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Extract from the Register of European Patents

EP About this file: EP1963923

EP1963923 - ANALYSIS DEVICE WITH AN ARRAY OF FOCUSING MICROSTRUCTURES [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.12.2018
Database last updated on 26.06.2024
FormerThe patent has been granted
Status updated on  19.01.2018
FormerGrant of patent is intended
Status updated on  06.09.2017
Most recent event   Tooltip10.07.2020Lapse of the patent in a contracting state
New state(s): IS		published on 12.08.2020  [2020/33]
Applicant(s)For all designated states
Koninklijke Philips N.V.
High Tech Campus 5
5656 AE Eindhoven / NL
[2018/08]
Former [2013/39]For all designated states
Koninklijke Philips N.V.
High Tech Campus 5
5656 AE Eindhoven / NL
Former [2008/36]For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
Inventor(s)01 / DIRKSEN, Peter
c/o Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
02 / AKSENOV, Yuri
c/o Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
03 / VAN DEN HEUVEL, Fredericus, C.
c/o Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
04 / KWINTEN, Johannes, A., J., M.
c/o Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
 [2008/36]
Representative(s)van Velzen, Maaike Mathilde
Philips Intellectual Property & Standards
High Tech Campus 5
5656 AE Eindhoven / NL
[2018/08]
Former [2008/36]Van Velzen, Maaike Mathilde
Philips Intellectual Property & Standards P.O. Box 220
5600 AE Eindhoven / NL
Application number, filing date06842551.115.12.2006
[2008/36]
WO2006IB54882
Priority number, dateEP2005011219515.12.2005         Original published format: EP 05112195
[2008/36]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2007069222
Date:21.06.2007
Language:EN
[2007/25]
Type: A2 Application without search report 
No.:EP1963923
Date:03.09.2008
Language:EN
The application published by WIPO in one of the EPO official languages on 21.06.2007 takes the place of the publication of the European patent application.
[2008/36]
Type: B1 Patent specification 
No.:EP1963923
Date:21.02.2018
Language:EN
[2018/08]
Search report(s)International search report - published on:EP29.05.2008
ClassificationIPC:G03F7/20, G01N21/01, B01L3/00, G03F9/00
[2008/36]
CPC:
G03F7/70616 (EP,US); B01L3/502707 (EP,US); G03F7/70608 (EP,US);
G03F9/7011 (EP,US); G03F9/7019 (EP,US); G03F9/7076 (EP,US);
G06F3/016 (EP,US); G11C16/16 (EP,US); B01L2200/12 (EP,US);
B01L2300/0654 (EP,US); B01L2300/0819 (EP,US) (-)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2018/08]
Former [2008/36]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
BANot yet paid
HRNot yet paid
MKNot yet paid
RSNot yet paid
TitleGerman:ANALYSEEINRICHTUNG MIT EINEM ARRAY VON FOKUSSIERUNGSMIKROSTRUKTUREN[2008/36]
English:ANALYSIS DEVICE WITH AN ARRAY OF FOCUSING MICROSTRUCTURES[2008/36]
French:DISPOSITIF D' ANALYSE AVEC UNE MATRICE DE MICROSTRUCTURES DE MISE AU POINT[2008/36]
Entry into regional phase15.07.2008National basic fee paid 
01.12.2008Designation fee(s) paid 
01.12.2008Examination fee paid 
Examination procedure01.12.2008Examination requested  [2009/03]
14.01.2011Despatch of a communication from the examining division (Time limit: M04)
29.04.2011Reply to a communication from the examining division
08.09.2015Despatch of a communication from the examining division (Time limit: M06)
15.02.2016Reply to a communication from the examining division
07.06.2016Despatch of a communication from the examining division (Time limit: M04)
04.10.2016Reply to a communication from the examining division
07.09.2017Communication of intention to grant the patent
04.01.2018Fee for grant paid
04.01.2018Fee for publishing/printing paid
04.01.2018Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  14.01.2011
Opposition(s)22.11.2018No opposition filed within time limit [2019/05]
Fees paidRenewal fee
05.01.2009Renewal fee patent year 03
04.01.2010Renewal fee patent year 04
03.01.2011Renewal fee patent year 05
02.01.2012Renewal fee patent year 06
02.01.2013Renewal fee patent year 07
02.01.2014Renewal fee patent year 08
05.01.2015Renewal fee patent year 09
04.01.2016Renewal fee patent year 10
02.01.2017Renewal fee patent year 11
02.01.2018Renewal fee patent year 12
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU15.12.2006
AT21.02.2018
CY21.02.2018
CZ21.02.2018
DK21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
MC21.02.2018
NL21.02.2018
PL21.02.2018
PT21.02.2018
RO21.02.2018
SE21.02.2018
SI21.02.2018
SK21.02.2018
TR21.02.2018
BG21.05.2018
GR22.05.2018
IS21.06.2018
[2020/33]
Former [2020/30]HU15.12.2006
AT21.02.2018
CY21.02.2018
CZ21.02.2018
DK21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
MC21.02.2018
NL21.02.2018
PL21.02.2018
PT21.02.2018
RO21.02.2018
SE21.02.2018
SI21.02.2018
SK21.02.2018
TR21.02.2018
BG21.05.2018
GR22.05.2018
Former [2020/27]AT21.02.2018
CY21.02.2018
CZ21.02.2018
DK21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
MC21.02.2018
NL21.02.2018
PL21.02.2018
PT21.02.2018
RO21.02.2018
SE21.02.2018
SI21.02.2018
SK21.02.2018
TR21.02.2018
BG21.05.2018
GR22.05.2018
Former [2020/16]AT21.02.2018
CY21.02.2018
CZ21.02.2018
DK21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
MC21.02.2018
NL21.02.2018
PL21.02.2018
RO21.02.2018
SE21.02.2018
SI21.02.2018
SK21.02.2018
TR21.02.2018
BG21.05.2018
GR22.05.2018
Former [2019/40]AT21.02.2018
CY21.02.2018
CZ21.02.2018
DK21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
MC21.02.2018
NL21.02.2018
PL21.02.2018
RO21.02.2018
SE21.02.2018
SI21.02.2018
SK21.02.2018
BG21.05.2018
GR22.05.2018
Former [2019/13]AT21.02.2018
CY21.02.2018
CZ21.02.2018
DK21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
NL21.02.2018
PL21.02.2018
RO21.02.2018
SE21.02.2018
SI21.02.2018
SK21.02.2018
BG21.05.2018
GR22.05.2018
Former [2018/51]AT21.02.2018
CY21.02.2018
CZ21.02.2018
DK21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
NL21.02.2018
PL21.02.2018
RO21.02.2018
SE21.02.2018
SK21.02.2018
BG21.05.2018
GR22.05.2018
Former [2018/50]AT21.02.2018
CY21.02.2018
CZ21.02.2018
EE21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
NL21.02.2018
PL21.02.2018
RO21.02.2018
SE21.02.2018
SK21.02.2018
BG21.05.2018
GR22.05.2018
Former [2018/47]AT21.02.2018
CY21.02.2018
ES21.02.2018
FI21.02.2018
IT21.02.2018
LT21.02.2018
LV21.02.2018
NL21.02.2018
SE21.02.2018
BG21.05.2018
GR22.05.2018
Former [2018/40]AT21.02.2018
CY21.02.2018
ES21.02.2018
FI21.02.2018
LT21.02.2018
LV21.02.2018
NL21.02.2018
SE21.02.2018
BG21.05.2018
GR22.05.2018
Former [2018/38]AT21.02.2018
CY21.02.2018
ES21.02.2018
FI21.02.2018
LT21.02.2018
NL21.02.2018
GR22.05.2018
Former [2018/37]CY21.02.2018
ES21.02.2018
FI21.02.2018
LT21.02.2018
NL21.02.2018
GR22.05.2018
Former [2018/36]CY21.02.2018
ES21.02.2018
FI21.02.2018
LT21.02.2018
NL21.02.2018
Former [2018/35]CY21.02.2018
FI21.02.2018
LT21.02.2018
NL21.02.2018
Cited inInternational search[X]DE4416826  (SCHULZE STEFFEN DIPL ING [DE], et al) [X] 1 * column 3, lines 11-20 * * figure 1 *;
 [X]EP0800075  (COMMISSARIAT ENERGIE ATOMIQUE [FR]) [X] 1-8,11 * column 5, lines 38-56 * * figure 3 *;
 [A]EP0998977  (GRIFOLS GRUPO SA [ES]) [A] 1-8,11 * column 2, lines 21-23 * * figure 4 *;
 [X]US6585939  (DAPPRICH JOHANNES [US]) [X] 1-8,11 * column 3, lines 44-55 * * column 4, lines 4-12 * * column 12, lines 22-31,47-61 * * figure 9 *;
 [X]JP2004333654  (SEIKO EPSON CORP) [X] 1-7 * abstract *;
 [X]US6953695  (LANGOWSKI JORG [DE]) [X] 1-8,11 * column 1, lines 47-51 * * column 2, lines 19-30 * * figures 1,2 *;
 [E]WO2007069221  (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [E] 1-8,11* the whole document *
ExaminationEP1263098
 US2005286597
by applicantDE4416826
 EP0800075
 EP0998977
 US6585939
 JP2004333654
 US6953695
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.