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Extract from the Register of European Patents

EP About this file: EP1943531

EP1943531 - IC TESTING METHODS AND APPARATUS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.02.2011
Database last updated on 07.10.2024
Most recent event   Tooltip15.08.2014Lapse of the patent in a contracting state
New state(s): GR		published on 17.09.2014  [2014/38]
Applicant(s)For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
[2009/50]
Former [2008/29]For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
Inventor(s)01 / WAAYERS, Tom
c/o Philips Intellectual Property & Standards Cross Oak Lane
Redhill Surrey RH1 5HA / GB
 [2008/29]
Representative(s)Williamson, Paul Lewis, et al
NXP Semiconductors
Intellectual Property and Licensing
Red Central
60 High Street, Redhill
Surrey RH1 1NY / GB
[N/P]
Former [2009/09]Williamson, Paul Lewis, et al
NXP Semiconductors UK Ltd. Intellectual Property Department Betchworth House Station Road Redhill
Surrey RH1 1DL / GB
Former [2008/33]White, Andrew Gordon
NXP Semiconductors Intellectual Property Department Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
Former [2008/29]White, Andrew Gordon
NXP Semiconductors IP Department Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
Application number, filing date06809581.912.10.2006
[2008/29]
WO2006IB53754
Priority number, dateEP2005010989224.10.2005         Original published format: EP 05109892
[2008/29]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2007049171
Date:03.05.2007
Language:EN
[2007/18]
Type: A1 Application with search report 
No.:EP1943531
Date:16.07.2008
Language:EN
The application published by WIPO in one of the EPO official languages on 03.05.2007 takes the place of the publication of the European patent application.
[2008/29]
Type: B1 Patent specification 
No.:EP1943531
Date:31.03.2010
Language:EN
[2010/13]
Search report(s)International search report - published on:EP03.05.2007
ClassificationIPC:G01R31/3185
[2008/29]
CPC:
G01R31/318555 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2008/29]
Extension statesALNot yet paid
BANot yet paid
HRNot yet paid
MKNot yet paid
RSNot yet paid
TitleGerman:IC-TESTVERFAHREN UND VORRICHTUNG[2008/29]
English:IC TESTING METHODS AND APPARATUS[2008/29]
French:PROCEDES ET APPAREILS PERMETTANT DE TESTER DES CIRCUITS INTEGRES[2008/29]
Entry into regional phase26.05.2008National basic fee paid 
26.05.2008Designation fee(s) paid 
26.05.2008Examination fee paid 
Examination procedure26.05.2008Examination requested  [2008/29]
22.01.2009Despatch of a communication from the examining division (Time limit: M04)
08.04.2009Reply to a communication from the examining division
11.11.2009Communication of intention to grant the patent
22.02.2010Fee for grant paid
22.02.2010Fee for publishing/printing paid
Opposition(s)04.01.2011No opposition filed within time limit [2011/10]
Fees paidRenewal fee
31.10.2008Renewal fee patent year 03
02.11.2009Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
GR31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
TR31.03.2010
BG30.06.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
HU01.10.2010
IE12.10.2010
LU12.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
[2014/38]
Former [2013/42]AT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
TR31.03.2010
BG30.06.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
HU01.10.2010
IE12.10.2010
LU12.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
Former [2012/47]AT31.03.2010
BE31.03.2010
BG31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
TR31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
HU01.10.2010
IE12.10.2010
LU12.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
Former [2012/44]AT31.03.2010
BE31.03.2010
BG31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
HU01.10.2010
IE12.10.2010
LU12.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
Former [2012/42]AT31.03.2010
BE31.03.2010
BG31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
HU01.10.2010
IE12.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
Former [2012/41]AT31.03.2010
BE31.03.2010
BG31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
IE12.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
Former [2011/48]AT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
IE12.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
Former [2011/38]AT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
Former [2011/30]AT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
MC31.10.2010
Former [2011/18]AT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
IT31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
Former [2011/09]AT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
DK31.03.2010
EE31.03.2010
FI31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
PT02.08.2010
Former [2011/05]AT31.03.2010
BE31.03.2010
CY31.03.2010
CZ31.03.2010
EE31.03.2010
FI31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
RO31.03.2010
SE31.03.2010
SI31.03.2010
SK31.03.2010
ES12.07.2010
IS31.07.2010
Former [2010/45]AT31.03.2010
FI31.03.2010
LT31.03.2010
LV31.03.2010
NL31.03.2010
PL31.03.2010
SI31.03.2010
Former [2010/42]AT31.03.2010
FI31.03.2010
LT31.03.2010
LV31.03.2010
PL31.03.2010
SI31.03.2010
Cited inInternational search[XA]WO2004070395  (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [X] 1,19 * page 9, line 9 - page 10, line 34; figures 2,3 * [A] 2-18,20-24;
 [A]US2005204236  (WHETSEL LEE D [US]) [A] 1-24* paragraphs [0016] - [0019]; figures 4,5,19 *;
 [A]  - WAAYERS T ED - INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, "An improved test control architecture and test control expansion for core-based system chips", PROCEEDINGS INTERNATIONAL TEST CONFERENCE 2003. ( ITC ). CHARLOTTE, NC, SEPT. 30 - OCT. 2, 2003, INTERNATIONAL TEST CONFERENCE, NEW YORK, NY : IEEE, US, (20030930), vol. 1, ISBN 0-7803-8106-8, pages 1145 - 1154, XP010685317 [A] 1-24 * the whole document *

DOI:   http://dx.doi.org/10.1109/TEST.2003.1271103
by applicantWO2004070395
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.