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Extract from the Register of European Patents

EP About this file: EP1855322

EP1855322 - CRYSTALLINE SILICON WAFER, CRYSTALLINE SILICON SOLAR CELL, METHOD FOR MANUFACTURING CRYSTALLINE SILICON WAFER AND METHOD FOR MANUFACTURING CRYSTALLINE SILICON SOLAR CELL [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  07.06.2013
Database last updated on 30.09.2024
Most recent event   Tooltip07.06.2013Withdrawal of applicationpublished on 10.07.2013  [2013/28]
Applicant(s)For all designated states
Sharp Kabushiki Kaisha
22-22, Nagaike-cho
Abeno-ku
Osaka-shi, Osaka 545-8522 / JP
[N/P]
Former [2007/46]For all designated states
Sharp Kabushiki Kaisha
22-22, Nagaike-cho Abeno-ku
Osaka-shi, Osaka 545-8522 / JP
Inventor(s)01 / OTAKE, Yasutoshi
53-6-101, Oeboshi, Toyama-shi
Toyama 930-0922 / JP
02 / HAGINO, Masato
512-14, Otsuka, Koryo-cho
Kitakatsuragi-gun, Nara 635-0834 / JP
 [2007/46]
Representative(s)Müller Hoffmann & Partner
Patentanwälte mbB
St.-Martin-Straße 58
81541 München / DE
[N/P]
Former [2011/02]Müller - Hoffmann & Partner
Patentanwälte Innere Wiener Strasse 17
81667 München / DE
Former [2007/46]Müller, Frithjof E.
Müller Hoffmann & Partner Patentanwälte Innere Wiener Strasse 17
81667 München / DE
Application number, filing date05819571.026.12.2005
[2007/46]
WO2005JP23793
Priority number, dateJP2005001031918.01.2005         Original published format: JP 2005010319
[2007/46]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2006077719
Date:27.07.2006
Language:EN
[2006/30]
Type: A1 Application with search report 
No.:EP1855322
Date:14.11.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 27.07.2006 takes the place of the publication of the European patent application.
[2007/46]
Search report(s)International search report - published on:JP27.07.2006
ClassificationIPC:H01L31/04
[2007/46]
CPC:
H01L31/02363 (EP,US); H01L31/035281 (EP,US); H01L31/03529 (EP,US);
Y02E10/50 (EP,US)
Designated contracting statesDE,   ES,   GB,   IT [2008/15]
Former [2007/46]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
BANot yet paid
HRNot yet paid
MKNot yet paid
YUNot yet paid
TitleGerman:KRISTALLINER SILIZIUM-WAFER, KRISTALLINE SILIZIUM-SOLARZELLE; VERFAHREN ZUR HERSTELLUNG EINES KRISTALLINEN SILIZIUM-WAFERS UND VERFAHREN ZUR HERSTELLUNG EINER KRISTALLINEN SILIZIUM-SOLARZELLE[2007/46]
English:CRYSTALLINE SILICON WAFER, CRYSTALLINE SILICON SOLAR CELL, METHOD FOR MANUFACTURING CRYSTALLINE SILICON WAFER AND METHOD FOR MANUFACTURING CRYSTALLINE SILICON SOLAR CELL[2007/46]
French:PLAQUETTE EN SILICIUM CRISTALLIN, CELLULE SOLAIRE EN SILICIUM CRISTALLIN ET PROCEDES POUR LES FABRIQUER[2007/46]
Entry into regional phase17.08.2007Translation filed 
17.08.2007National basic fee paid 
17.08.2007Search fee paid 
17.08.2007Designation fee(s) paid 
17.08.2007Examination fee paid 
Examination procedure17.08.2007Examination requested  [2007/46]
21.08.2007Loss of particular rights, legal effect: designated state(s)
20.11.2007Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, FI, FR, GR, HU, IE, IS, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
17.05.2013Application withdrawn by applicant  [2013/28]
Fees paidRenewal fee
17.08.2007Renewal fee patent year 03
31.03.2008Renewal fee patent year 04
21.12.2009Renewal fee patent year 05
28.12.2010Renewal fee patent year 06
29.12.2011Renewal fee patent year 07
19.12.2012Renewal fee patent year 08
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Cited inInternational search[X]JPH09167850  (PHOTOWATT INT [FR]);
 [X]JPH10303443  (MITSUBISHI ELECTRIC CORP);
 [X]JP2000323736  (MITSUBISHI ELECTRIC CORP);
 [Y]JP2002293528  (SHARP KK);
 [A]JPH11214722  (MITSUBISHI ELECTRIC CORP);
 [A]JP2003258285  (SHARP KK);
 [A]JP2004063744  (SHINRYO CORP);
 [AP]JP2005217193  (SHINRYO CORP);
 [XP]JP2005331060  (SHIMOMURA SEISAKUSHO KK)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.