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Extract from the Register of European Patents

EP About this file: EP1737998

EP1737998 - REMOTE CHAMBER METHODS FOR REMOVING SURFACE DEPOSITS [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  05.03.2010
Database last updated on 30.10.2024
Most recent event   Tooltip05.03.2010Application deemed to be withdrawnpublished on 07.04.2010  [2010/14]
Applicant(s)For all designated states
MASSACHUSETTS INSTITUTE OF TECHNOLOGY
Technology Licensing Office
Five Cambridge Center
Kendall Square
Room NE25-230
Cambridge, MA 02142-1493 / US
[N/P]
Former [2007/01]For all designated states
MASSACHUSETTS INSTITUTE OF TECHNOLOGY
Technology Licensing Office, Five Cambridge Center Kendall Square, Room NE25-230
Cambridge, MA 02142-1493 / US
Inventor(s)01 / BAI, Bo
60 Wadsworth Street, Apartment 19A
Cambridge, MA 02142 / US
02 / SAWIN, Herbert, Harold
15 Larkin Road
Chestnut Hill, MA 02467 / US
 [2007/01]
Representative(s)Matthews, Derek Peter
Dehns
St Bride's House
10 Salisbury Square
London EC4Y 8JD / GB
[N/P]
Former [2007/01]Matthews, Derek Peter
Frank B. Dehn & Co. St Bride's House 10 Salisbury Square
London EC4Y 8JD / GB
Application number, filing date05760434.024.03.2005
[2007/01]
WO2005US10693
Priority number, dateUS20040556227P24.03.2004         Original published format: US 556227 P
US20040640833P30.12.2004         Original published format: US 640833 P
US20040640444P30.12.2004         Original published format: US 640444 P
[2007/01]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2005090638
Date:29.09.2005
Language:EN
[2005/39]
Type: A2 Application without search report 
No.:EP1737998
Date:03.01.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 29.09.2005 takes the place of the publication of the European patent application.
[2007/01]
Search report(s)International search report - published on:EP16.11.2006
ClassificationIPC:C23C16/44, H01L21/00
[2007/01]
CPC:
H01J37/32862 (EP); C23C16/44 (KR); B08B7/0035 (EP);
C23C16/4405 (EP); C23F4/00 (KR); H01L21/00 (KR);
Y02C20/30 (EP) (-)
Designated contracting statesDE,   FR,   GB,   IE,   IT,   NL [2007/26]
Former [2007/01]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
BANot yet paid
HRNot yet paid
LVNot yet paid
MKNot yet paid
YUNot yet paid
TitleGerman:FERNKAMMERVERFAHREN ZUM ENTFERNEN VON OBERFLÄCHENABLAGERUNGEN[2007/01]
English:REMOTE CHAMBER METHODS FOR REMOVING SURFACE DEPOSITS[2007/01]
French:PROCEDE A CHAMBRE SEPAREE POUR L'ELIMINATION DES DEPOTS DE SURFACE[2007/01]
Entry into regional phase06.10.2006National basic fee paid 
06.10.2006Designation fee(s) paid 
06.10.2006Examination fee paid 
Examination procedure06.10.2006Examination requested  [2007/01]
01.10.2009Application deemed to be withdrawn, date of legal effect  [2010/14]
16.11.2009Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2010/14]
Fees paidRenewal fee
14.03.2007Renewal fee patent year 03
14.03.2008Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
31.03.200905   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[A]EP1304731  (RES INST INNOVATIVE TECH EARTH [JP]) [A] 1-16 * paragraph [0055] - paragraph [0060] *;
 [XDA]  - OH C H ET AL, "Effect of N-containing additive gases on global warming gas emission during remote plasma cleaning process of silicon nitride PECVD chamber using C4F8/O2/Ar chemistry", SURFACE & COATINGS TECHNOLOGY ELSEVIER SWITZERLAND, (20030701), vol. 171, no. 1-3, ISSN 0257-8972, pages 267 - 272, XP002362634 [XD] 12-15 * section 2. Experimental; figs 1& 2 * [A] 1-11,16

DOI:   http://dx.doi.org/10.1016/S0257-8972(03)00284-6
 [A]  - CRUDEN BRETT A ET AL, "Neutral gas temperature estimate in CF4/O2/Ar inductively coupled plasmas", APPLIED PHYSICS LETTERS, AIP, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US, (20020805), vol. 81, no. 6, ISSN 0003-6951, pages 990 - 992, XP012033207 [A] 1-11 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.1497998
 [A]  - ALLGOOD C ET AL, "Evaluation of octafluorocyclobutane as a chamber clean gas in a plasma-enhanced silicon dioxide chemical vapor deposition reactor", JOURNAL OF THE ELECTROCHEMICAL SOCIETY, ELECTROCHEMICAL SOCIETY. MANCHESTER, NEW HAMPSHIRE, US, (2003), vol. 150, no. 2, ISSN 0013-4651, pages G122 - G126, XP002280013 [A] 5,6 * the whole document *

DOI:   http://dx.doi.org/10.1149/1.1535911
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.