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Extract from the Register of European Patents

EP About this file: EP1776714

EP1776714 - METHOD FOR ETCHING MESA ISOLATION IN ANTIMONY BASED COMPOUND SEMICONDUCTOR STRUCTURES [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  19.06.2009
Database last updated on 28.09.2024
Most recent event   Tooltip19.06.2009Application deemed to be withdrawnpublished on 22.07.2009  [2009/30]
Applicant(s)For all designated states
Northrop Grumman Corporation
1840 Century Park East
Los Angeles, CA 90067-2199 / US
[2007/17]
Inventor(s)01 / NAM, Peter, S.
17626 De Oro Place
Cerritos, CA 90703 / US
02 / LANGE, Michael, D.
1159 South Silver Star Way
Anaheim, CA 92808 / US
03 / TSAI, Roger, S.
22499 Kent Avenue
Torrance, CA 90505 / US
 [2007/17]
Representative(s)Moore, Barry, et al
Hanna Moore + Curley
Garryard House
25/26 Earlsfort Terrace
Dublin 2, D02 PX51 / IE
[N/P]
Former [2007/17]Moore, Barry, et al
Hanna, Moore & Curley 13 Lower Lad Lane
Dublin 2 / IE
Application number, filing date05803227.722.07.2005
[2007/17]
WO2005US26117
Priority number, dateUS2004091811912.08.2004         Original published format: US 918119
[2007/17]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2006020355
Date:23.02.2006
Language:EN
[2006/08]
Type: A2 Application without search report 
No.:EP1776714
Date:25.04.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 23.02.2006 takes the place of the publication of the European patent application.
[2007/17]
Search report(s)International search report - published on:EP18.05.2006
ClassificationIPC:H01L21/306
[2007/17]
CPC:
H01L29/66462 (EP,US); H01L21/30621 (EP,US); H01L29/7783 (EP,US)
Designated contracting statesDE,   FR,   GB [2007/47]
Former [2007/17]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
BANot yet paid
HRNot yet paid
MKNot yet paid
YUNot yet paid
TitleGerman:ÄTZVERFAHREN FÜR MESAISOLIERUNG VON HALBLEITERSTRUKTUREN MIT ANTIMONBASIERTER VERBINDUNG[2007/17]
English:METHOD FOR ETCHING MESA ISOLATION IN ANTIMONY BASED COMPOUND SEMICONDUCTOR STRUCTURES[2007/17]
French:PROCEDE DE GRAVURE D'ISOLATION MESA DANS DES STRUCTURES DE SEMI-CONDUCTEURS A BASE D'ANTIMOINE[2007/17]
Entry into regional phase15.01.2007National basic fee paid 
15.01.2007Designation fee(s) paid 
15.01.2007Examination fee paid 
Examination procedure15.01.2007Examination requested  [2007/17]
15.09.2008Despatch of a communication from the examining division (Time limit: M04)
27.01.2009Application deemed to be withdrawn, date of legal effect  [2009/30]
03.03.2009Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2009/30]
Fees paidRenewal fee
27.07.2007Renewal fee patent year 03
Penalty fee
Additional fee for renewal fee
31.07.200804   M06   Not yet paid
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Cited inInternational search[A]US6133593  (BOOS J BRAD [US], et al) [A] 1-6 * example 1 *;
 [A]US6384432  (BERENZ JOHN J [US]) [A] 1-5,9 * column 3, line 54 - column 4, line 5 * * column 4, lines 46-50 *;
 [A]US4640737  (NAGASAKA HIROKO [JP], et al) [A] 9,11 * column 8, lines 45-54 * * column 9, lines 25-30 *
 [A]  - KANJI YOH ET AL, "AN INAS CHANNEL HETEROJUNCTION FIELD-EFFECT TRANSISTOR WITH HIGH TRANSCONDUCTANCE", IEEE ELECTRON DEVICE LETTERS, IEEE SERVICE CENTER, NEW YORK, NY, US, (19901101), vol. 11, no. 11, ISSN 0741-3106, pages 526 - 528, XP000148746 [A] 1-7 * II. Fabrication;; figure 1(b) *

DOI:   http://dx.doi.org/10.1109/55.63021
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.