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Extract from the Register of European Patents

EP About this file: EP1816100

EP1816100 - NANO TWEEZERS AND SCANNING PROBE MICROSCOPE HAVING THE SAME [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  21.10.2011
Database last updated on 14.09.2024
Most recent event   Tooltip21.10.2011Withdrawal of applicationpublished on 23.11.2011  [2011/47]
Applicant(s)For all designated states
National University Corporation Kagawa University
1-1 Saiwai-cho
Takamatsu, Kagawa 760-8521 / JP
For all designated states
Aoi Electronics Co. Ltd.
455-1, Kohzai Minamimachi
Takamatsu-shi, Kagawa 761-8014 / JP
[2007/32]
Inventor(s)01 / HASHIGUCHI, Gen, F. OF ENG. NUC KAGAWA UNIVERSITY
2217-20, Hayashi-cho
Takamatsu-shi, Kagawa / JP
02 / HOSOGI, Maho, F. OF ENG. NUC KAGAWA UNIVERSITY
2217-20, Hayashi-cho
Takamatsu-shi, Kagawa / JP
03 / KONNO, Takashi, AOI ELECTRONICS CO., LTD.
455-1, Kohzai-Minamimachi
Takamatsu-shi, Kagawa 761-8014 / JP
 [2007/32]
Representative(s)Schaeberle, Steffen
Hoefer & Partner
Patentanwälte
Pilgersheimer Strasse 20
81543 München / DE
[N/P]
Former [2007/32]Schaeberle, Steffen
Hoefer & Partner Patentanwälte Pilgersheimer Strasse 20
81543 München / DE
Application number, filing date05809524.122.11.2005
[2007/32]
WO2005JP21456
Priority number, dateJP2004033784222.11.2004         Original published format: JP 2004337842
JP2005004288318.02.2005         Original published format: JP 2005042883
[2007/32]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2006054771
Date:26.05.2006
Language:EN
[2006/21]
Type: A1 Application with search report 
No.:EP1816100
Date:08.08.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 26.05.2006 takes the place of the publication of the European patent application.
[2007/32]
Search report(s)International search report - published on:JP26.05.2006
ClassificationIPC:B82B1/00, B82B3/00, B81B3/00, G01B21/30, G01N13/16
[2007/32]
CPC:
B81C99/002 (EP,US); B82Y35/00 (US); G01Q60/38 (EP,US);
G01Q80/00 (EP,US); Y10S977/902 (EP,US); Y10S977/962 (EP,US)
Designated contracting statesCH,   DE,   FR,   LI [2008/01]
Former [2007/32]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
BANot yet paid
HRNot yet paid
MKNot yet paid
YUNot yet paid
TitleGerman:NANOPINZETTE UND RASTERMIKROSKOP DAMIT[2007/32]
English:NANO TWEEZERS AND SCANNING PROBE MICROSCOPE HAVING THE SAME[2007/32]
French:NANOPINCES ET MICROSCOPE-SONDE DE BALAYAGE EQUIPE DE TELLES PINCES[2007/32]
Entry into regional phase26.05.2006Translation filed 
31.05.2007National basic fee paid 
31.05.2007Search fee paid 
31.05.2007Designation fee(s) paid 
31.05.2007Examination fee paid 
Examination procedure31.05.2007Examination requested  [2007/32]
23.06.2007Loss of particular rights, legal effect: designated state(s)
01.08.2007Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CY, CZ, DK, EE, ES, FI, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
12.10.2011Application withdrawn by applicant  [2011/47]
Fees paidRenewal fee
27.11.2007Renewal fee patent year 03
26.11.2008Renewal fee patent year 04
27.11.2009Renewal fee patent year 05
30.11.2010Renewal fee patent year 06
Penalty fee
Penalty fee Rule 85a EPC 1973
01.08.2007AT   M02   Not yet paid
01.08.2007BE   M02   Not yet paid
01.08.2007BG   M02   Not yet paid
01.08.2007CY   M02   Not yet paid
01.08.2007CZ   M02   Not yet paid
01.08.2007DK   M02   Not yet paid
01.08.2007EE   M02   Not yet paid
01.08.2007ES   M02   Not yet paid
01.08.2007FI   M02   Not yet paid
01.08.2007GB   M02   Not yet paid
01.08.2007GR   M02   Not yet paid
01.08.2007HU   M02   Not yet paid
01.08.2007IE   M02   Not yet paid
01.08.2007IS   M02   Not yet paid
01.08.2007IT   M02   Not yet paid
01.08.2007LT   M02   Not yet paid
01.08.2007LU   M02   Not yet paid
01.08.2007LV   M02   Not yet paid
01.08.2007MC   M02   Not yet paid
01.08.2007NL   M02   Not yet paid
01.08.2007PL   M02   Not yet paid
01.08.2007PT   M02   Not yet paid
01.08.2007RO   M02   Not yet paid
01.08.2007SE   M02   Not yet paid
01.08.2007SI   M02   Not yet paid
01.08.2007SK   M02   Not yet paid
01.08.2007TR   M02   Not yet paid
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Cited inInternational search[A]WO03045838  (TECHNO NETWORK SHIKOKU CO LTD [JP], et al);
 [A]JP2001252900  (NAKAYAMA YOSHIKAZU, et al);
 [A]JP2004028830  (JAPAN SCIENCE & TECH CORP);
 [A]JP2004317255  (SII NANOTECHNOLOGY INC);
 [A]JPH0890431  (SHIMADZU CORP);
 [A]US2002061662  (BOGGILD PETER [DK]);
 [A]US2002122766  (LIEBER CHARLES M [US], et al);
 [A]JPS584389U  ;
 [A]JPH1144697  (SEIKO INSTR INC)
 [A]  - HASHIGUCHI G. ET AL, "Micromachining Gijutsu ni yoru Netsu Bocho Actuator Ittaigata Nanogripper no Kaihatsu", THE TRANSACTIONS OF THE INSTITUTE OF ELECTRICAL ENGINEERS OF JAPAN E, (2003), vol. 123-E, pages 1 - 8, XP003007775
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.