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EP1708364
European procedure
Extract from the Register of European Patents
EP About this file: EP1708364
| EP1708364 - Photo detecting circuit and noise elimination method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 28.09.2018 Database last updated on 10.07.2024 | |
| Former | The patent has been granted Status updated on 20.10.2017 | ||
| Former | Grant of patent is intended Status updated on 18.06.2017 | Most recent event Tooltip | 28.09.2018 | No opposition filed within time limit | published on 31.10.2018 [2018/44] | Applicant(s) | For all designated states NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | [2017/47] |
| Former [2006/40] | For all designated states NEC Corporation 7-1 Shiba 5-chome Minato-ku Tokyo / JP | Inventor(s) | 01 /
Takahashi, Seigo c/o NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | 02 /
Tajima, Akio c/o NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | 03 /
Takeuchi, Takeshi c/o NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | 04 /
Tanaka, Akihiro c/o NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | 05 /
Maeda, Wakako c/o NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | [2017/47] |
| Former [2006/40] | 01 /
Takahashi, Seigo NEC Corporation 7-1, Shiba 5-chome, Minato-ku Tokyo / JP | ||
| 02 /
Tajima, Akio NEC Corporation 7-1, Shiba 5-chome, Minato-ku Tokyo / JP | |||
| 03 /
Takeuchi, Takeshi NEC Corporation 7-1, Shiba 5-chome, Minato-ku Tokyo / JP | |||
| 04 /
Tanaka, Akihiro NEC Corporation 7-1, Shiba 5-chome, Minato-ku Tokyo / JP | |||
| 05 /
Maeda, Wakako NEC Corporation 7-1, Shiba 5-chome, Minato-ku Tokyo / JP | Representative(s) | Vossius & Partner Patentanwälte Rechtsanwälte mbB Siebertstrasse 3 81675 München / DE | [2017/47] |
| Former [2008/35] | Vossius & Partner Siebertstrasse 3 81675 München / DE | ||
| Former [2006/40] | Vossius & Partner Siebertstrasse 4 81675 München / DE | Application number, filing date | 06006588.5 | 29.03.2006 | [2006/40] | Priority number, date | JP20050100811 | 31.03.2005 Original published format: JP 2005100811 | [2006/40] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1708364 | Date: | 04.10.2006 | Language: | EN | [2006/40] | Type: | B1 Patent specification | No.: | EP1708364 | Date: | 22.11.2017 | Language: | EN | [2017/47] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 01.08.2006 | Classification | IPC: | H03F1/26 | [2017/25] | CPC: |
H03F1/26 (EP,US);
H03F3/087 (EP,US);
H03F2200/198 (EP,US)
|
| Former IPC [2006/40] | H03K17/78, H03F3/08, H03K17/16, H04B10/158 | Designated contracting states | CH, DE, GB, LI [2017/47] |
| Former [2007/24] | CH, DE, GB, LI | ||
| Former [2006/40] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Photodetektorschaltung und Geräuschunterdrückungsverfahren | [2006/40] | English: | Photo detecting circuit and noise elimination method | [2006/40] | French: | Circuit photodétecteur et procédé d'élimination de bruit | [2006/40] | Examination procedure | 01.12.2006 | Amendment by applicant (claims and/or description) | 01.12.2006 | Examination requested [2007/03] | 19.03.2007 | Despatch of a communication from the examining division (Time limit: M06) | 28.09.2007 | Reply to a communication from the examining division | 28.09.2009 | Despatch of a communication from the examining division (Time limit: M04) | 23.12.2009 | Reply to a communication from the examining division | 26.11.2012 | Despatch of a communication from the examining division (Time limit: M06) | 11.04.2013 | Reply to a communication from the examining division | 06.11.2013 | Despatch of a communication from the examining division (Time limit: M06) | 16.05.2014 | Reply to a communication from the examining division | 02.03.2015 | Despatch of a communication from the examining division (Time limit: M06) | 09.09.2015 | Reply to a communication from the examining division | 19.06.2017 | Communication of intention to grant the patent | 12.10.2017 | Fee for grant paid | 12.10.2017 | Fee for publishing/printing paid | 12.10.2017 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 19.03.2007 | Opposition(s) | 23.08.2018 | No opposition filed within time limit [2018/44] | Fees paid | Renewal fee | 31.03.2008 | Renewal fee patent year 03 | 31.03.2008 | Renewal fee patent year 04 | 24.03.2010 | Renewal fee patent year 05 | 24.03.2011 | Renewal fee patent year 06 | 21.03.2012 | Renewal fee patent year 07 | 22.03.2013 | Renewal fee patent year 08 | 21.03.2014 | Renewal fee patent year 09 | 23.03.2015 | Renewal fee patent year 10 | 18.03.2016 | Renewal fee patent year 11 | 10.03.2017 | Renewal fee patent year 12 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4399564 (COWEN STEVEN J [US]) [A] 1-17 * figure 1 *; | [A]JPH01205610 | [A] - PATENT ABSTRACTS OF JAPAN, (19891115), vol. 013, no. 509, Database accession no. (E - 846), & JP01205610 A 19890818 (NEC CORP) [A] 1-17 * abstract * | Examination | US5532474 | EP0760477 | US5386827 | - ZAPPA F ET AL, "Monolithic CMOS detector module for photon counting and picosecond timing", SOLID-STATE DEVICE RESEARCH CONFERENCE, 2004. ESSDERC 2004. PROCEEDING OF THE 34TH EUROPEAN LEUVEN, BELGIUM 21-23 SEPT. 2004, PISCATAWAY, NJ, USA,IEEE, US, (20040921), doi:10.1109/ESSDER.2004.1356559, ISBN 978-0-7803-8478-1, pages 341 - 344, XP010738446 DOI: http://dx.doi.org/10.1109/ESSDER.2004.1356559 | - BETHUNE D S ET AL, "Geiger mode operation of an In0.53Ga0.47As-In0.52Al0.48As avalanche photodiode", IEEE JOURNAL OF QUANTUM ELECTRONICS, IEEE SERVICE CENTER, PISCATAWAY, NJ, USA, (20031001), vol. 39, no. 10, doi:10.1109/JQE.2003.817244, ISSN 0018-9197, pages 1281 - 1286, XP011101714 DOI: http://dx.doi.org/10.1109/JQE.2003.817244 |