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Extract from the Register of European Patents

EP About this file: EP1829050

EP1829050 - SCANNER FOR PROBE MICROSCOPY [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  19.01.2018
Database last updated on 24.04.2024
FormerThe patent has been granted
Status updated on  10.02.2017
FormerGrant of patent is intended
Status updated on  03.02.2017
Most recent event   Tooltip06.03.2020Lapse of the patent in a contracting state
New state(s): TR		published on 08.04.2020  [2020/15]
Applicant(s)For all designated states
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
1111 Franklin Street, 12th Floor
Oakland, CA 94607-5200 / US
[N/P]
Former [2016/45]For all designated states
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
1111 Franklin Street, 12th Floor
Oakland CA 94607-5200 / US
Former [2007/36]For all designated states
The Regents of the University of California
1111 Franklin Street 5th Floor
Oakland, CA 94607-5200 / US
Inventor(s)01 / Hansma, Paul K.
6891 Trigo Road
Isla Vista, CA 93117 / US
02 / Fantner, Georg
5611 Camino Cielo
Santa Barbara, CA 93105 / US
03 / Kindt, Johannes H.
1950 Eucalyptus Hill Road
Santa Barbara, CA 93108 / US
 [2017/11]
Former [2007/36]01 / KINDT, Johannes, H.
6891 Trigo Road
Isla Vista, CA 93117 / US
02 / FANTNER, Georg
5611 Camino Cielo
Santa Barbara, CA 93105 / US
03 / HANSMA, Paul, K.
1950 Eucalyptus Hill Road
Santa Barbara, CA 93108 / US
Representative(s)Murgitroyd & Company
165-169 Scotland Street
Glasgow G5 8PL / GB
[N/P]
Former [2014/42]Syrtsova, Ekaterina, et al
Murgitroyd & Company
Scotland House
165-169 Scotland Street
Glasgow, Strathclyde G5 8PL / GB
Former [2013/45]McIlroy, Steven David, et al
Murgitroyd & Company Scotland House 165-169 Scotland Street
Glasgow G5 8PL / GB
Former [2009/31]Jones, Keith William
Murgitroyd & Company Scotland House 165-169 Scotland Street Glasgow
G5 8PL / GB
Former [2007/36]Jones, Keith William
Murgitroyd & Company Scotland House 165-169 Scotland Street
Glasgow G5 8PL / GB
Application number, filing date05812944.613.09.2005
[2007/36]
WO2005US32871
Priority number, dateUS2004000058930.11.2004         Original published format: US 589
[2007/36]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2006060052
Date:08.06.2006
Language:EN
[2006/23]
Type: A1 Application with search report 
No.:EP1829050
Date:05.09.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 08.06.2006 takes the place of the publication of the European patent application.
[2007/36]
Type: B1 Patent specification 
No.:EP1829050
Date:15.03.2017
Language:EN
[2017/11]
Search report(s)International search report - published on:EP08.06.2006
ClassificationIPC:G01Q10/04
[2016/45]
CPC:
G01Q10/04 (EP,KR,US)
Former IPC [2007/36]G12B21/22, G12B21/24
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2017/11]
Former [2007/36]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:SCANNER FÜR DIE SONDENMIKROSKOPIE[2007/36]
English:SCANNER FOR PROBE MICROSCOPY[2007/36]
French:APPAREIL DE BALAYAGE POUR MICROSCOPIE A SONDE[2007/36]
Entry into regional phase02.07.2007National basic fee paid 
02.07.2007Designation fee(s) paid 
02.07.2007Examination fee paid 
Examination procedure28.06.2006Request for preliminary examination filed
International Preliminary Examining Authority: EP
02.07.2007Amendment by applicant (claims and/or description)
02.07.2007Examination requested  [2007/36]
17.02.2009Despatch of a communication from the examining division (Time limit: M04)
12.06.2009Reply to a communication from the examining division
04.04.2011Despatch of a communication from the examining division (Time limit: M06)
07.10.2011Reply to a communication from the examining division
27.02.2014Despatch of a communication from the examining division (Time limit: M06)
09.09.2014Reply to a communication from the examining division
14.10.2016Communication of intention to grant the patent
02.02.2017Fee for grant paid
02.02.2017Fee for publishing/printing paid
02.02.2017Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  17.02.2009
Opposition(s)18.12.2017No opposition filed within time limit [2018/08]
Fees paidRenewal fee
07.08.2007Renewal fee patent year 03
25.09.2008Renewal fee patent year 04
25.09.2009Renewal fee patent year 05
27.09.2010Renewal fee patent year 06
27.09.2011Renewal fee patent year 07
27.09.2012Renewal fee patent year 08
20.09.2013Renewal fee patent year 09
27.09.2014Renewal fee patent year 10
28.09.2015Renewal fee patent year 11
29.09.2016Renewal fee patent year 12
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU13.09.2005
AT15.03.2017
CY15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
MC15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
TR15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
GB13.09.2017
IE13.09.2017
LU13.09.2017
BE30.09.2017
CH30.09.2017
LI30.09.2017
FR02.10.2017
[2020/15]
Former [2019/46]HU13.09.2005
AT15.03.2017
CY15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
MC15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
GB13.09.2017
IE13.09.2017
LU13.09.2017
BE30.09.2017
CH30.09.2017
LI30.09.2017
FR02.10.2017
Former [2019/31]HU13.09.2005
AT15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
MC15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
GB13.09.2017
IE13.09.2017
LU13.09.2017
BE30.09.2017
CH30.09.2017
LI30.09.2017
FR02.10.2017
Former [2018/37]AT15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
MC15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
GB13.09.2017
IE13.09.2017
LU13.09.2017
BE30.09.2017
CH30.09.2017
LI30.09.2017
FR02.10.2017
Former [2018/35]AT15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
MC15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
GB13.09.2017
IE13.09.2017
LU13.09.2017
CH30.09.2017
LI30.09.2017
Former [2018/34]AT15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
MC15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
IE13.09.2017
LU13.09.2017
CH30.09.2017
LI30.09.2017
Former [2018/30]AT15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
MC15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
LU13.09.2017
Former [2018/14]AT15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SI15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
Former [2018/09]AT15.03.2017
CZ15.03.2017
DK15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
Former [2017/51]AT15.03.2017
CZ15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
PT17.07.2017
Former [2017/50]AT15.03.2017
CZ15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
NL15.03.2017
PL15.03.2017
RO15.03.2017
SE15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
Former [2017/49]AT15.03.2017
CZ15.03.2017
EE15.03.2017
ES15.03.2017
FI15.03.2017
IT15.03.2017
LT15.03.2017
LV15.03.2017
NL15.03.2017
RO15.03.2017
SE15.03.2017
SK15.03.2017
BG15.06.2017
GR16.06.2017
IS15.07.2017
Former [2017/48]CZ15.03.2017
FI15.03.2017
LT15.03.2017
LV15.03.2017
NL15.03.2017
SE15.03.2017
BG15.06.2017
GR16.06.2017
Former [2017/41]FI15.03.2017
LT15.03.2017
LV15.03.2017
NL15.03.2017
SE15.03.2017
BG15.06.2017
GR16.06.2017
Cited inInternational search[XA]EP0594362  (IBM [US]) [X] 1,4,5,11,12,17,18,23,24,29 * figures 1-3 * * column 4, line 10 - column 6, line 45 * [A] 2,3,6-10,13-16,19-22,25-28,30-54;
 [XA]  - KINDT J H ET AL, "Rigid design of fast scanning probe microscopes using finite element analysis", ULTRAMICROSCOPY ELSEVIER NETHERLANDS, (200408), vol. 100, no. 3-4, ISSN 0304-3991, pages 259 - 265, XP002365323 [X] 1-14,17-21,23-26,29 * figures 2-4 * * paragraphs [0002] - [0004] * [A] 15,16,22,27,28,30-54

DOI:   http://dx.doi.org/10.1016/j.ultramic.2003.11.009
 [DXA]  - ANDO TOSHIO ET AL, "A high-speed atomic force microscope for studying biological macromolecules", PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, (20011023), vol. 98, no. 22, ISSN 0027-8424, pages 12468 - 12472, XP002365324 [DX] 1,4,5,31,32,34-37,41-44,46-49,53,54 * figure 2 * * paragraph [SCANNER] * [A] 2,3,6-30,33,38-40,45,50-52

DOI:   http://dx.doi.org/10.1073/pnas.211400898
 [A]  - SUEHIRA N ET AL, "Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism", REVIEW OF SCIENTIFIC INSTRUMENTS, AMERICAN INSTITUTE OF PHYSICS, US, (200107), vol. 72, no. 7, ISSN 0034-6748, pages 2971 - 2976, XP012039237 [A] 31-54 * figure 3 *

DOI:   http://dx.doi.org/10.1063/1.1368854
ExaminationUS2002017615
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