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Extract from the Register of European Patents

EP About this file: EP1855104

EP1855104 - Microwave measuring device for determining at least one measured value on a product [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.12.2009
Database last updated on 19.10.2024
Most recent event   Tooltip18.03.2011Lapse of the patent in a contracting statepublished on 20.04.2011  [2011/16]
Applicant(s)For all designated states
AMS- Advanced Microwave Systems GmbH
Schnackenburgallee 15
22525 Hamburg / DE
[2009/01]
Former [2007/46]For all designated states
AMS- Advanced Microwave Systems GmbH
Wacholderweg 23
25336 Elmshorn / DE
Inventor(s)01 / Knöchel, Reinhard, Prof. Dr.-Ing.
Wacholderweg 23
25336 Elmshorn / DE
02 / Taute, Wolfgang, Dipl.-Ing.
Erich-Schwarz-Weg 30
24235 Laboe / DE
03 / Döscher, Claas, Dr.-Ing.
Mansteinstrasse 15
20253 Hamburg / DE
 [2007/46]
Representative(s)Müller Verweyen
Patentanwälte
Friedensallee 290
22763 Hamburg / DE
[N/P]
Former [2007/46]Müller Verweyen
Patentanwälte Friesenweg 1
22763 Hamburg / DE
Application number, filing date06009520.509.05.2006
[2007/46]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1855104
Date:14.11.2007
Language:DE
[2007/46]
Type: B1 Patent specification 
No.:EP1855104
Date:28.01.2009
Language:DE
[2009/05]
Search report(s)(Supplementary) European search report - dispatched on:EP03.11.2006
ClassificationIPC:G01N22/00
[2007/46]
CPC:
G01N22/00 (EP)
Designated contracting statesDE,   FR,   GB,   IT [2008/30]
Former [2007/46]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Mikrowellenmessvorrichtung zur Bestimmung mindestes einer Messgrösse an einem Produkt[2007/46]
English:Microwave measuring device for determining at least one measured value on a product[2007/46]
French:Procédé de mesure à micro ondes destiné à la détermination d'une grandeur de mesure sur un produit[2007/46]
Examination procedure29.04.2008Amendment by applicant (claims and/or description)
07.05.2008Examination requested  [2008/25]
16.05.2008Loss of particular rights, legal effect: designated state(s)
18.06.2008Despatch of a communication from the examining division (Time limit: M04)
20.06.2008Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
04.07.2008Reply to a communication from the examining division
15.07.2008Despatch of a communication from the examining division (Time limit: M04)
18.07.2008Reply to a communication from the examining division
03.09.2008Communication of intention to grant the patent
30.10.2008Fee for grant paid
30.10.2008Fee for publishing/printing paid
27.11.2008Despatch of a communication from the examining division (Time limit: M04)
12.12.2008Reply to a communication from the examining division
Opposition(s)29.10.2009No opposition filed within time limit [2010/01]
Fees paidRenewal fee
07.05.2008Renewal fee patent year 03
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT28.01.2009
[2011/16]
Documents cited:Search[A]US3460031  (EVANS HOWARD J, et al) [A] 1-3 * figures 5-10 *;
 [XY]JPS63210757  (NIPPON GLASS FIBER CO LTD) [X] 1-3,5-13 * page 4, column L, paragraph 1; figure 1 * [Y] 4;
 [Y]US5194815  (MAENO YORIHIKO [JP]) [Y] 4 * figures 1B,3B *;
 [A]DE19854550  (HAUNI MASCHINENBAU AG [DE]) [A] 1-13* abstract *;
 [A]DE202004007013U  (TEWS ELEKTRONIK DIPL ING MANFR [DE]) [A] 1-13 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.