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Extract from the Register of European Patents

EP About this file: EP1669806

EP1669806 - Lithographic apparatus, reticle exchange unit and device manufacturing method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  15.01.2010
Database last updated on 03.09.2024
Most recent event   Tooltip11.03.2011Lapse of the patent in a contracting state
New state(s): IT
published on 13.04.2011  [2011/15]
Applicant(s)For all designated states
ASML Netherlands BV
De Run 6501
5504 DR Veldhoven / NL
[N/P]
Former [2006/24]For all designated states
ASML Netherlands BV
6501, De Run
5504 DR Veldhoven / NL
Inventor(s)01 / Ten Kate, Nicolaas
Provincialeweg Noord 66
4286 EC Almkerk / NL
 [2006/24]
Representative(s)Weenink, Willem, et al
ASML Netherlands B.V.
Corporate Intellectual Property
De Run 6501
5500 AH Veldhoven / NL
[N/P]
Former [2009/23]Weenink, Willem, et al
ASML Netherlands B.V. Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven / NL
Former [2009/09]Van den Hooven, Jan, et al
ASML Netherlands B.V. Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven / NL
Former [2006/24]Winckels, Johannes Hubertus F., et al
Vereenigde Johan de Wittlaan 7
2517 JR Den Haag / NL
Application number, filing date05077821.607.12.2005
[2006/24]
Priority number, dateUS2004000522007.12.2004         Original published format: US 5220
[2006/24]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1669806
Date:14.06.2006
Language:EN
[2006/24]
Type: A3 Search report 
No.:EP1669806
Date:03.10.2007
[2007/40]
Type: B1 Patent specification 
No.:EP1669806
Date:11.03.2009
Language:EN
[2009/11]
Search report(s)(Supplementary) European search report - dispatched on:EP03.09.2007
ClassificationIPC:G03F7/20
[2006/24]
CPC:
G03F1/64 (EP,US); G03F7/70741 (EP,US); G03F7/70866 (EP,US);
G03F7/70933 (EP,US); G03F7/70983 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2008/24]
Former [2006/24]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Lithographischer Apparat, Vorrichtung für den Wechsel einer Fotomaske und Verfahren zur Herstellung einer Vorrichtung[2006/24]
English:Lithographic apparatus, reticle exchange unit and device manufacturing method[2006/24]
French:Appareil de lithographie, unité d'échange de masques et procédé de fabrication du dispositif[2006/24]
Examination procedure25.01.2008Examination requested  [2008/10]
28.02.2008Despatch of a communication from the examining division (Time limit: M04)
02.05.2008Loss of particular rights, legal effect: designated state(s)
21.05.2008Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, LT, LU, LV, MC, PL, PT, RO, SE, SI, SK, TR
27.06.2008Reply to a communication from the examining division
26.09.2008Communication of intention to grant the patent
26.01.2009Fee for grant paid
26.01.2009Fee for publishing/printing paid
Opposition(s)14.12.2009No opposition filed within time limit [2010/07]
Fees paidRenewal fee
13.12.2007Renewal fee patent year 03
16.12.2008Renewal fee patent year 04
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT11.03.2009
NL11.03.2009
GB07.12.2009
[2011/15]
Former [2011/05]NL11.03.2009
GB07.12.2009
Former [2009/45]NL11.03.2009
Documents cited:Search[X]US2001026355  (AOKI TAKASHI [JP], et al) [X] 1,2,4-9,11-15,17-20 * abstract * * paragraphs [0091] - [0109] - [0130] - [0137] *;
 [X]US2002126269  (SATO TATSUO [JP]) [X] 1,5-8,11-14,18-20 * abstract * * paragraphs [0013] , [0014] , [0034] , [0061] - [0065] - [0115] - [0128] *;
 [A]US2003150329  (KAMONO TAKASHI [JP]) [A] 1,2,4-9,11-15,17-20 * abstract ** paragraphs [0012] , [0053] - [0057] - [0060] , [0061] , [0074] *;
 [X]  - NELLIS ET AL., "Theoretical analysis of 157-nm hard pellicle system purification via a cyclic purge/fill process", J. MICROLITH., MICROFAB., MICROSYST., (200401), vol. 3, no. 1, pages 122 - 129, XP002446371 [X] 1,5-8,11-14,18-20 * abstract * * the whole document *

DOI:   http://dx.doi.org/10.1117/1.1630313
by applicantUS6507390
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.