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Extract from the Register of European Patents

EP About this file: EP1837672

EP1837672 - Fault detection method and apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.11.2013
Database last updated on 22.08.2024
Most recent event   Tooltip17.07.2015Lapse of the patent in a contracting state
New state(s): HU, LU		published on 19.08.2015  [2015/34]
Applicant(s)For all designated states
Rockwell Automation Limited
Pitfield, Kiln Farm Milton Keynes
Buckinghamshire MK11 3DR / GB
[2012/44]
Former [2007/39]For all designated states
ICS Triplex Technology Limited
Hall Road
Malson, Essex CM9 4LA / GB
Inventor(s)01 / Meagher, Thomas, Bruce
/ 18806 Deer Key Circle
Houston, TX 77084 / US
 [2012/34]
Former [2007/39]01 / Meagher, Thomas, Bruce
18806 Deer Key Circle
Houston, TX TX 77084 / US
Representative(s)Roberts, Peter David, et al
Marks & Clerk LLP
1 New York Street
Manchester M1 4HD / GB
[N/P]
Former [2012/34]Roberts, Peter David, et al
Marks & Clerk LLP
1 New York Street
Manchester, M1 4HD / GB
Former [2007/39]Simons, Alison, et al
Dummett Copp 25 The Square Martlesham Heath Ipswich
Suffolk, IP5 3SL / GB
Application number, filing date06114802.931.05.2006
[2007/39]
Priority number, dateUS20060785537P24.03.2006         Original published format: US 785537 P
[2007/39]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1837672
Date:26.09.2007
Language:EN
[2007/39]
Type: B1 Patent specification 
No.:EP1837672
Date:16.01.2013
Language:EN
[2013/03]
Search report(s)(Supplementary) European search report - dispatched on:EP13.09.2006
ClassificationIPC:G01R31/36
[2007/39]
CPC:
G01R31/319 (EP)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2007/39]
TitleGerman:Verfahren und Vorrichtung zur Fehlerdetektion[2007/39]
English:Fault detection method and apparatus[2007/39]
French:Procédé et appareil de détection de défauts[2007/39]
Examination procedure21.02.2008Examination requested  [2008/14]
26.03.2008Despatch of a communication from the examining division (Time limit: M06)
08.01.2009Reply to a communication from the examining division
05.05.2010Despatch of a communication from the examining division (Time limit: M06)
15.11.2010Reply to a communication from the examining division
14.01.2011Despatch of a communication from the examining division (Time limit: M06)
30.08.2011Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
09.11.2011Reply to a communication from the examining division
25.11.2011Despatch of a communication from the examining division (Time limit: M06)
31.05.2012Reply to a communication from the examining division
21.08.2012Communication of intention to grant the patent
29.11.2012Fee for grant paid
29.11.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  26.03.2008
Opposition(s)17.10.2013No opposition filed within time limit [2013/52]
Request for further processing for:The application is deemed to be withdrawn due to failure to reply to the examination report
09.11.2011Request for further processing filed
09.11.2011Full payment received (date of receipt of payment)
Request granted
22.11.2011Decision despatched
The application is deemed to be withdrawn due to failure to reply to the examination report
08.01.2009Request for further processing filed
08.01.2009Full payment received (date of receipt of payment)
Request granted
30.01.2009Decision despatched
Fees paidRenewal fee
27.05.2008Renewal fee patent year 03
12.05.2009Renewal fee patent year 04
25.05.2010Renewal fee patent year 05
25.05.2011Renewal fee patent year 06
25.05.2012Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU31.05.2006
AT16.01.2013
BE16.01.2013
CY16.01.2013
CZ16.01.2013
DK16.01.2013
EE16.01.2013
FI16.01.2013
IT16.01.2013
LT16.01.2013
LV16.01.2013
MC16.01.2013
NL16.01.2013
PL16.01.2013
RO16.01.2013
SE16.01.2013
SI16.01.2013
SK16.01.2013
TR16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
CH31.05.2013
IE31.05.2013
LI31.05.2013
LU31.05.2013
[2015/34]
Former [2015/32]AT16.01.2013
BE16.01.2013
CY16.01.2013
CZ16.01.2013
DK16.01.2013
EE16.01.2013
FI16.01.2013
IT16.01.2013
LT16.01.2013
LV16.01.2013
MC16.01.2013
NL16.01.2013
PL16.01.2013
RO16.01.2013
SE16.01.2013
SI16.01.2013
SK16.01.2013
TR16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
CH31.05.2013
IE31.05.2013
LI31.05.2013
Former [2014/20]AT16.01.2013
BE16.01.2013
CY16.01.2013
CZ16.01.2013
DK16.01.2013
EE16.01.2013
FI16.01.2013
IT16.01.2013
LT16.01.2013
LV16.01.2013
MC16.01.2013
NL16.01.2013
PL16.01.2013
RO16.01.2013
SE16.01.2013
SI16.01.2013
SK16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
CH31.05.2013
IE31.05.2013
LI31.05.2013
Former [2014/08]AT16.01.2013
BE16.01.2013
CY16.01.2013
CZ16.01.2013
DK16.01.2013
EE16.01.2013
FI16.01.2013
IT16.01.2013
LT16.01.2013
LV16.01.2013
MC16.01.2013
NL16.01.2013
PL16.01.2013
RO16.01.2013
SE16.01.2013
SI16.01.2013
SK16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
CH31.05.2013
LI31.05.2013
Former [2014/03]AT16.01.2013
BE16.01.2013
CY16.01.2013
CZ16.01.2013
DK16.01.2013
EE16.01.2013
FI16.01.2013
IT16.01.2013
LT16.01.2013
LV16.01.2013
MC16.01.2013
NL16.01.2013
PL16.01.2013
RO16.01.2013
SE16.01.2013
SI16.01.2013
SK16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
Former [2013/49]AT16.01.2013
BE16.01.2013
CY16.01.2013
CZ16.01.2013
DK16.01.2013
EE16.01.2013
FI16.01.2013
LT16.01.2013
LV16.01.2013
NL16.01.2013
PL16.01.2013
RO16.01.2013
SE16.01.2013
SI16.01.2013
SK16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
Former [2013/48]AT16.01.2013
BE16.01.2013
CY16.01.2013
DK16.01.2013
EE16.01.2013
FI16.01.2013
LT16.01.2013
LV16.01.2013
NL16.01.2013
PL16.01.2013
SE16.01.2013
SI16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
Former [2013/40]AT16.01.2013
BE16.01.2013
CY16.01.2013
FI16.01.2013
LT16.01.2013
LV16.01.2013
NL16.01.2013
PL16.01.2013
SE16.01.2013
SI16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
PT16.05.2013
Former [2013/38]AT16.01.2013
BE16.01.2013
CY16.01.2013
FI16.01.2013
LT16.01.2013
LV16.01.2013
NL16.01.2013
PL16.01.2013
SE16.01.2013
SI16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
Former [2013/37]AT16.01.2013
BE16.01.2013
CY16.01.2013
FI16.01.2013
LT16.01.2013
NL16.01.2013
PL16.01.2013
SE16.01.2013
SI16.01.2013
BG16.04.2013
GR17.04.2013
ES27.04.2013
IS16.05.2013
Former [2013/36]AT16.01.2013
BE16.01.2013
CY16.01.2013
LT16.01.2013
PL16.01.2013
SE16.01.2013
BG16.04.2013
ES27.04.2013
IS16.05.2013
Former [2013/35]BE16.01.2013
CY16.01.2013
LT16.01.2013
SE16.01.2013
BG16.04.2013
IS16.05.2013
Former [2013/34]LT16.01.2013
SE16.01.2013
BG16.04.2013
IS16.05.2013
Former [2013/33]LT16.01.2013
Documents cited:Search[Y]JPS5596708  ;
 [Y]JPS60236073  ;
 [A]JPH0823244  ;
 [A]US4535378  (ENDO TAMOTU [JP]) [A] 1-6* figures 1,6,7,9 *;
 [XY]US5909660  (FOOTE GARRITT W [US]) [X] 1,2 * column 2, line 58 - line 64; figures 2,4 * [Y] 3-6;
 [A]EP1322139  (TOYODA GOSEI KK [JP]) [A] 1-6 * figure 4 *;
 [A]EP1545163  (VALEO VISION [FR]) [A] 1-6 * figure 1 *;
 [Y]US2006061303  (TAKEDA HITOSHI [JP], et al) [Y] 1,5,6 * figure 1 *
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19801014), vol. 004, no. 145, Database accession no. (E - 029), & JP55096708 A 19800723 (OKI ELECTRIC IND CO LTD; others: 01) [Y] 1,3,4 * abstract *
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19860418), vol. 010, no. 102, Database accession no. (P - 448), & JP60236073 A 19851122 (SUMITOMO DENKI KOGYO KK) [Y] 1 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19960531), vol. 1996, no. 05, & JP08023244 A 19960123 (SHIBAURA ENG WORKS CO LTD) [A] 1-6 * abstract *
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