blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1675196

EP1675196 - Method for manufacturing a thin film transistor and a flat panel display [Right-click to bookmark this link]
Former [2006/26]Thin film transistors, flat panel display including the thin film transistor and method for manufacturing the thin film transistor and the flat panel display
[2009/42]
StatusNo opposition filed within time limit
Status updated on  14.01.2011
Database last updated on 27.07.2024
Most recent event   Tooltip14.01.2011No opposition filed within time limitpublished on 16.02.2011  [2011/07]
Applicant(s)For all designated states
Samsung Mobile Display Co., Ltd.
575 Shin-dong, Yeongtong-gu, Suwon-si
Gyeonggi-do / KR
[2009/09]
Former [2006/26]For all designated states
Samsung SDI Co., Ltd.
575 Shin-dong, Yeongtong-gu Suwon-si
Gyeonggi-do / KR
Inventor(s)01 / YANG, Nam-Choul
Samsung SDI Co., Ltd., 575 Shin-dong, Yeongtong-gu
Gyeonggi-do / KR
02 / KIM, Hye-Dong
Samsung SDI Co., Ltd., 575 Shin-dong, Yeongtong-gu
Gyeonggi-do / KR
03 / SUH, Min-Chul
Samsung SDI Co., Ltd., 575 Shin-dong, Yeongtong-gu
Gyeonggi-do / KR
04 / KOO, Jae-Bon, c/o Samsung SDI Co., Ltd.
428-5 Gongse-ri, Giheung-eup, Yongin-si
Gyeonggi-do / KR
05 / LEE, Sang-Min, c/o Samsung SDI Co.Ltd.
428-5 Gongse-ri, Giheung-eup, Yongin-si
Gyeonggi-do / KR
06 / LEE, Hun-Jung, c/o Samsung SDI Co., Ltd.
428-5 Gongse-ri, Giheung-eup, Yongin-si
Gyeonggi-do / KR
 [2009/43]
Former [2006/26]01 / YANG, Nam-Choul
Samsung SDI Co., Ltd., 575 Shin-dong, Yeongtong-g
Gyeonggi-do / KR
02 / KIM, Hye-Dong
Samsung SDI Co., Ltd., 575 Shin-dong, Yeongtong-g
Gyeonggi-do / KR
03 / SUH, Min-Chul
Samsung SDI Co., Ltd., 575 Shin-dong, Yeongtong-g
Gyeonggi-do / KR
04 / KOO, Jae-Bon, c/o Samsing SDI Co., Ltd.
428-5 Gongse-ri, Giheung-eup, Yongin-si
Gyeonggi-do / KR
05 / LEE, Sang-Min, c/o Samsung SDI Co.Ltd.
428-5 Gongse-ri, Giheung-eup, Yongin-si
Gyeonggi-do / KR
06 / LEE, Hun-Jung, c/o Samsung SDI Co., Ltd.
428-5 Gongse-ri, Giheung-eup, Yongin-si
Gyeonggi-do / KR
Representative(s)Hengelhaupt, Jürgen
Gulde & Partner
Patent- und Rechtsanwaltskanzlei mbB
Wallstrasse 58/59
10179 Berlin / DE
[N/P]
Former [2008/43]Hengelhaupt, Jürgen
Gulde Hengelhaupt Ziebig & Schneider Patentanwälte - Rechtsanwälte Wallstrasse 58/59
10179 Berlin / DE
Former [2006/26]Hengelhaupt, Jürgen
Gulde Hengelhaupt Ziebig & Scheider Wallstrasse 58/59
10179 Berlin / DE
Application number, filing date05112462.620.12.2005
[2006/26]
Priority number, dateKR2004011109723.12.2004         Original published format: KR 2004111097
[2006/26]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1675196
Date:28.06.2006
Language:EN
[2006/26]
Type: B1 Patent specification 
No.:EP1675196
Date:10.03.2010
Language:EN
[2010/10]
Search report(s)(Supplementary) European search report - dispatched on:EP20.04.2006
ClassificationIPC:H01L51/56, H01L51/10
[2009/42]
CPC:
B82Y10/00 (EP,KR,US); H10K71/211 (EP,KR,US); B82Y30/00 (EP,KR,US);
H10K10/462 (EP,KR,US); H10K85/113 (EP,KR,US); H10K85/615 (EP,KR,US)
Former IPC [2006/26]H01L51/40, H01L51/10
Designated contracting statesDE,   FR,   GB [2007/10]
Former [2006/26]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Herstellungsmethoden für Dünnschichttransistor und Flachbildschirm[2009/42]
English:Method for manufacturing a thin film transistor and a flat panel display[2009/42]
French:Méthode de fabrication d'un transitor à couche mince et d'un écran plat[2009/42]
Former [2006/26]Dünnschichttransistor, Flachbildschirm mit Dünnschichttransistor und Herstellungsmethoden für Dünnschichttransistor und Flachbildschirm
Former [2006/26]Thin film transistors, flat panel display including the thin film transistor and method for manufacturing the thin film transistor and the flat panel display
Former [2006/26]Transistor à couche mince, écran plat comprenant le transistor à couche mince et méthode de fabrication du transitor à couche mince et de l'écran plat
Examination procedure20.12.2006Amendment by applicant (claims and/or description)
20.12.2006Examination requested  [2007/06]
28.12.2006Loss of particular rights, legal effect: designated state(s)
13.04.2007Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
04.02.2008Despatch of a communication from the examining division (Time limit: M04)
04.06.2008Reply to a communication from the examining division
16.09.2008Despatch of a communication from the examining division (Time limit: M04)
23.12.2008Reply to a communication from the examining division
01.10.2009Communication of intention to grant the patent
21.01.2010Fee for grant paid
21.01.2010Fee for publishing/printing paid
Opposition(s)13.12.2010No opposition filed within time limit [2011/07]
Fees paidRenewal fee
21.12.2007Renewal fee patent year 03
31.03.2008Renewal fee patent year 04
23.12.2009Renewal fee patent year 05
Penalty fee
Penalty fee Rule 85a EPC 1973
01.02.2007AT   M01   Not yet paid
01.02.2007BE   M01   Not yet paid
01.02.2007BG   M01   Not yet paid
01.02.2007CH   M01   Not yet paid
01.02.2007CY   M01   Not yet paid
01.02.2007CZ   M01   Not yet paid
01.02.2007DK   M01   Not yet paid
01.02.2007EE   M01   Not yet paid
01.02.2007ES   M01   Not yet paid
01.02.2007FI   M01   Not yet paid
01.02.2007GR   M01   Not yet paid
01.02.2007HU   M01   Not yet paid
01.02.2007IE   M01   Not yet paid
01.02.2007IS   M01   Not yet paid
01.02.2007IT   M01   Not yet paid
01.02.2007LT   M01   Not yet paid
01.02.2007LU   M01   Not yet paid
01.02.2007LV   M01   Not yet paid
01.02.2007MC   M01   Not yet paid
01.02.2007NL   M01   Not yet paid
01.02.2007PL   M01   Not yet paid
01.02.2007PT   M01   Not yet paid
01.02.2007RO   M01   Not yet paid
01.02.2007SE   M01   Not yet paid
01.02.2007SI   M01   Not yet paid
01.02.2007SK   M01   Not yet paid
01.02.2007TR   M01   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US5705826  (ARATANI SUKEKAZU [JP], et al) [A] 1* column 17, lines 19-27 *;
 [X]WO0108241  (E INK CORP [US]) [X] 1,19 * page 2, lines 6-28; figure 3 * * page 6, lines 8-21 *;
 [XY]US6498114  (AMUNDSON KARL [US], et al) [X] 1,3,6,8-10,12,15,17-24 * column 3, line 36 - column 4, line 2; figure 3 * * column 4, lines 59-62 * * column 5, lines 12-54 * [Y] 4,5,7;
 [PX]US2005064623  (BAO ZHENAN [US]) [PX] 1-3,6,8-12,15,17-24 * paragraphs [0007] , [0009] , [0018] - [0020]; figure 1 *;
 [Y]  - YAGI IWAO ET AL, "Direct observation of contact and channel resistance in pentacene four-terminal thin-film transistor patterned by laser ablation method", APPLIED PHYSICS LETTERS, AIP, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US, (20040202), vol. 84, no. 5, ISSN 0003-6951, pages 813 - 815, XP012062006 [Y] 4,5 * page 814, column 2, lines 10-16; figure 2 *

DOI:   http://dx.doi.org/10.1063/1.1645316
 [Y]  - SONG C-K, "EFFECTS OF HYDROPHOBIC TREATMENT ON THE PERFORMANCE OF PENTACENE TFT", KIEE INTERNATIONAL TRANSACTIONS ON ELECTROPHYSICS AND APPLICATIONS, KR, (20010716), vol. 12C, no. 2, ISSN 1598-2610, pages 136 - 138, XP009012128 [Y] 7 * page 136, column 2, lines 12-17 *
by applicantUS6498114
    - F. DINELLI, SYNTHETIC METALS, (2004), vol. 146, pages 373 - 376
    - BRAINS A. MATTIES, MAT. RES. SOC. SYMP. PROC., (2003), vol. 771
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.