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Extract from the Register of European Patents

EP About this file: EP1540271

EP1540271 - METHOD FOR MEASURING CONTOUR VARIATIONS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  02.03.2007
Database last updated on 11.09.2024
Most recent event   Tooltip12.12.2008Lapse of the patent in a contracting state
New state(s): CY		published on 14.01.2009  [2009/03]
Applicant(s)For all designated states
Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
[N/P]
Former [2006/12]For all designated states
Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
Schoemakerstraat 97
2628 VK Delft / NL
Former [2005/24]For all designated states
Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
Schoemakerstraat 97
2628 VK Delft / NL
Inventor(s)01 / SAUNDERS, Ian
Buiksloterbreek 7
NL-1034 XC Amsterdam / NL
02 / VAN BRUG, Hedser
Waterbiesweg 58
NL-2548 WZ The Hague / NL
03 / KORPERSHOEK, Jacobus, Johannes
Koekoekslaan 19
NL-3121 XJ Schiedam / NL
 [2005/24]
Representative(s)Winckels, Johannes Hubertus F., et al
Vereenigde
Postbus 87930
2508 DH Den Haag / NL
[N/P]
Former [2005/24]Winckels, Johannes Hubertus Franciscus, et al
Vereenigde Postbus 87930
2508 DH Den Haag / NL
Application number, filing date03795501.012.09.2003
[2005/24]
WO2003NL00634
Priority number, dateNL2002102145713.09.2002         Original published format: NL 1021457
[2005/24]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2004025216
Date:25.03.2004
Language:EN
[2004/13]
Type: A1 Application with search report 
No.:EP1540271
Date:15.06.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 25.03.2004 takes the place of the publication of the European patent application.
[2005/24]
Type: B1 Patent specification 
No.:EP1540271
Date:22.03.2006
Language:EN
[2006/12]
Search report(s)International search report - published on:EP25.03.2004
ClassificationIPC:G01B9/02, G01B11/24
[2005/24]
CPC:
G01B9/02098 (EP,US); G01B11/2441 (EP,US); G01B9/02081 (EP,US);
G01B9/02097 (EP,US); G01B2290/45 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   RO,   SE,   SI,   SK,   TR [2005/24]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:VERFAHREN ZUR MESSUNG VON KONTURVERûNDERUNGEN[2005/24]
English:METHOD FOR MEASURING CONTOUR VARIATIONS[2005/24]
French:PROCEDE DE MESURE DE VARIATIONS DE CONTOUR[2005/24]
Entry into regional phase18.03.2005National basic fee paid 
18.03.2005Designation fee(s) paid 
18.03.2005Examination fee paid 
Examination procedure13.04.2004Request for preliminary examination filed
International Preliminary Examining Authority: EP
18.03.2005Amendment by applicant (claims and/or description)
18.03.2005Examination requested  [2005/24]
22.08.2005Communication of intention to grant the patent
15.12.2005Fee for grant paid
15.12.2005Fee for publishing/printing paid
Opposition(s)27.12.2006No opposition filed within time limit [2007/14]
Fees paidRenewal fee
15.09.2005Renewal fee patent year 03
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT22.03.2006
BE22.03.2006
CY22.03.2006
CZ22.03.2006
EE22.03.2006
FI22.03.2006
IT22.03.2006
RO22.03.2006
SI22.03.2006
SK22.03.2006
TR22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
GR23.06.2006
ES03.07.2006
PT22.08.2006
IE12.09.2006
LU12.09.2006
HU23.09.2006
MC30.09.2006
[2009/03]
Former [2008/37]AT22.03.2006
BE22.03.2006
CZ22.03.2006
EE22.03.2006
FI22.03.2006
IT22.03.2006
RO22.03.2006
SI22.03.2006
SK22.03.2006
TR22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
GR23.06.2006
ES03.07.2006
PT22.08.2006
IE12.09.2006
LU12.09.2006
HU23.09.2006
MC30.09.2006
Former [2008/32]AT22.03.2006
BE22.03.2006
CZ22.03.2006
EE22.03.2006
FI22.03.2006
IT22.03.2006
RO22.03.2006
SI22.03.2006
SK22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
GR23.06.2006
ES03.07.2006
PT22.08.2006
IE12.09.2006
HU23.09.2006
MC30.09.2006
Former [2008/28]AT22.03.2006
BE22.03.2006
CZ22.03.2006
EE22.03.2006
FI22.03.2006
IT22.03.2006
RO22.03.2006
SI22.03.2006
SK22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
GR23.06.2006
ES03.07.2006
PT22.08.2006
IE12.09.2006
MC30.09.2006
Former [2008/21]AT22.03.2006
BE22.03.2006
CZ22.03.2006
IT22.03.2006
RO22.03.2006
SI22.03.2006
SK22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
GR23.06.2006
ES03.07.2006
PT22.08.2006
IE12.09.2006
MC30.09.2006
Former [2007/42]AT22.03.2006
BE22.03.2006
IT22.03.2006
RO22.03.2006
SI22.03.2006
SK22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
ES03.07.2006
PT22.08.2006
IE12.09.2006
MC30.09.2006
Former [2007/41]AT22.03.2006
BE22.03.2006
IT22.03.2006
RO22.03.2006
SI22.03.2006
SK22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
ES03.07.2006
PT22.08.2006
MC30.09.2006
Former [2007/14]AT22.03.2006
BE22.03.2006
SI22.03.2006
SK22.03.2006
BG22.06.2006
DK22.06.2006
SE22.06.2006
ES03.07.2006
PT22.08.2006
Former [2007/03]AT22.03.2006
SI22.03.2006
SK22.03.2006
BG22.06.2006
SE22.06.2006
ES03.07.2006
Former [2006/50]AT22.03.2006
SI22.03.2006
BG22.06.2006
SE22.06.2006
ES03.07.2006
Former [2006/49]AT22.03.2006
SI22.03.2006
BG22.06.2006
SE22.06.2006
Former [2006/46]AT22.03.2006
SI22.03.2006
SE22.06.2006
Former [2006/43]AT22.03.2006
SI22.03.2006
Former [2006/40]SI22.03.2006
Cited inInternational search[A]JPH04310847  ;
 [XD]  - HEDSER VAN BRUG, "Temporal phase unwrapping and its application in shearography systems", APPLIED OPTICS, (19981001), vol. 37, no. 28, pages 6701 - 6706, XP002244333 [XD] 1,14 * page 6705; figures 6,7 *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19930318), vol. 017, no. 132, Database accession no. (P - 1504), & JP04310847 A 19921102 (OLYMPUS OPTICAL CO LTD) [A] 1,14 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.