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Extract from the Register of European Patents

EP About this file: EP1642304

EP1642304 - BEAM CONDITIONING SYSTEM [Right-click to bookmark this link]
Status	No opposition filed within time limit Status updated on 23.01.2009 Database last updated on 24.08.2024
Most recent event Tooltip	23.01.2009	No opposition filed within time limit	published on 25.02.2009 [2009/09]
Applicant(s)	For all designated states Osmic, Inc. 1900 Taylor Road Auburn Hills, MI 48326 / US
	[N/P]
Former [2006/14]	For all designated states OSMIC, INC. 1900 Taylor Road Auburn Hills, MI 48326 / US
Inventor(s)	01 / VERMAN, Boris 410 Kendry Bloomfield, MI 48302 / US
	02 / HARADA, Jimpei 3-47-8 Kugayama, Suginami-ku Tokyo 168-0082 / JP
	[2006/24]
Former [2006/14]	01 / VERMAN, Boris 410 Kendry Bloomfield, MI 48302 / US
	02 / HARADA, Jimpei Rigaku Corporation 3-9-12- Matsubara-Cho Akishima-Shi Tokyo 196-8666 / JP
Representative(s)	Dr. Solf & Zapf Patent- und Rechtsanwalts PartG mbB Candidplatz 15 81543 München / DE
	[N/P]
Former [2006/14]	Patentanwälte Dr. Solf & Zapf Candidplatz 15 81543 München / DE
Application number, filing date	04754929.0	10.06.2004
	[2006/14]
	WO2004US18494
Priority number, date	US20030478460P	13.06.2003 Original published format: US 478460 P
	[2006/14]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	WO2004114325
	Date:	29.12.2004
	Language:	EN
	[2004/53]
	Type:	A2 Application without search report
	No.:	EP1642304
	Date:	05.04.2006
	Language:	EN
	The application published by WIPO in one of the EPO official languages on 29.12.2004 takes the place of the publication of the European patent application.
	[2006/14]
	Type:	B1 Patent specification
	No.:	EP1642304
	Date:	19.03.2008
	Language:	EN
	[2008/12]
Search report(s)	International search report - published on:	EP	07.07.2005
Classification	IPC:	G21K1/00	[2006/14]
	CPC:	G21K1/062 (EP,US); B82Y10/00 (EP,US); G21K1/06 (EP,US); G21K2201/061 (EP,US); G21K2201/062 (EP,US); G21K2201/064 (EP,US)
Designated contracting states	CH, DE, FR, GB, LI, NL [2006/38]
Former [2006/14]	AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR
Extension states	AL	Not yet paid
	HR	Not yet paid
	LT	Not yet paid
	LV	Not yet paid
	MK	Not yet paid
Title	German:	STRAHLAUFBEREITUNGSSYSTEM	[2006/14]
	English:	BEAM CONDITIONING SYSTEM	[2006/14]
	French:	SYSTEME DE CONDITIONNEMENT DE FAISCEAU	[2006/14]
Entry into regional phase	12.12.2005	National basic fee paid
	12.12.2005	Designation fee(s) paid
	12.12.2005	Examination fee paid
Examination procedure	13.01.2005	Request for preliminary examination filed International Preliminary Examining Authority: EP
	12.12.2005	Amendment by applicant (claims and/or description)
	12.12.2005	Examination requested [2006/14]
	09.08.2006	Despatch of a communication from the examining division (Time limit: M04)
	15.12.2006	Reply to a communication from the examining division
	26.10.2007	Communication of intention to grant the patent
	28.01.2008	Fee for grant paid
	28.01.2008	Fee for publishing/printing paid
Opposition(s)	22.12.2008	No opposition filed within time limit [2009/09]
Fees paid	Renewal fee
	27.03.2006	Renewal fee patent year 03
	08.06.2007	Renewal fee patent year 04
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited in	International search	[DA]US6014423 (GUTMAN GEORGE [US], et al) [DA] 1-16 * the whole document *;
		[A]US6041099 (GUTMAN GEORGE [US], et al) [A] 1-16 * the whole document *;
		[A]WO0062306 (OSMIC INC [US]) [A] 2-11,14 * page 2, line 29 - page 3, line 7 * * page 3, line 22 - page 5, line 4 * * page 7, line 31 - page 8, line 35; figures 6-9 *;
		[PA]DE29924462U (OSMIC INC [US]) [PA] 1-16 * page 6, line 2 - page 9, line 13 *;
		[XA]US5799056 (GUTMAN GEORGE [US]) [X] 17,21-25 * column 3, line 51 - column 6, line 14 * * column 2, line 36 - column 3, line 14 * [A] 18-20;
		[A] - BONSE U ET AL, "KIRKPATRICK-BAEZ MICROPROBE ON THE BASIS OF TWO LINEAR SINGLE CRYSTAL BRAGG-FRESNEL LENSES", REVIEW OF SCIENTIFIC INSTRUMENTS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (1992), vol. 63, no. 1 PT 2A, ISSN 0034-6748, pages 622 - 624, XP000280838 [A] 1,16 * the whole document * DOI: http://dx.doi.org/10.1063/1.1142671
		[A] - VERMAN B ET AL, "MICROFOCUSING SOURCE AND MULTILAYER OPTICS BASED X-RAY DIFFRACTION SYSTEMS", THE RIGAKU JOURNAL, (2002), vol. 19, no. 1, XP002289276 [A] 1-16 * the whole document *
		[A] - LICAI JIANG, ZAID AL-MOSHEKY, AND NICK GRUPIDO, "Basic principle and performance characteristics of multilayer beam conditioning optics", POWDER DIFRACTION, (200206), vol. 17, no. 2, pages 81 - 93, XP009039739 [A] 1-16 * page 89 - page 93 * DOI: http://dx.doi.org/10.1154/1.1482366
		[A] - NICOLA J. GRUPIDO, RONALD L. REMUS, "Diffractive optics bend, shape and filter x-ray light", LASER FOCUS WORLD, PENNWELL PUBL CO, TULSA, OK, US, (199803), vol. 34, no. 3, pages 115 - 117, XP001203751 [A] 1-16 * the whole document *
		[X] - ZIEGLER E ET AL, "High-efficiency tunable X-ray focusing optics using mirrors and laterally-graded multilayers", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, (20010721), vol. 467-468, ISSN 0168-9002, pages 954 - 957, XP004298864 [X] 17,19,21,25,26 * page 955 - page 957 * * abstract * DOI: http://dx.doi.org/10.1016/S0168-9002(01)00533-2
		[YA] - SUZUKI Y ET AL, "HARD X-RAY MICROPROBE WITH TOTAL-REFLECTION MIRRORS", REVIEW OF SCIENTIFIC INSTRUMENTS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (199201), vol. 63, no. 1, ISSN 0034-6748, pages 578 - 581, XP001203673 [Y] 17,19-22,25-28 * page 578 - page 579; figure 1 * [A] 18,23,24 DOI: http://dx.doi.org/10.1063/1.1142710
		[YA] - DHEZ P ET AL, "Instrumental aspects of x-ray microbeams in the range above 1 keV", REVIEW OF SCIENTIFIC INSTRUMENTS, AMERICAN INSTITUTE OF PHYSICS, US, (199904), vol. 70, no. 4, ISSN 0034-6748, pages 1907 - 1920, XP012037370 [Y] 17,19-22,25-28 * page 1912 - page 1915; figures 5,7 * [A] 18,23,24 DOI: http://dx.doi.org/10.1063/1.1149733
		[A] - CHEVALLIER P ET AL, "X-ray microprobes", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, (199606), vol. 113, no. 1, ISSN 0168-583X, pages 122 - 127, XP004007780 [A] 17-28 * the whole document * DOI: http://dx.doi.org/10.1016/0168-583X(95)01314-8
		[A] - ICE GENE E ET AL, "Small-displacement monochromator for microdiffraction experiments", REVIEW OF SCIENTIFIC INSTRUMENTS, AMERICAN INSTITUTE OF PHYSICS, US, (200005), vol. 71, no. 5, ISSN 0034-6748, pages 2001 - 2006, XP012038269 [A] 17-28 * the whole document * DOI: http://dx.doi.org/10.1063/1.1150568
		[A] - DHEZ P ERKO A, "KIRKPATRICK-BAEZ MICROSCOPE BASED ON A BRAGG-FRESNEL X-RAY MULTILAYER FOCUSING SYSTEM", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA,WASHINGTON, US, (19921101), vol. 31, no. 31, ISSN 0003-6935, pages 6662 - 6667, XP000310750 [A] 17-28 * the whole document * DOI: http://dx.doi.org/10.1364/AO.31.006662

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