a
01445 Radebeul / DE
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstrasse 4
80802 München / DE
[N/P]
Former [2012/15]Grünecker, Kinkeldey, Stockmair & Schwanhäusser
Anwaltssozietät
Leopoldstrasse 4
80802 München / DE
Former [2005/22]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date03791994.129.08.2003
[2005/22]
WO2003US27367
Priority number, dateDE200214042302.09.2002         Original published format: DE 10240423
US2003040348131.03.2003         Original published format: US 403481
[2005/22]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2004021440
Date:11.03.2004
Language:EN
[2004/11]
Type: A1 Application with search report 
No.:EP1535332
Date:01.06.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 11.03.2004 takes the place of the publication of the European patent application.
[2005/22]
Type: B1 Patent specification 
No.:EP1535332
Date:11.04.2012
Language:EN
[2012/15]
Search report(s)International search report - published on:EP11.03.2004
ClassificationIPC:H01L27/06, H01L27/08, H01L21/02
[2005/22]
CPC:
H01L27/06 (KR); H01L27/0629 (EP); H01L27/0805 (EP);
H01L28/40 (EP)
Designated contracting statesDE,   FR,   GB [2005/51]
Former [2005/22]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:HALBLEITERANORDNUNG MIT EINEM FELDEFFEKT-TRANSISTOR UND EINEM PASSIVEN KONDENSATOR, DER EINEN VERRINGERTEN LECKSTROM UND EINE VERBESSERTE KAPAZITÄT PRO FLÄCHENEINHEIT AUFWEIST[2005/22]
English:SEMICONDUCTOR DEVICE INCLUDING A FIELD EFFECT TRANSISTOR AND A PASSIVE CAPACITOR HAVING REDUCED LEAKAGE CURRENT AND AN IMPROVED CAPACITANCE PER UNIT AREA[2005/22]
French:DISPOSITIF A SEMI-CONDUCTEURS COMPRENANT UN TRANSISTOR A EFFET DE CHAMP AINSI QU'UN CONDENSATEUR PASSIF A COURANT DE FUITE REDUIT ET CAPACITE ACCRUE PAR UNITE DE SURFACE[2005/22]
Entry into regional phase01.03.2005National basic fee paid 
01.03.2005Designation fee(s) paid 
01.03.2005Examination fee paid 
Examination procedure17.03.2004Request for preliminary examination filed
International Preliminary Examining Authority: EP
01.03.2005Examination requested  [2005/22]
12.12.2008Despatch of a communication from the examining division (Time limit: M06)
22.06.2009Reply to a communication from the examining division
26.02.2010Despatch of a communication from the examining division (Time limit: M06)
08.09.2010Reply to a communication from the examining division
25.10.2011Communication of intention to grant the patent
28.02.2012Fee for grant paid
28.02.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  12.12.2008
Opposition(s)14.01.2013No opposition filed within time limit [2013/12]
Fees paidRenewal fee
01.03.2005Renewal fee patent year 03
07.08.2006Renewal fee patent year 04
03.08.2007Renewal fee patent year 05
27.03.2008Renewal fee patent year 06
07.08.2009Renewal fee patent year 07
06.08.2010Renewal fee patent year 08
08.08.2011Renewal fee patent year 09
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFR31.08.2012
[2013/40]
Cited inInternational search[X]JPS582071  ;
 [XY]US6064102  (GARDNER MARK I [US], et al) [X] 1-3,6,7,10,11 * abstract * * column 4, line 37 - line 65 * [Y] 4,5,8,9,13,14,18;
 [Y]US2002022334  (YANG SAM [US], et al) [Y] 4,5,8,9,13,14,18 * abstract *;
 [X]US2002093781  (BACHHOFER HARALD [DE], et al) [X] 1-3,15 * abstract *;
 [X]JPH01222469  ;
 [A]US6093616  (LIANG MONG-SONG [TW], et al) [A] 6,7,10,11 * abstract *;
 [A]US2002066916  (HSU LOUIS L [US], et al) [A] 6,7,10,11 * abstract * * paragraph [0059] *
 [X]  - PATENT ABSTRACTS OF JAPAN, (19830325), vol. 007, no. 072, Database accession no. (E - 166), & JP58002071 A 19830107 (MITSUBISHI DENKI KK) [X] 1,10,12,15,17 * abstract *
 [X]  - PATENT ABSTRACTS OF JAPAN, (19891205), vol. 013, no. 541, Database accession no. (E - 854), & JP01222469 A 19890905 (FUJITSU LTD) [X] 1-3,15 * abstract *
ExaminationUS6057572
 US2002048885
 EP1049173
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.