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Extract from the Register of European Patents

EP About this file: EP1717817

EP1717817 - A semiconductor memory device with information loss self-detect capability [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  17.02.2017
Database last updated on 16.07.2024
Most recent event   Tooltip17.02.2017No opposition filed within time limitpublished on 22.03.2017  [2017/12]
Applicant(s)For all designated states
Micron Technology, Inc.
8000 S. Federal Way
Boise, Idaho 83707 / US
[2016/17]
Former [2016/16]For all designated states
Numonyx BV
A-ONE Biz Center
Z.A. Vers la Piece
Rte de L'Etraz
1180 Rolle / CH
Former [2016/15]For all designated states
STMicroelectronics NV
39 Chemin du Champ-des-Filles
1228 Plan-les-Ouates, Geneva / CH
Former [2012/19]For all designated states
STMicroelectronics Srl
Via Olivetti 2
20864 Agrate Brianza / IT
Former [2010/14]For all designated states
STMicroelectronics Srl
Via Olivetti 2
20041 Agrate Brianza (MB) / IT
Former [2006/44]For all designated states
STMicroelectronics S.r.l.
Via C. Olivetti, 2
20041 Agrate Brianza MI / IT
Inventor(s)01 / Resta, Claudio
Via Maranta, 5
I-23030 Villa di Tirano (SO) / IT
02 / Bedeschi, Ferdinando
Via Ambrosini, 6
I-20052 Monza (MI) / IT
 [2016/15]
Former [2006/44]01 / Resta, Claudio
Via Maranta, 5
I-23030 Villa di Tirano (SO) / IT
02 / Bedeschi, Ferdinando
Via Ambrosini, 6
I-20052 Monza (MI) / IT
Representative(s)Manley, Nicholas Michael, et al
WP Thompson
8th Floor
1 Mann Island
Liverpool L3 1BP / GB
[2016/15]
Former [2014/20]Manley, Nicholas Michael, et al
WP Thompson
Coopers Building
Church Street
Liverpool L1 3AB / GB
Former [2009/12]W.P. Thompson & Co.
Coopers Building Church Street
Liverpool L1 3AB / GB
Former [2006/44]Maccalli, Marco, et al
Maccalli & Pezzoli S.r.l., Via Settembrini, 40
20124 Milano / IT
Application number, filing date05103557.429.04.2005
[2006/44]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1717817
Date:02.11.2006
Language:EN
[2006/44]
Type: B1 Patent specification 
No.:EP1717817
Date:13.04.2016
Language:EN
[2016/15]
Type: B8 Corrected title page of specification 
No.:EP1717817
Date:18.05.2016
[2016/20]
Search report(s)(Supplementary) European search report - dispatched on:EP21.10.2005
ClassificationIPC:G11C13/00, G11C16/34
[2015/43]
CPC:
G11C13/0004 (EP,US); G11C11/22 (EP,US); G11C11/2275 (EP,US);
G11C13/0033 (EP,US); G11C13/0069 (EP,US); G11C16/3431 (EP,US);
G11C2013/0083 (EP,US) (-)
Former IPC [2006/44]G11C16/34, G11C16/02
Designated contracting statesDE,   FR,   GB,   IT [2016/15]
Former [2007/28]DE,  FR,  GB,  IT 
Former [2006/44]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Halbleiterspeicheranordnung mit Fähigkeit zur Informationsverlusterkennung[2006/44]
English:A semiconductor memory device with information loss self-detect capability[2006/44]
French:Dispositif de mémoire à semi-conducteurs avec la capacité de détection de perte d'information[2006/44]
Examination procedure19.04.2007Examination requested  [2007/22]
23.11.2007Despatch of a communication from the examining division (Time limit: M06)
03.06.2008Reply to a communication from the examining division
19.04.2011Despatch of a communication from the examining division (Time limit: M06)
18.10.2011Reply to a communication from the examining division
07.07.2015Despatch of a communication from the examining division (Time limit: M02)
02.09.2015Reply to a communication from the examining division
12.10.2015Communication of intention to grant the patent
19.02.2016Fee for grant paid
19.02.2016Fee for publishing/printing paid
19.02.2016Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  23.11.2007
Opposition(s)16.01.2017No opposition filed within time limit [2017/12]
Fees paidRenewal fee
25.04.2007Renewal fee patent year 03
26.03.2008Renewal fee patent year 04
29.04.2009Renewal fee patent year 05
26.04.2010Renewal fee patent year 06
25.04.2011Renewal fee patent year 07
28.03.2012Renewal fee patent year 08
12.04.2013Renewal fee patent year 09
25.03.2014Renewal fee patent year 10
10.04.2015Renewal fee patent year 11
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT13.04.2016
[2017/04]
Documents cited:Search[Y]US5359205  (OVSHINSKY STANFORD R [US]) [Y] 7,8,10 * column 19, line 18 - line 43; figures 3,4 * * column 25, line 35 - line 62; figure 8 *;
 [X]US5671180  (HIGUCHI MITSUO [JP]) [X] 1-4,11-15 * column 10, line 53 - column 13, line 22; figure 4 *;
 [XY]US5999448  (KURIHARA HIDEO [JP], et al) [X] 1-5,11,12,14 * column 4, line 10 - line 48; figure 3 * * column 7, line 16 - column 8, line 56; figures 6,7 * [Y] 6-8,10;
 [A]US6249841  (SIKES L DAVID [US], et al) [A] 6,8,10* column 4, line 9 - column 6, line 37; figure - *;
 [A]US2003218925  (TORJUSSEN LARS SUNDELL [NO], et al) [A] 9,10 * paragraph [0046] - paragraph [0048]; figures 5-7 *;
 [X]EP1426971  (SHARP KK [JP]) [X] 1-4,7,8,11,12,14,15 * paragraph [0020] - paragraph [0046]; figures 2-5 *;
 [Y]US2004165456  (YAMADA JUNICHI [JP]) [Y] 6 * column A; figure 1 *
by applicantUS5359205
 US5671180
 US5999448
 EP1426971
 US2004165456
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.