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Extract from the Register of European Patents

EP About this file: EP1574345

EP1574345 - Position deviation detecting method and image forming device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  29.07.2011
Database last updated on 26.06.2024
Most recent event   Tooltip29.07.2011No opposition filed within time limitpublished on 31.08.2011  [2011/35]
Applicant(s)For all designated states
Ricoh Company, Ltd.
3-6, Nakamagome 1-chome Ohta-ku
Tokyo 143-8555 / JP
[N/P]
Former [2005/37]For all designated states
Ricoh Company
1-3-6, Nakamagome, Ohta-ku
Tokyo 143-8555 / JP
Inventor(s)01 / Kitao, Katsuyuki
4-16-12-101, Midorigaoka
Zama-shi, Tokyo / JP
 [2005/37]
Representative(s)Mounteney, Simon James
Marks & Clerk LLP
15 Fetter Lane
London EC4A 1BW / GB
[N/P]
Former [2005/37]Mounteney, Simon James
Marks & Clerk 90 Long Acre
London WC2E 9RA / GB
Application number, filing date05250959.321.02.2005
[2005/37]
Priority number, dateJP2004004507720.02.2004         Original published format: JP 2004045077
[2005/37]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1574345
Date:14.09.2005
Language:EN
[2005/37]
Type: A3 Search report 
No.:EP1574345
Date:12.04.2006
[2006/15]
Type: B1 Patent specification 
No.:EP1574345
Date:22.09.2010
Language:EN
[2010/38]
Search report(s)(Supplementary) European search report - dispatched on:EP23.02.2006
ClassificationIPC:B41J2/47, B41J2/21, G03G15/00, H04N1/00
[2006/15]
CPC:
H04N1/6033 (EP,US); G03G15/0131 (EP,US); G03G15/50 (EP,US);
H04N1/58 (EP,US); G03G2215/0119 (EP,US); G03G2215/0129 (EP,US);
G03G2215/0141 (EP,US); G03G2215/0161 (EP,US) (-)
Former IPC [2005/37]B41J2/47, B41J2/21
Designated contracting statesDE,   FR,   GB [2006/51]
Former [2005/37]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Verfahren zum Erfassen einer Positionsabweichung und Bilderzeugungsvorrichtung[2005/37]
English:Position deviation detecting method and image forming device[2005/37]
French:Méthode pour détecter une déviation de position et dispositif de formation d'image[2005/37]
Examination procedure16.03.2005Examination requested  [2005/37]
30.10.2007Despatch of a communication from the examining division (Time limit: M06)
22.04.2008Reply to a communication from the examining division
12.01.2009Despatch of a communication from the examining division (Time limit: M06)
09.06.2009Reply to a communication from the examining division
04.05.2010Communication of intention to grant the patent
09.08.2010Fee for grant paid
09.08.2010Fee for publishing/printing paid
Opposition(s)23.06.2011No opposition filed within time limit [2011/35]
Fees paidRenewal fee
14.02.2007Renewal fee patent year 03
13.02.2008Renewal fee patent year 04
13.02.2009Renewal fee patent year 05
16.02.2010Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]EP1074894  (SEIKO EPSON CORP [JP]) [X] 1-4* figures 18,19 *;
 [X]US6408156  (MIYAZAKI YOSHITAKA [JP], et al) [X] 1-4 * the whole document *;
 [X]US2003210412  (ISHIBASHI HITOSHI [JP]) [X] 1-4 * the whole document *
ExaminationEP0478005
 US2003020930
by applicantUS156
 US6408
 EP0478005
 EP0944242
 EP1074894
 US2003020930
 US2003210412
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.