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Extract from the Register of European Patents

EP About this file: EP1586946

EP1586946 - Optical system of a microlithographic projection exposure apparatus [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  18.12.2009
Database last updated on 26.06.2024
Most recent event   Tooltip18.12.2009Application deemed to be withdrawnpublished on 20.01.2010  [2010/03]
Applicant(s)For all designated states
Carl Zeiss SMT AG
Rudolf-Eber-Strasse 2
73447 Oberkochen / DE
[2007/36]
Former [2005/42]For all designated states
Carl Zeiss SMT AG
Carl-Zeiss-Strasse 22
73447 Oberkochen / DE
Inventor(s)01 / Maul, Manfred
Elchweg 29
73434 Aalen / DE
02 / Totzeck, Michael
Schwerzerweg 11
73535 Schwäbisch Gmünd / DE
03 / Dittmann, Olaf
Brahmsweg 3
73441 Bopfingen / DE
04 / Fiolka, Damian
Heckenrosenweg 36
73447 Oberkochen / DE
 [2005/42]
Representative(s)Schwanhäusser, Gernot, et al
Ostertag & Partner
Patentanwälte mbB
Epplestrasse 14
70597 Stuttgart / DE
[N/P]
Former [2005/42]Schwanhäusser, Gernot, et al
Ostertag & Partner Patentanwälte Epplestr. 14
70597 Stuttgart / DE
Application number, filing date05006179.522.03.2005
[2005/42]
Priority number, dateUS20040562060P14.04.2004         Original published format: US 562060 P
[2005/42]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1586946
Date:19.10.2005
Language:EN
[2005/42]
Type: A3 Search report 
No.:EP1586946
Date:17.01.2007
[2007/03]
Search report(s)(Supplementary) European search report - dispatched on:EP19.12.2006
ClassificationIPC:G03F7/20
[2005/42]
CPC:
G03F7/70966 (EP,US); G03F7/20 (KR); G02B13/143 (EP,US);
G02B5/3083 (EP,US); G03F7/70566 (EP,US)
Designated contracting statesDE,   FR,   NL [2007/38]
Former [2005/42]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Optisches System eines Projektions-Mikrolithographie Apparats[2005/42]
English:Optical system of a microlithographic projection exposure apparatus[2005/42]
French:Système optique d'un appareil de projection microlithographique[2005/42]
Examination procedure03.03.2007Examination requested  [2007/16]
18.08.2007Loss of particular rights, legal effect: designated state(s)
05.09.2007Despatch of a communication from the examining division (Time limit: M06)
02.11.2007Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GB, GR, HU, IE, IS, IT, LT, LU, MC, PL, PT, RO, SE, SI, SK, TR
07.03.2008Reply to a communication from the examining division
06.03.2009Despatch of a communication from the examining division (Time limit: M04)
17.07.2009Application deemed to be withdrawn, date of legal effect  [2010/03]
24.08.2009Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2010/03]
Fees paidRenewal fee
14.03.2007Renewal fee patent year 03
13.03.2008Renewal fee patent year 04
13.03.2009Renewal fee patent year 05
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Documents cited:Search[A]US5652745  (NOGUCHI MASATO [JP], et al) [A] 1-21 * abstract * * claim 1 * * column 3, lines 17-42 *;
 [A]WO0101182  (CORNING INC [US], et al) [A] 1-21 * abstract * * figure 5 ** page 6, lines 1-15 *;
 [DA]WO02093209  (ZEISS CARL [DE], et al) [DA] 1-21 * abstract * * page 5, line 23 - page 7, line 23 *;
 [A]WO02099500  (OPTICAL RES ASSOCIATES [US], et al) [A] 1-21 * abstract * * page 35, line 24 - page 35, line 2 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.