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Extract from the Register of European Patents

EP About this file: EP1777822

EP1777822 - Semiconductor device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  07.02.2020
Database last updated on 11.09.2024
FormerThe patent has been granted
Status updated on  22.02.2019
FormerGrant of patent is intended
Status updated on  25.11.2018
FormerExamination is in progress
Status updated on  09.11.2018
FormerGrant of patent is intended
Status updated on  24.07.2018
Most recent event   Tooltip30.10.2020Lapse of the patent in a contracting state
New state(s): FR, GB
published on 02.12.2020  [2020/49]
Applicant(s)For all designated states
Semiconductor Energy Laboratory Co., Ltd.
398, Hase
Atsugi-shi, Kanagawa-ken 243-0036 / JP
[2019/13]
Former [2007/17]For all designated states
SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
398, Hase
Atsugi-shi, Kanagawa-ken 243-0036 / JP
Inventor(s)01 / Fukumoto, Ryota
Semiconductor Energy Laboratory Co., Ltd.
398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
02 / Osame, Mitsuaki
Semiconductor Energy Laboratory Co., Ltd.
398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
03 / Miyake, Hiroyuki
Semiconductor Energy Laboratory Co., Ltd.
398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
04 / Tanada, Yoshifumi
Semiconductor Energy Laboratory Co., Ltd.
398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
05 / Amano, Seiko
Semiconductor Energy Laboratory Co., Ltd.
398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
 [2019/13]
Former [2007/17]01 / Fukumoto, Ryota
Semiconductor Energy Laboratory Co., Ltd. 398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
02 / Osame, Mitsuaki
Semiconductor Energy Laboratory Co., Ltd. 398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
03 / Miyake, Hiroyuki
Semiconductor Energy Laboratory Co., Ltd. 398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
04 / Tanada, Yoshifumi
Semiconductor Energy Laboratory Co., Ltd. 398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
05 / Amano, Seiko
Semiconductor Energy Laboratory Co., Ltd. 398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / US
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstraße 4
80802 München / DE
[2019/13]
Former [2007/17]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date06021360.011.10.2006
[2007/17]
Priority number, dateJP2005030785621.10.2005         Original published format: JP 2005307856
[2007/17]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1777822
Date:25.04.2007
Language:EN
[2007/17]
Type: A3 Search report 
No.:EP1777822
Date:04.02.2009
[2009/06]
Type: B1 Patent specification 
No.:EP1777822
Date:27.03.2019
Language:EN
[2019/13]
Search report(s)(Supplementary) European search report - dispatched on:EP08.01.2009
ClassificationIPC:H01L23/528, H01L23/50, H03K19/003
[2009/06]
CPC:
G09G3/20 (EP,KR,US); G02F1/1345 (EP,KR,US); G09G3/3225 (EP,KR,US);
H01L27/12 (EP,KR,US); G09G2300/0426 (EP,KR,US); G09G2310/0275 (EP,KR,US);
G09G2330/02 (EP,KR,US) (-)
Former IPC [2007/17]H03K19/003
Designated contracting statesDE,   FI,   FR,   GB,   NL [2019/13]
Former [2009/41]DE,  FI,  FR,  GB,  NL 
Former [2007/17]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Halbleitervorricthung[2007/17]
English:Semiconductor device[2007/17]
French:Dispositif semiconducteur[2007/17]
Examination procedure10.07.2009Examination requested  [2009/35]
05.08.2009Loss of particular rights, legal effect: designated state(s)
07.08.2009Despatch of a communication from the examining division (Time limit: M04)
15.09.2009Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, GR, HU, IE, IS, IT, LT, LU, LV, MC, PL, PT, RO, SE, SI, SK, TR
16.12.2009Reply to a communication from the examining division
31.03.2016Despatch of a communication from the examining division (Time limit: M04)
10.08.2016Reply to a communication from the examining division
22.06.2018Cancellation of oral proceeding that was planned for 27.06.2018
27.06.2018Date of oral proceedings (cancelled)
25.07.2018Communication of intention to grant the patent
29.10.2018Disapproval of the communication of intention to grant the patent by the applicant or resumption of examination proceedings by the EPO
26.11.2018Communication of intention to grant the patent
14.02.2019Fee for grant paid
14.02.2019Fee for publishing/printing paid
14.02.2019Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  07.08.2009
Opposition(s)03.01.2020No opposition filed within time limit [2020/11]
Fees paidRenewal fee
30.10.2008Renewal fee patent year 03
13.10.2009Renewal fee patent year 04
12.10.2010Renewal fee patent year 05
11.10.2011Renewal fee patent year 06
11.10.2012Renewal fee patent year 07
14.10.2013Renewal fee patent year 08
14.10.2014Renewal fee patent year 09
12.10.2015Renewal fee patent year 10
11.10.2016Renewal fee patent year 11
11.10.2017Renewal fee patent year 12
11.10.2018Renewal fee patent year 13
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Lapses during opposition  TooltipFI27.03.2019
NL27.03.2019
GB11.10.2019
FR31.10.2019
[2020/48]
Former [2019/40]FI27.03.2019
NL27.03.2019
Former [2019/33]FI27.03.2019
Documents cited:Search[XY]JPH01243578  (HITACHI LTD, et al) [X] 1,10,19,20,29,38 * abstract * [Y] 11-18,30-37;
 [XY]US5670802  (KOIKE TSUNEO [JP]) [X] 1-9,20-28 * column 6, line 43 - column 8, line 24; figures 1A,2 * [Y] 11-18,30-37;
 [A]US5923089  (YAO CHINGCHI [US], et al) [A] 1-38* column 8, line 66 - column 10, line 39; figures 11,12 *;
 [A]US6021081  (HIGASHIDE YOSHIKO [JP], et al) [A] 1-38 * column 5, line 31 - column 6, line 67; figures 3-6 *
by applicantUS5670802
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.