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Extract from the Register of European Patents

EP About this file: EP1559107

EP1559107 - BILAYER CMP PROCESS TO IMPROVE SURFACE ROUGHNESS OF MAGNETIC STACK IN MRAM TECHNOLOGY [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  16.11.2007
Database last updated on 05.10.2024
Most recent event   Tooltip16.11.2007No opposition filed within time limitpublished on 19.12.2007  [2007/51]
Applicant(s)For all designated states
Qimonda AG
Gustav-Heinemann-Ring 212
81739 München / DE
For all designated states
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
[N/P]
Former [2006/41]For all designated states
Qimonda AG
Gustav-Heinemann-Ring 212
81739 München / DE
For all designated states
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
Former [2005/36]For all designated states
Infineon Technologies AG
St.-Martin-Strasse 53
81669 München / DE
For all designated states
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
Former [2005/31]For all designated states
Infineon Technologies AG
St.-Martin-Strasse 53
81669 München / DE
For all designated states
IBM International Business Machines Corporation
2070 Route 52
Hopewell Junction, NY 12533 / US
Inventor(s)01 / COSTRINI, Greg
10 Alpine Drive
Hopewell Junction, NY 12533 / US
02 / HUMMEL, John, P.
282 Killearn Road
Millbrook, NY 12545 / US
03 / KRISHNAN, Mahadevaiyer
18 Larchmont Drive
Hopewell Junction, NY 12533 / US
04 / LOW, Kia-Seng
19 Stephen Drive
Hopewell Junction, NY 12533 / US
 [2005/31]
Representative(s)Kottmann, Heinz Dieter
Müller Hoffmann & Partner
Patentanwälte mbB
St.-Martin-Strasse 58
81541 München / DE
[N/P]
Former [2005/31]Kottmann, Heinz Dieter, Dipl.-Ing.
Patentanwälte, Müller . Hoffmann & Partner, Innere Wiener Strasse 17
81667 München / DE
Application number, filing date03810441.005.11.2003
[2005/31]
WO2003EP12353
Priority number, dateUS2002028948806.11.2002         Original published format: US 289488
[2005/31]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2004042735
Date:21.05.2004
Language:EN
[2004/21]
Type: A1 Application with search report 
No.:EP1559107
Date:03.08.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 21.05.2004 takes the place of the publication of the European patent application.
[2005/31]
Type: B1 Patent specification 
No.:EP1559107
Date:10.01.2007
Language:EN
[2007/02]
Search report(s)International search report - published on:EP21.05.2004
ClassificationIPC:G11C11/16
[2005/31]
CPC:
B82Y25/00 (EP,US); G11C11/16 (EP,KR,US); H10N50/01 (EP,US);
B82Y40/00 (EP,US); H01F10/26 (EP,US); H01F10/3254 (EP,US);
H01F41/307 (EP,US); H10B61/00 (EP,US) (-)
Designated contracting statesDE,   FR,   GB [2006/09]
Former [2005/31]DE,  FR,  GB,  IE,  IT,  NL 
TitleGerman:ZWEISCHICHT-CMP-PROZESS ZUR VERBESSERUNG DER OBERFLÄCHENRAUHHEIT EINES MAGNETISCHEN STAPELS IN MRAM-TECHNOLOGIE[2005/31]
English:BILAYER CMP PROCESS TO IMPROVE SURFACE ROUGHNESS OF MAGNETIC STACK IN MRAM TECHNOLOGY[2005/31]
French:PROCEDE CMP BICOUCHE DESTINE A AMELIORER LA RUGOSITE DE SURFACE D'UN EMPILEMENT MAGNETIQUE DANS UN TECHNOLOGIE MRAM[2005/31]
Entry into regional phase25.04.2005National basic fee paid 
25.04.2005Designation fee(s) paid 
25.04.2005Examination fee paid 
Examination procedure19.05.2004Request for preliminary examination filed
International Preliminary Examining Authority: EP
25.04.2005Examination requested  [2005/31]
01.09.2005Despatch of a communication from the examining division (Time limit: M04)
07.12.2005Reply to a communication from the examining division
12.06.2006Communication of intention to grant the patent
06.10.2006Fee for grant paid
06.10.2006Fee for publishing/printing paid
Opposition(s)11.10.2007No opposition filed within time limit [2007/51]
Fees paidRenewal fee
28.11.2005Renewal fee patent year 03
29.11.2006Renewal fee patent year 04
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Cited inInternational search[A]WO0219338  (INFINEON TECHNOLOGIES AG [DE], et al);
 [A]US2002098705  (LOW KIA-SENG [US])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.