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Extract from the Register of European Patents

EP About this file: EP1643236

EP1643236 - Optical image measuring apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  10.10.2014
Database last updated on 24.04.2024
Most recent event   Tooltip15.07.2016Lapse of the patent in a contracting state
New state(s): TR		published on 17.08.2016  [2016/33]
Applicant(s)For all designated states
Kabushiki Kaisha TOPCON
75-1, Hasunuma-cho
Itabashi-ku
Tokyo 174-8580 / JP
[N/P]
Former [2006/14]For all designated states
Kabushiki Kaisha TOPCON
75-1, Hasunuma-cho, Itabashi-ku
Tokyo 174-8580 / JP
Inventor(s)01 / Chan, Kinpui
27-12 Shironishi-machi 5-chome
Yamagata-shi Yamagata 990-0832 / JP
02 / Akiba, Masahiro
2666-2 Nagasaki
Nakayama-machi
Higashimurayama-gun Yamagata 990-0401 / JP
 [2013/49]
Former [2006/14]01 / Chan, Kinpui
27-12 Shironishi-machi 5-chome
Yamagata-shi Yamagata 990-0832 / JP
02 / Akiba, Masahiro
2666-2 Nagasaki Nakayama-machi
Higashimurayama-gun Yamagata 990-0401 / JP
Representative(s)Vossius & Partner Patentanwälte Rechtsanwälte mbB
Siebertstrasse 3
81675 München / DE
[N/P]
Former [2013/49]Vossius & Partner
Siebertstrasse 4
81675 München / DE
Former [2008/35]Vossius & Partner
Siebertstrasse 3
81675 München / DE
Former [2006/14]Vossius & Partner
Siebertstrasse 4
81675 München / DE
Application number, filing date05020937.826.09.2005
[2006/14]
Priority number, dateJP2004029124304.10.2004         Original published format: JP 2004291243
[2006/14]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1643236
Date:05.04.2006
Language:EN
[2006/14]
Type: A3 Search report 
No.:EP1643236
Date:10.10.2007
[2007/41]
Type: B1 Patent specification 
No.:EP1643236
Date:04.12.2013
Language:EN
[2013/49]
Search report(s)(Supplementary) European search report - dispatched on:EP06.09.2007
ClassificationIPC:G01N21/21, G01N21/31, G01N21/47, G01B9/02, A61B5/00, A61B5/1455
[2013/33]
CPC:
A61B5/14546 (EP,US); A61B5/0066 (EP,US); A61B5/14551 (EP,US);
G01B9/02002 (EP,US); G01B9/02007 (EP,US); G01B9/02012 (EP,US);
G01B9/02069 (EP,US); G01B9/02081 (EP,US); G01B9/02091 (EP,US);
G01N21/21 (EP,US); G01N21/3151 (EP,US); G01N21/3563 (EP,US);
G01N21/4795 (EP,US); G01B2290/45 (EP,US); G01B2290/70 (EP,US);
G01N2021/1772 (EP,US); G01N2021/1787 (EP,US); G01N21/359 (EP,US);
G01N2201/0691 (EP,US) (-)
Former IPC [2007/41]G01N21/21, G01N21/47, G01N21/31, A61B5/00, G01B9/02
Former IPC [2006/14]G01N21/21, G01N21/45, G01N21/49, G01N21/31, G01N33/48, A61B5/00
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2006/14]
TitleGerman:Optische Bildmessvorrichtung[2006/14]
English:Optical image measuring apparatus[2006/14]
French:Appareil de mesure d'image optique[2013/33]
Former [2006/14]Appareil de mesure d image optique
Examination procedure09.04.2008Examination requested  [2008/21]
13.05.2008Despatch of a communication from the examining division (Time limit: M04)
16.09.2008Reply to a communication from the examining division
02.08.2013Communication of intention to grant the patent
23.10.2013Fee for grant paid
23.10.2013Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  13.05.2008
Opposition(s)05.09.2014No opposition filed within time limit [2014/46]
Fees paidRenewal fee
28.09.2007Renewal fee patent year 03
30.09.2008Renewal fee patent year 04
24.09.2009Renewal fee patent year 05
23.09.2010Renewal fee patent year 06
23.09.2011Renewal fee patent year 07
24.09.2012Renewal fee patent year 08
23.09.2013Renewal fee patent year 09
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU26.09.2005
AT04.12.2013
BE04.12.2013
BG04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
IT04.12.2013
LT04.12.2013
LV04.12.2013
MC04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SI04.12.2013
SK04.12.2013
TR04.12.2013
GR05.03.2014
IS04.04.2014
PT04.04.2014
[2016/33]
Former [2016/32]HU26.09.2005
AT04.12.2013
BE04.12.2013
BG04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
IT04.12.2013
LT04.12.2013
LV04.12.2013
MC04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SI04.12.2013
SK04.12.2013
GR05.03.2014
IS04.04.2014
PT04.04.2014
Former [2016/28]AT04.12.2013
BE04.12.2013
BG04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
IT04.12.2013
LT04.12.2013
LV04.12.2013
MC04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SI04.12.2013
SK04.12.2013
GR05.03.2014
IS04.04.2014
PT04.04.2014
Former [2016/25]AT04.12.2013
BE04.12.2013
BG04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
IT04.12.2013
LT04.12.2013
LV04.12.2013
MC04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SI04.12.2013
SK04.12.2013
IS04.04.2014
PT04.04.2014
Former [2015/37]AT04.12.2013
BE04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
IT04.12.2013
LT04.12.2013
LV04.12.2013
MC04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SI04.12.2013
SK04.12.2013
IS04.04.2014
PT04.04.2014
Former [2015/20]AT04.12.2013
BE04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
MC04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SI04.12.2013
SK04.12.2013
IS04.04.2014
PT04.04.2014
Former [2015/14]AT04.12.2013
BE04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SI04.12.2013
SK04.12.2013
IS04.04.2014
PT04.04.2014
Former [2014/48]AT04.12.2013
BE04.12.2013
CY04.12.2013
CZ04.12.2013
DK04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SK04.12.2013
IS04.04.2014
PT04.04.2014
Former [2014/37]AT04.12.2013
BE04.12.2013
CY04.12.2013
CZ04.12.2013
EE04.12.2013
ES04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
NL04.12.2013
PL04.12.2013
RO04.12.2013
SE04.12.2013
SK04.12.2013
IS04.04.2014
PT04.04.2014
Former [2014/36]AT04.12.2013
BE04.12.2013
CY04.12.2013
EE04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
NL04.12.2013
SE04.12.2013
IS04.04.2014
Former [2014/34]AT04.12.2013
BE04.12.2013
CY04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
NL04.12.2013
SE04.12.2013
Former [2014/26]AT04.12.2013
CY04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
NL04.12.2013
SE04.12.2013
Former [2014/25]AT04.12.2013
FI04.12.2013
LT04.12.2013
LV04.12.2013
NL04.12.2013
SE04.12.2013
Former [2014/24]AT04.12.2013
FI04.12.2013
LT04.12.2013
NL04.12.2013
SE04.12.2013
Former [2014/22]FI04.12.2013
LT04.12.2013
NL04.12.2013
SE04.12.2013
Former [2014/20]LT04.12.2013
Documents cited:Search[A]US5459570  (SWANSON ERIC A [US], et al) [A] 1-7 * the whole document *;
 [A]US6014216  (ZORABEDIAN PAUL [US]) [A] 1-7* the whole document *;
 [A]US6015969  (NATHEL HOWARD [US], et al) [A] 1-7 * the whole document *;
 [DA]JP2001330558  (JAPAN SCIENCE & TECH CORP) [DA] 1 * the whole document *;
 [A]  - AKIBA M ET AL, "Full-field optical coherence tomography by two-dimensional heterodyne detection with a pair of CCD cameras", OPTICS LETTERS, OSA, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC, US, (20030515), vol. 28, no. 10, ISSN 0146-9592, pages 816 - 818, XP002340831 [A] 1 * the whole document *

DOI:   http://dx.doi.org/10.1364/OL.28.000816
 [A]  - AKIBA M ET AL, "Video-rate optical coherence imaging by two-dimensional heterodyne detection", CONFERENCE ON LASERS AND ELECTRO-OPTICS. (CLEO 2001). TECHNICAL DIGEST. POSTCONFERENCE EDITION. BALTIMORE, MD, MAY 6-11, 2001, TRENDS IN OPTICS AND PHOTONICS. (TOPS), US, WASHINGTON, WA : OSA, US, (20010506), VOL. 56, ISBN 1-55752-662-1, pages 380 - 380, XP010559967 [A] 1 * the whole document *

DOI:   http://dx.doi.org/10.1109/CLEO.2001.947944
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.