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Extract from the Register of European Patents

EP About this file: EP1894250

EP1894250 - SEMICONDUCTOR DEVICES HAVING VARYING ELECTRODE WIDTHS TO PROVIDE NON-UNIFORM GATE PITCHES AND RELATED METHODS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.05.2015
Database last updated on 19.07.2024
Most recent event   Tooltip13.10.2017Lapse of the patent in a contracting state
New state(s): BG, HU, TR		published on 15.11.2017  [2017/46]
Applicant(s)For all designated states
Cree, Inc.
4600 Silicon Drive
Durham, NC 27703 / US
[N/P]
Former [2014/26]For all designated states
Cree, Inc.
4600 Silicon Drive
Durham, NC 27703-8475 / US
Former [2011/37]For all designated states
Cree, Inc.
4600 Silicon Dirve
Durham, NC 27703-8475 / US
Former [2008/10]For all designated states
CREE MICROWAVE, LLC
4600 Silicon Drive
Durham, NC 27703 / US
Inventor(s)01 / SRIRAM, Saptharishi
107 Timber Hitch Road
Cary, North Carolina 27513 / US
 [2008/10]
Representative(s)Boult Wade Tennant LLP
Salisbury Square House
8 Salisbury Square
London EC4Y 8AP / GB
[N/P]
Former [2014/02]Boult Wade Tennant
Verulam Gardens
70 Gray's Inn Road
London WC1X 8BT / GB
Former [2010/45]Cross, Rupert Edward Blount
Boult Wade Tennant Verulam Gardens 70 Gray's Inn Road
London WC1X 8BT / GB
Former [2008/31]Bankes, Stephen Charles Digby, et al
Baron Warren Redfern 19 South End Kensington London
W8 5BU / GB
Former [2008/10]Bankes, Stephen Charles Digby, et al
Baron & Warren, 19 South End Kensington
London W8 5BU / GB
Application number, filing date06758302.110.04.2006
[2008/10]
WO2006US13305
Priority number, dateUS2005015735621.06.2005         Original published format: US 157356
[2008/10]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2007001589
Date:04.01.2007
Language:EN
[2007/01]
Type: A1 Application with search report 
No.:EP1894250
Date:05.03.2008
Language:EN
The application published by WIPO in one of the EPO official languages on 04.01.2007 takes the place of the publication of the European patent application.
[2008/10]
Type: B1 Patent specification 
No.:EP1894250
Date:25.06.2014
Language:EN
[2014/26]
Search report(s)International search report - published on:EP04.01.2007
ClassificationIPC:H01L29/417, H01L29/423
[2008/10]
CPC:
H01L29/41758 (EP,US); H01L29/42316 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2008/10]
TitleGerman:HALBLEITERBAUELEMENTE MIT VARIIERENDEN ELEKTRONENBREITEN ZUR BEREITSTELLUNG VON UNGLEICHFÖRMIGEN GATE-TEILUNGEN UND DIESBEZÜGLICHEN VERFAHREN[2008/10]
English:SEMICONDUCTOR DEVICES HAVING VARYING ELECTRODE WIDTHS TO PROVIDE NON-UNIFORM GATE PITCHES AND RELATED METHODS[2008/10]
French:DISPOSITIFS SEMI-CONDUCTEURS À LARGEURS D ÉLECTRODES VARIABLES PRÉSENTANT DES PAS DE GÂCHETTE NON UNIFORMES ET PROCÉDÉS ASSOCIÉS[2008/10]
Entry into regional phase02.01.2008National basic fee paid 
02.01.2008Designation fee(s) paid 
02.01.2008Examination fee paid 
Examination procedure20.04.2007Request for preliminary examination filed
International Preliminary Examining Authority: EP
02.01.2008Examination requested  [2008/10]
25.02.2008Amendment by applicant (claims and/or description)
02.11.2010Despatch of a communication from the examining division (Time limit: M06)
11.05.2011Reply to a communication from the examining division
24.07.2012Despatch of a communication from the examining division (Time limit: M04)
03.12.2012Reply to a communication from the examining division
09.01.2014Communication of intention to grant the patent
16.05.2014Fee for grant paid
16.05.2014Fee for publishing/printing paid
16.05.2014Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  02.11.2010
Opposition(s)26.03.2015No opposition filed within time limit [2015/23]
Fees paidRenewal fee
02.01.2008Renewal fee patent year 03
16.04.2009Renewal fee patent year 04
25.03.2010Renewal fee patent year 05
12.04.2011Renewal fee patent year 06
28.03.2012Renewal fee patent year 07
12.04.2013Renewal fee patent year 08
25.03.2014Renewal fee patent year 09
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU10.04.2006
AT25.06.2014
BE25.06.2014
BG25.06.2014
CY25.06.2014
CZ25.06.2014
DK25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
IT25.06.2014
LT25.06.2014
LV25.06.2014
MC25.06.2014
PL25.06.2014
RO25.06.2014
SE25.06.2014
SI25.06.2014
SK25.06.2014
TR25.06.2014
GR26.09.2014
IS25.10.2014
PT27.10.2014
[2017/39]
Former [2016/01]AT25.06.2014
BE25.06.2014
CY25.06.2014
CZ25.06.2014
DK25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
IT25.06.2014
LT25.06.2014
LV25.06.2014
MC25.06.2014
PL25.06.2014
RO25.06.2014
SE25.06.2014
SI25.06.2014
SK25.06.2014
GR26.09.2014
IS25.10.2014
PT27.10.2014
Former [2015/50]AT25.06.2014
BE25.06.2014
CY25.06.2014
CZ25.06.2014
DK25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
IT25.06.2014
LT25.06.2014
LV25.06.2014
PL25.06.2014
RO25.06.2014
SE25.06.2014
SI25.06.2014
SK25.06.2014
GR26.09.2014
IS25.10.2014
PT27.10.2014
Former [2015/30]AT25.06.2014
BE25.06.2014
CY25.06.2014
CZ25.06.2014
DK25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
IT25.06.2014
LT25.06.2014
LV25.06.2014
PL25.06.2014
RO25.06.2014
SE25.06.2014
SK25.06.2014
GR26.09.2014
IS25.10.2014
PT27.10.2014
Former [2015/22]AT25.06.2014
CY25.06.2014
CZ25.06.2014
DK25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
IT25.06.2014
LT25.06.2014
LV25.06.2014
PL25.06.2014
RO25.06.2014
SE25.06.2014
SK25.06.2014
GR26.09.2014
IS25.10.2014
PT27.10.2014
Former [2015/12]AT25.06.2014
CY25.06.2014
CZ25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
LT25.06.2014
LV25.06.2014
PL25.06.2014
RO25.06.2014
SE25.06.2014
SK25.06.2014
GR26.09.2014
IS25.10.2014
PT27.10.2014
Former [2015/11]CY25.06.2014
CZ25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
LT25.06.2014
LV25.06.2014
PL25.06.2014
RO25.06.2014
SE25.06.2014
SK25.06.2014
GR26.09.2014
PT27.10.2014
Former [2015/10]CY25.06.2014
CZ25.06.2014
EE25.06.2014
ES25.06.2014
FI25.06.2014
LT25.06.2014
LV25.06.2014
SE25.06.2014
SK25.06.2014
GR26.09.2014
Former [2014/50]CY25.06.2014
FI25.06.2014
LT25.06.2014
LV25.06.2014
SE25.06.2014
GR26.09.2014
Former [2014/49]CY25.06.2014
FI25.06.2014
LT25.06.2014
Former [2014/48]CY25.06.2014
LT25.06.2014
Former [2014/47]CY25.06.2014
Cited inInternational search[A]EP0560123  (SIEMENS AG [DE]) [A] 1-35* the whole document *;
 [X]US5850099  (LIU WILLIAM UEI-CHUNG [US]) [X] 1-35 * the whole document *;
 [DX]US6534857  (MORSE ALFRED W [US]) [DX] 1-35 * the whole document *
ExaminationJPH06310545
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.