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Extract from the Register of European Patents

EP About this file: EP1677197

EP1677197 - Test case automatic generation method for testing proactive GSM applications on SIM card [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  24.08.2007
Database last updated on 12.10.2024
Most recent event   Tooltip24.08.2007Application deemed to be withdrawnpublished on 26.09.2007  [2007/39]
Applicant(s)For all designated states
ST Incard S.r.l.
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
[2006/27]
Inventor(s)01 / Specchio, Luca
Via Bisignamo, 59
80121 Napoli / IT
02 / Locanto, Luca
Via Verdi, 27
80055 Portici (Napoli) / IT
 [2006/27]
Representative(s)Botti, Mario
Botti & Ferrari S.p.A.
Via Cappellini, 11
20124 Milano / IT
[N/P]
Former [2006/27]Botti, Mario
Botti & Ferrari S.r.l., Via Locatelli, 5
20124 Milano / IT
Application number, filing date04425967.931.12.2004
[2006/27]
Filing languageIT
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1677197
Date:05.07.2006
Language:EN
[2006/27]
Search report(s)(Supplementary) European search report - dispatched on:EP05.07.2005
ClassificationIPC:G06F11/36
[2006/27]
CPC:
G06F11/3684 (EP,US); H04W24/00 (EP,US)
Designated contracting states[2007/11]
Former [2006/27]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Verfahren zur automatischen Testfall-Erzeugung für GSM Anwendungen in einer SIM-Karte[2006/27]
English:Test case automatic generation method for testing proactive GSM applications on SIM card[2006/27]
French:Génération automatique de jeux de tests pour tester des applications GSM sur cartes SIM[2006/27]
Examination procedure06.01.2007Application deemed to be withdrawn, date of legal effect  [2007/39]
10.05.2007Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2007/39]
Fees paidPenalty fee
Penalty fee Rule 85a EPC 1973
21.02.2007AT   M01   Not yet paid
21.02.2007BE   M01   Not yet paid
21.02.2007BG   M01   Not yet paid
21.02.2007CH   M01   Not yet paid
21.02.2007CY   M01   Not yet paid
21.02.2007CZ   M01   Not yet paid
21.02.2007DE   M01   Not yet paid
21.02.2007DK   M01   Not yet paid
21.02.2007EE   M01   Not yet paid
21.02.2007ES   M01   Not yet paid
21.02.2007FI   M01   Not yet paid
21.02.2007FR   M01   Not yet paid
21.02.2007GB   M01   Not yet paid
21.02.2007GR   M01   Not yet paid
21.02.2007HU   M01   Not yet paid
21.02.2007IE   M01   Not yet paid
21.02.2007IS   M01   Not yet paid
21.02.2007IT   M01   Not yet paid
21.02.2007LT   M01   Not yet paid
21.02.2007LU   M01   Not yet paid
21.02.2007MC   M01   Not yet paid
21.02.2007NL   M01   Not yet paid
21.02.2007PL   M01   Not yet paid
21.02.2007PT   M01   Not yet paid
21.02.2007RO   M01   Not yet paid
21.02.2007SE   M01   Not yet paid
21.02.2007SI   M01   Not yet paid
21.02.2007SK   M01   Not yet paid
21.02.2007TR   M01   Not yet paid
Penalty fee Rule 85b EPC 1973
21.02.2007M01   Not yet paid
Additional fee for renewal fee
31.12.200603   M06   Not yet paid
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Documents cited:Search[X]  - PHILIPPS J, AND AL, "Model-based test case generation for smart cards", ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE, NETHERLANDS, (2003), vol. 80, XP002333127 [X] 1,2,4 * abstract * * paragraphs [0002] - [0004] *

DOI:   http://dx.doi.org/10.1016/S1571-0661(04)80817-X
 [X]  - BERNARD E ET AL, "GENERATION OF TEST SEQUENCES FROM FORMAL SPECIFICATIONS: GSM 11-11 STANDARD CASE STUDY", SOFTWARE PRACTICE & EXPERIENCE, JOHN WILEY & SONS LTD. CHICHESTER, GB, (200408), vol. 34, no. 10, ISSN 0038-0644, pages 915 - 948, XP001199181 [X] 1,2,4 * paragraphs [0004] - [0007] *

DOI:   http://dx.doi.org/10.1002/spe.597
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.