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Extract from the Register of European Patents

EP About this file: EP1560028

EP1560028 - Automatic analyzer [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.08.2008
Database last updated on 04.06.2024
Most recent event   Tooltip22.08.2008No opposition filed within time limitpublished on 24.09.2008  [2008/39]
Applicant(s)For all designated states
Hitachi High-Technologies Corporation
24-14, Nishishimbashi 1-chome
Minato-ku
Tokyo 105-8717 / JP
[N/P]
Former [2007/42]For all designated states
Hitachi High-Technologies Corporation
24-14, Nishishimbashi 1-chome, Minato-ku
Tokyo 105-8717 / JP
Former [2005/31]For all designated states
Hitachi High-Technologies Corporation
24-14, Nishishimbashi 1-chome, Minato-ku
Tokyo 105-8717 / JP
Inventor(s)01 / Shiba, Masaki
Hitachi High-Technologies Corp. Naka Division 882
Ichige Hitachinaka-shi Ibaraki 312-8504 / JP
02 / Yanami, Hideyuki
Hitachi High-Technologies Corp. Naka Division 882
Ichige Hitachinaka-shi Ibaraki 312-8504 / JP
03 / Nishida, Masaharu
Hitachi High-Technologies Corp. Naka Division 882
Ichige Hitachinaka-shi Ibaraki 312-8504 / JP
04 / Ohtake, Hitoshi
Hitachi High-Technologies Corp. Naka Division 882
Ichige Hitachinaka-shi Ibaraki 312-8504 / JP
 [2005/31]
Representative(s)Strehl Schübel-Hopf & Partner
Maximilianstrasse 54
80538 München / DE
[2005/31]
Application number, filing date05000734.314.01.2005
[2005/31]
Priority number, dateJP2004001914228.01.2004         Original published format: JP 2004019142
[2005/31]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1560028
Date:03.08.2005
Language:EN
[2005/31]
Type: A3 Search report 
No.:EP1560028
Date:10.05.2006
[2006/19]
Type: B1 Patent specification 
No.:EP1560028
Date:17.10.2007
Language:EN
[2007/42]
Search report(s)(Supplementary) European search report - dispatched on:EP29.03.2006
ClassificationIPC:G01N35/10
[2005/31]
CPC:
G01N35/00663 (EP,US); G01N35/0092 (EP,US); G01N35/1002 (EP,US);
G01N2035/00673 (EP,US)
Designated contracting statesDE,   FR [2007/03]
Former [2005/31]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Automatisches Analysengerät[2005/31]
English:Automatic analyzer[2005/31]
French:Analyseur automatique[2005/31]
Examination procedure31.03.2006Examination requested  [2006/22]
18.07.2006Despatch of a communication from the examining division (Time limit: M06)
29.01.2007Reply to a communication from the examining division
26.04.2007Communication of intention to grant the patent
31.08.2007Fee for grant paid
31.08.2007Fee for publishing/printing paid
Opposition(s)18.07.2008No opposition filed within time limit [2008/39]
Fees paidRenewal fee
15.01.2007Renewal fee patent year 03
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Documents cited:Search[A]US5254311  (USHIKUBO MASAO [JP]) [A] 1 * column 4, line 62 - column 5, line 20 *;
 [DA]JPH10142230  (HITACHI LTD);
 [A]EP0845674  (HITACHI LTD [JP]) [A] 1-9 * column 2, line 39 - column 3, line 27 *;
 [A]US5827479  (YAMAZAKI HAJIME [JP], et al) [A] 1-9 * column 6, lines 15-55 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.