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Extract from the Register of European Patents

EP About this file: EP1475049

EP1475049 - Microdermabrasion device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  11.05.2012
Database last updated on 02.09.2024
Most recent event   Tooltip27.09.2013Lapse of the patent in a contracting state
New state(s): TR		published on 30.10.2013  [2013/44]
Applicant(s)For all designated states
Altair Instruments, Inc.
Suite 113, 321 Aviador Street
Camarillo, CA 93010 / US
[2011/27]
Former [2004/46]For all designated states
Altair Instruments, Inc.
Suite 113, 321 Aviador Street
Camarillo, CA 93010 / US
Inventor(s)01 / Waldron, Stephen
566 Avocado Place
Camarillo, CA 91360 / US
 [2004/46]
Representative(s)Patel, Nikesh, et al
AA Thornton IP LLP
8th Floor, 125 Old Broad Street
London EC2N 1AR / GB
[N/P]
Former [2011/25]Patel, Nikesh, et al
A.A. Thornton & Co. 235 High Holborn
London WC1V 7LE / GB
Former [2004/46]Crawford, Andrew Birkby, et al
A.A. Thornton & Co., 235 High Holborn
London WC1V 7LE / GB
Application number, filing date04076905.109.11.2000
[2004/46]
Priority number, dateUS1999044002012.11.1999         Original published format: US 440020
[2004/46]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1475049
Date:10.11.2004
Language:EN
[2004/46]
Type: B1 Patent specification 
No.:EP1475049
Date:06.07.2011
Language:EN
[2011/27]
Search report(s)(Supplementary) European search report - dispatched on:EP22.09.2004
ClassificationIPC:A61B17/54
[2004/46]
CPC:
A61B17/54 (EP,US); A61B17/00 (KR); A61B17/545 (EP,US);
A61P17/00 (EP); A61P17/02 (EP); A61P17/12 (EP);
A61B2017/00761 (EP,US); A61B2017/320004 (EP,US); A61H9/005 (EP,US) (-)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2004/46]
TitleGerman:Vorrichtung zur Mikroabtragung von Hautgewebe[2004/46]
English:Microdermabrasion device[2004/46]
French:Dispositif de microdermabrasion[2004/46]
Examination procedure22.07.2004Examination requested  [2004/46]
16.06.2005Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
08.12.2009Despatch of a communication from the examining division (Time limit: M04)
26.03.2010Reply to a communication from the examining division
06.08.2010Communication of intention to grant the patent
02.12.2010Fee for grant paid
02.12.2010Fee for publishing/printing paid
28.12.2010Despatch of a communication from the examining division (Time limit: M04)
19.04.2011Reply to a communication from the examining division
Parent application(s)   TooltipEP00992792.2  / EP1227764
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued (EP20000992792) is  02.01.2003
Opposition(s)11.04.2012No opposition filed within time limit [2012/24]
Request for further processing for:27.06.2005Request for further processing filed
28.06.2005Full payment received (date of receipt of payment)
Request granted
09.11.2005Decision despatched
Fees paidRenewal fee
22.07.2004Renewal fee patent year 03
22.07.2004Renewal fee patent year 04
12.11.2004Renewal fee patent year 05
14.11.2005Renewal fee patent year 06
14.11.2006Renewal fee patent year 07
15.11.2007Renewal fee patent year 08
12.11.2008Renewal fee patent year 09
12.11.2009Renewal fee patent year 10
12.11.2010Renewal fee patent year 11
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT06.07.2011
BE06.07.2011
CY06.07.2011
DK06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
TR06.07.2011
GR07.10.2011
PT07.11.2011
IE09.11.2011
LU09.11.2011
CH30.11.2011
LI30.11.2011
MC30.11.2011
[2013/44]
Former [2013/25]AT06.07.2011
BE06.07.2011
CY06.07.2011
DK06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
IE09.11.2011
LU09.11.2011
CH30.11.2011
LI30.11.2011
MC30.11.2011
Former [2012/47]AT06.07.2011
BE06.07.2011
CY06.07.2011
DK06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
IE09.11.2011
CH30.11.2011
LI30.11.2011
MC30.11.2011
Former [2012/33]AT06.07.2011
BE06.07.2011
CY06.07.2011
DK06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
CH30.11.2011
LI30.11.2011
MC30.11.2011
Former [2012/31]AT06.07.2011
BE06.07.2011
CY06.07.2011
DK06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
MC30.11.2011
Former [2012/29]AT06.07.2011
BE06.07.2011
CY06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
MC30.11.2011
Former [2012/12]AT06.07.2011
BE06.07.2011
CY06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
Former [2012/11]AT06.07.2011
BE06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
Former [2012/10]BE06.07.2011
FI06.07.2011
NL06.07.2011
SE06.07.2011
GR07.10.2011
PT07.11.2011
Former [2012/09]BE06.07.2011
FI06.07.2011
NL06.07.2011
PT07.11.2011
Former [2012/08]NL06.07.2011
Documents cited:Search[A]US4378804  (CORTESE JR THOMAS A [US]) [A] 1,7 * abstract *;
 [A]US5037431  (SUMMERS DAVID A [MN], et al) [A] 1 * column 4, line 50 - column 5, line 12; figure 1 *;
 [A]EP0564392  (FRUCTUOSO MARTINEZ D ANTONIO [ES]) [A] 1 * the whole document *;
 [A]US5810842  (DI FIORE DARIO [IT], et al) [A] 1* claim 1 *;
 [A]FR2773461  (FAVIE ALAIN [FR]) [A] 1,7 * page 1, line 8 - line 15 *
by applicantUS5100412
 US5207234
 US5810842
    - SCHWARZ Y ET AL., "Evaluation of Workers Exposed to Dust Containing Hard Metals and Aluminium Oxide", AM J OF IND MED, (199908), vol. 34, no. 20, pages 1777 - 82
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.