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EP1772765
European procedure
Extract from the Register of European Patents
EP About this file: EP1772765
| EP1772765 - Examination apparatus [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 20.11.2009 Database last updated on 26.07.2024 | Most recent event Tooltip | 20.11.2009 | No opposition filed within time limit | published on 23.12.2009 [2009/52] | Applicant(s) | For all designated states Olympus Corporation 43-2, Hatagaya 2-chome, Shibuya-ku Tokyo 151-0072 / JP | [2007/15] | Inventor(s) | 01 /
Kawanabe, Hideyuki 1-19-1-212, Minamidaira Hino-shi Tokyo 191-0041 / JP | 02 /
Nakajima, Chika 3-44-29, Kikunodai Chofu-shi Tokyo 182-0007 / JP | [2007/15] | Representative(s) | von Hellfeld, Axel Wuesthoff & Wuesthoff Patentanwälte PartG mbB Schweigerstrasse 2 81541 München / DE | [N/P] |
| Former [2007/15] | von Hellfeld, Axel Wuesthoff & Wuesthoff Patent- und Rechtsanwälte Schweigerstrasse 2 81541 München / DE | Application number, filing date | 06020769.3 | 02.10.2006 | [2007/15] | Priority number, date | JP20050294057 | 06.10.2005 Original published format: JP 2005294057 | [2007/15] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1772765 | Date: | 11.04.2007 | Language: | EN | [2007/15] | Type: | B1 Patent specification | No.: | EP1772765 | Date: | 14.01.2009 | Language: | EN | [2009/03] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 29.01.2007 | Classification | IPC: | G02B21/24, G01N23/225 | [2007/15] | CPC: |
G02B21/362 (EP,US);
G02B21/24 (EP,US);
G02B21/26 (EP,US);
G02B21/16 (EP,US)
| Designated contracting states | DE, FR, GB [2007/51] |
| Former [2007/15] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Prüfvorrichtung | [2007/15] | English: | Examination apparatus | [2007/15] | French: | Appareil d'examen | [2007/15] | Examination procedure | 16.05.2007 | Examination requested [2007/26] | 12.06.2007 | Despatch of a communication from the examining division (Time limit: M04) | 25.09.2007 | Reply to a communication from the examining division | 12.10.2007 | Loss of particular rights, legal effect: designated state(s) | 13.12.2007 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | 12.08.2008 | Communication of intention to grant the patent | 28.11.2008 | Fee for grant paid | 28.11.2008 | Fee for publishing/printing paid | Opposition(s) | 15.10.2009 | No opposition filed within time limit [2009/52] | Fees paid | Renewal fee | 19.05.2008 | Renewal fee patent year 03 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US5578821 (MEISBERGER DAN [US], et al) [A] 1-6 * abstract * * column 7, line 30 - column 9, paragraph 1 * * column 20, line 5 - line 26 * * figure 8 *; | [A]WO0104611 (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [A] 1-6 * abstract * * page 9, paragraph 2 * * figure 1 *; | [A]EP1139385 (HITACHI LTD [JP]) [A] 1-6 * abstract * * paragraphs [0030] - [0035] * * figures 1,3 *; | [A]EP1304717 (EBARA CORP [JP]) [A] 1-6 * abstract * * paragraphs [0130] - [0190] ** figures 5-11 *; | [DA]JP2004021006 (NIKON CORP) [DA] 1-6 * the whole document * | Examination | US2004127781 | JP2004245979 | EP1677136 | EP1710610 |