EP1855104 - Microwave measuring device for determining at least one measured value on a product [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 04.12.2009 Database last updated on 19.10.2024 | Most recent event Tooltip | 18.03.2011 | Lapse of the patent in a contracting state | published on 20.04.2011 [2011/16] | Applicant(s) | For all designated states AMS- Advanced Microwave Systems GmbH Schnackenburgallee 15 22525 Hamburg / DE | [2009/01] |
Former [2007/46] | For all designated states AMS- Advanced Microwave Systems GmbH Wacholderweg 23 25336 Elmshorn / DE | Inventor(s) | 01 /
Knöchel, Reinhard, Prof. Dr.-Ing. Wacholderweg 23 25336 Elmshorn / DE | 02 /
Taute, Wolfgang, Dipl.-Ing. Erich-Schwarz-Weg 30 24235 Laboe / DE | 03 /
Döscher, Claas, Dr.-Ing. Mansteinstrasse 15 20253 Hamburg / DE | [2007/46] | Representative(s) | Müller Verweyen Patentanwälte Friedensallee 290 22763 Hamburg / DE | [N/P] |
Former [2007/46] | Müller Verweyen Patentanwälte Friesenweg 1 22763 Hamburg / DE | Application number, filing date | 06009520.5 | 09.05.2006 | [2007/46] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP1855104 | Date: | 14.11.2007 | Language: | DE | [2007/46] | Type: | B1 Patent specification | No.: | EP1855104 | Date: | 28.01.2009 | Language: | DE | [2009/05] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 03.11.2006 | Classification | IPC: | G01N22/00 | [2007/46] | CPC: |
G01N22/00 (EP)
| Designated contracting states | DE, FR, GB, IT [2008/30] |
Former [2007/46] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Mikrowellenmessvorrichtung zur Bestimmung mindestes einer Messgrösse an einem Produkt | [2007/46] | English: | Microwave measuring device for determining at least one measured value on a product | [2007/46] | French: | Procédé de mesure à micro ondes destiné à la détermination d'une grandeur de mesure sur un produit | [2007/46] | Examination procedure | 29.04.2008 | Amendment by applicant (claims and/or description) | 07.05.2008 | Examination requested [2008/25] | 16.05.2008 | Loss of particular rights, legal effect: designated state(s) | 18.06.2008 | Despatch of a communication from the examining division (Time limit: M04) | 20.06.2008 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | 04.07.2008 | Reply to a communication from the examining division | 15.07.2008 | Despatch of a communication from the examining division (Time limit: M04) | 18.07.2008 | Reply to a communication from the examining division | 03.09.2008 | Communication of intention to grant the patent | 30.10.2008 | Fee for grant paid | 30.10.2008 | Fee for publishing/printing paid | 27.11.2008 | Despatch of a communication from the examining division (Time limit: M04) | 12.12.2008 | Reply to a communication from the examining division | Opposition(s) | 29.10.2009 | No opposition filed within time limit [2010/01] | Fees paid | Renewal fee | 07.05.2008 | Renewal fee patent year 03 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IT | 28.01.2009 | [2011/16] | Documents cited: | Search | [A]US3460031 (EVANS HOWARD J, et al) [A] 1-3 * figures 5-10 *; | [XY]JPS63210757 (NIPPON GLASS FIBER CO LTD) [X] 1-3,5-13 * page 4, column L, paragraph 1; figure 1 * [Y] 4; | [Y]US5194815 (MAENO YORIHIKO [JP]) [Y] 4 * figures 1B,3B *; | [A]DE19854550 (HAUNI MASCHINENBAU AG [DE]) [A] 1-13* abstract *; | [A]DE202004007013U (TEWS ELEKTRONIK DIPL ING MANFR [DE]) [A] 1-13 * abstract * |