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EP1642145
European procedure
Extract from the Register of European Patents
EP About this file: EP1642145
| EP1642145 - APPARATUS AND METHOD FOR ELECTROMECHANICAL TESTING AND VALIDATION OF PROBE CARDS [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 14.08.2009 Database last updated on 07.06.2024 | Most recent event Tooltip | 07.05.2010 | Lapse of the patent in a contracting state New state(s): FR | published on 09.06.2010 [2010/23] | Applicant(s) | For all designated states FormFactor, Inc. 7005 Southfront Road Livermore, CA 94551 / US | [2006/14] | Inventor(s) | 01 /
MILLER, Charles, A. 48881 Semillon Drive Fremont, CA 94539 / US | 02 /
HREISH, Emad, B. 2527 Spyglass Hills Rd Livermore CA 94551 / US | [2006/24] |
| Former [2006/14] | 01 /
MILLER, Charles, A. 48881 Semillon Drive Fremont, CA 94539 / US | ||
| 02 /
HREISH, Emad, B. 6440 Stoneridge Mall Road, Apt. K218 Pleasanton, CA 94588 / US | Representative(s) | Harris, Ian Richard, et al D Young & Co LLP 120 Holborn London EC1N 2DY / GB | [N/P] |
| Former [2009/28] | Harris, Ian Richard, et al D Young & Co 120 Holborn London EC1N 2DY / GB | ||
| Former [2006/14] | Käck, Jürgen Kahler Käck Mollekopf Vorderer Anger 239 D-86899 Landsberg/Lech / DE | Application number, filing date | 04756506.4 | 30.06.2004 | [2006/14] | WO2004US21175 | Priority number, date | US20030612235 | 01.07.2003 Original published format: US 612235 | [2006/14] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | WO2005005996 | Date: | 20.01.2005 | Language: | EN | [2005/03] | Type: | A2 Application without search report | No.: | EP1642145 | Date: | 05.04.2006 | Language: | EN | The application published by WIPO in one of the EPO official languages on 20.01.2005 takes the place of the publication of the European patent application. | [2006/14] | Type: | B1 Patent specification | No.: | EP1642145 | Date: | 08.10.2008 | Language: | EN | [2008/41] | Search report(s) | International search report - published on: | US | 24.02.2005 | (Supplementary) European search report - dispatched on: | EP | 11.07.2006 | Classification | IPC: | G01R35/00, G01R1/073 | [2006/32] | CPC: |
G01R35/00 (EP,US);
G01R1/073 (KR);
G01R31/11 (EP,US);
G01R31/2886 (EP,US)
|
| Former IPC [2006/14] | G01R31/02 | Designated contracting states | DE, FR, IE, IT [2006/41] |
| Former [2006/14] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR | Extension states | AL | Not yet paid | HR | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | Title | German: | VORRICHTUNG UND VERFAHREN ZUR ELEKTROMECHANISCHEN PRÜFUNG UND VALIDIERUNG VON PRÜFKARTEN | [2008/41] | English: | APPARATUS AND METHOD FOR ELECTROMECHANICAL TESTING AND VALIDATION OF PROBE CARDS | [2006/14] | French: | APPAREIL ET PROCEDE POUR TESTER ELECTROMECANIQUEMENT DES CARTES SONDES ET LES VALIDER | [2006/14] |
| Former [2006/14] | VORRICHTUNG UND VERFAHREN ZUR ELEKTROMECHANISCHEN PRÜFUNG UND VALIDIERUNG VON SONDENKARTEN | Entry into regional phase | 27.01.2006 | National basic fee paid | 27.01.2006 | Search fee paid | 27.01.2006 | Designation fee(s) paid | 27.01.2006 | Examination fee paid | Examination procedure | 22.12.2005 | Amendment by applicant (claims and/or description) | 27.01.2006 | Examination requested [2006/14] | 21.11.2006 | Despatch of a communication from the examining division (Time limit: M04) | 23.03.2007 | Reply to a communication from the examining division | 05.04.2007 | Despatch of a communication from the examining division (Time limit: M04) | 03.08.2007 | Reply to a communication from the examining division | 11.04.2008 | Communication of intention to grant the patent | 08.08.2008 | Fee for grant paid | 08.08.2008 | Fee for publishing/printing paid | Opposition(s) | 09.07.2009 | No opposition filed within time limit [2009/38] | Fees paid | Renewal fee | 30.06.2006 | Renewal fee patent year 03 | 27.06.2007 | Renewal fee patent year 04 | 25.06.2008 | Renewal fee patent year 05 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | FR | 30.06.2009 | IE | 30.06.2009 | [2010/23] |
| Former [2010/21] | IE | 30.06.2009 | Documents cited: | Search | [X]US4918374 (STEWART JOHN P [US], et al) [X] 1-23 * column A; figures 1-10; claims 1-29 * * column 3, lines 14-41 * * column 8, line 24 - column 12, line 28 *; | [X]US6239590 (KRIVY ANDREW J [US], et al) [X] 1-23 * column A; figures 1,6-9; claims 1-28 * * column 2, line 45 - column 3, line 45 * * column 4, lines 25-67 * * column 5, lines 33-48 * * column 6, line 39 - column 9, line 36 *; | [XA]US6300757 (JANSSEN MICHAEL [DE]) [X] 1-6,8-23 * column A; figure 1; claims 1-6 * * column 1, line 57 - column 3, line 50 * [A] 7; | [XA]US2002171414 (STROM JOHN [US]) [X] 7 * column A; figures 1-7; claims 1-14 * * paragraphs [0011] - [0015] * * paragraphs [0027] , [0028] *[A] 1-6,8-23 | International search | [AP]US6622103 (MILLER CHARLES A [US]); | [AP]US6606575 (MILLER CHARLES A [US]); | [A]US6414477 (STROM JOHN [US]); | [A]US5561377 (STRID ERIC W [US], et al); | [A]US4918374 (STEWART JOHN P [US], et al) | Examination | US2003076126 |