blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1732215

EP1732215 - Semiconductor device, manufacturing method for semiconductor device, electronic component, circuit substrate, and electronic apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.02.2013
Database last updated on 28.06.2024
Most recent event   Tooltip01.02.2013No opposition filed within time limitpublished on 06.03.2013  [2013/10]
Applicant(s)For all designated states
Seiko Epson Corporation
4-1, Nishishinjuku 2-chome, Shinjuku-ku
Tokyo 163-0811 / JP
[2012/13]
Former [2006/50]For all designated states
SEIKO EPSON CORPORATION
4-1, Nishishinjuku 2-chome, Shinjuku-ku
Tokyo 160-0811 / JP
Inventor(s)01 / Ito, Haruki
c/o Seiko Epson Corporation
3-5, Owa 3-chome
Suwa-shi, Nagano-ken / JP
02 / Hashimoto, Nobuaki
c/o Seiko Epson Corporation
3-5, Owa 3-chome
Suwa-shi, Nagano-ken / JP
 [2012/13]
Former [2006/50]01 / Ito, Haruki
c/o Seiko Epson Corporation, 3-5, Owa 3-chome
Suwa-shi, Nagano-ken / JP
02 / Hashimoto, Nobuaki
c/o Seiko Epson Corporation, 3-5, Owa 3-chome
Suwa-shi, Nagano-ken / JP
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastrasse 30
81925 München / DE
[N/P]
Former [2012/13]HOFFMANN EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Former [2006/50]HOFFMANN EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date06011084.830.05.2006
[2006/50]
Priority number, dateJP2005016837308.06.2005         Original published format: JP 2005168373
[2006/50]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1732215
Date:13.12.2006
Language:EN
[2006/50]
Type: A3 Search report 
No.:EP1732215
Date:14.02.2007
[2007/07]
Type: B1 Patent specification 
No.:EP1732215
Date:28.03.2012
Language:EN
[2012/13]
Search report(s)(Supplementary) European search report - dispatched on:EP16.01.2007
ClassificationIPC:H03H9/05, H03H9/10, H03H3/08, H01L23/48, H01L23/482
[2011/44]
CPC:
H01L23/481 (EP,US); H01L23/02 (KR); H01L23/4824 (EP,US);
H01L23/50 (US); H01L23/522 (US); H01L24/05 (EP);
H03H9/0547 (EP,US); H03H9/0552 (EP,US); H03H9/1071 (EP,US);
H01L2224/02379 (EP); H01L2224/05001 (EP,US); H01L2224/05009 (EP,US);
H01L2224/05022 (EP,US); H01L2224/05025 (EP,US); H01L2224/05027 (EP,US);
H01L2224/05124 (EP,US); H01L2224/05144 (EP,US); H01L2224/05147 (EP,US);
H01L2224/05155 (EP,US); H01L2224/05164 (EP,US); H01L2224/05166 (EP,US);
H01L2224/05171 (EP,US); H01L2224/05184 (EP,US); H01L2224/05186 (EP,US);
H01L2224/05548 (EP,US); H01L2224/05624 (EP,US); H01L2224/05644 (EP,US);
H01L2224/05647 (EP,US); H01L2224/05655 (EP,US); H01L2224/05664 (EP,US);
H01L2224/05666 (EP,US); H01L2224/05671 (EP,US); H01L2224/05684 (EP,US);
H01L2224/05686 (EP,US); H01L2224/06131 (EP); H01L2224/16 (EP,US);
H01L24/12 (US); H01L24/13 (EP); H01L2924/01019 (EP,US);
H01L2924/01046 (EP,US); H01L2924/01078 (EP,US); H01L2924/01079 (EP,US);
H01L2924/04941 (EP,US); H01L2924/12042 (EP,US); H01L2924/14 (EP,US) (-)
C-Set:
H01L2224/05124, H01L2924/013 (EP,US);
H01L2224/05124, H01L2924/013, H01L2924/00014 (US,EP);
H01L2224/05144, H01L2924/00014 (EP,US);
H01L2224/05147, H01L2924/013 (EP,US);
H01L2224/05147, H01L2924/013, H01L2924/00014 (EP,US);
H01L2224/05155, H01L2924/00014 (US,EP);
H01L2224/05155, H01L2924/01023 (US,EP);
H01L2224/05164, H01L2924/00014 (EP,US);
H01L2224/05166, H01L2924/01074 (US,EP);
H01L2224/05166, H01L2924/013 (EP,US);
H01L2224/05166, H01L2924/013, H01L2924/00014 (US,EP);
H01L2224/05171, H01L2924/00014 (US,EP);
H01L2224/05184, H01L2924/00014 (US,EP);
H01L2224/05186, H01L2924/04941 (US,EP);
H01L2224/05624, H01L2924/00014 (US,EP);
H01L2224/05644, H01L2924/00014 (US,EP);
H01L2224/05647, H01L2924/00014 (US,EP);
H01L2224/05655, H01L2924/00014 (US,EP);
H01L2224/05655, H01L2924/01023 (US,EP);
H01L2224/05664, H01L2924/00014 (US,EP);
H01L2224/05666, H01L2924/00014 (US,EP);
H01L2224/05666, H01L2924/01074 (US,EP);
H01L2224/05671, H01L2924/00014 (US,EP);
H01L2224/05684, H01L2924/00014 (US,EP);
H01L2224/05686, H01L2924/04941 (US,EP);
H01L2924/12042, H01L2924/00 (US,EP)
(-)
Former IPC [2006/50]H03H3/08, H03H9/10
Designated contracting statesDE,   FR,   GB [2007/42]
Former [2006/50]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Halbleiterbauelement, Herstellungsverfahren für ein Halbleiterbauelement, elektronisches Bauelement, Schaltungssubstrat, und elektronische Vorrichtung[2006/50]
English:Semiconductor device, manufacturing method for semiconductor device, electronic component, circuit substrate, and electronic apparatus[2006/50]
French:Composant semiconducteur, méthode de fabrication d'un composant semiconducteur, composant électronique, substrat pour circuits, appareil électronique[2006/50]
Examination procedure16.04.2007Examination requested  [2007/22]
21.05.2007Despatch of a communication from the examining division (Time limit: M04)
01.10.2007Reply to a communication from the examining division
28.10.2011Communication of intention to grant the patent
09.02.2012Fee for grant paid
09.02.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  21.05.2007
Opposition(s)03.01.2013No opposition filed within time limit [2013/10]
Fees paidRenewal fee
26.03.2008Renewal fee patent year 03
26.05.2009Renewal fee patent year 04
24.03.2010Renewal fee patent year 05
24.05.2011Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]EP1143614  (TOSHIBA KK [JP]) [A] 1-15 * figures 1-15 ** paragraphs [0019] - [0021] *;
 [PX]EP1635457  (SEIKO EPSON CORP [JP]) [PX] 1-15 * abstract *;
 [PX]CN1750394  (SEIKO EPSON CORP [JP]) [PX] 1-15 * figure 1 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.