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EP1780573
European procedure
Extract from the Register of European Patents
EP About this file: EP1780573
| EP1780573 - Examination-assisting tool for microscopes [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 07.01.2011 Database last updated on 27.07.2024 | Most recent event Tooltip | 07.01.2011 | No opposition filed within time limit | published on 09.02.2011 [2011/06] | Applicant(s) | For all designated states Olympus Corporation 43-2, Hatagaya 2-chome Shibuya-ku, Tokyo / JP | [2007/18] | Inventor(s) | 01 /
Nagasawa Nobuyuki 4-7-5-4-703, Asahigaoka Hino-shi Tokyo 191-0065 / JP | 02 /
Tanikawa, Yoshihisa 1-8-9, Nihonbashiningyocho Chuo-ku Tokyo 103-0013 / JP | [2007/18] | Representative(s) | von Hellfeld, Axel Wuesthoff & Wuesthoff Patentanwälte PartG mbB Schweigerstrasse 2 81541 München / DE | [N/P] |
| Former [2007/18] | von Hellfeld, Axel Wuesthoff & Wuesthoff Patent- und Rechtsanwälte Schweigerstrasse 2 81541 München / DE | Application number, filing date | 07002638.0 | 18.01.2006 | [2007/18] | Priority number, date | JP20050014625 | 21.01.2005 Original published format: JP 2005014625 | [2007/18] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1780573 | Date: | 02.05.2007 | Language: | EN | [2007/18] | Type: | A3 Search report | No.: | EP1780573 | Date: | 16.05.2007 | [2007/20] | Type: | B1 Patent specification | No.: | EP1780573 | Date: | 03.03.2010 | Language: | EN | [2010/09] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 18.04.2007 | Classification | IPC: | G02B21/00 | [2007/18] | CPC: |
G02B21/365 (EP,US);
G02B21/0012 (EP,US);
G02B21/244 (EP,US);
G02B7/08 (EP,US)
| Designated contracting states | DE, FR, GB [2008/04] |
| Former [2007/18] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Untersuchungshilfsmittel für Mikroskope | [2007/18] | English: | Examination-assisting tool for microscopes | [2007/18] | French: | Outil d'aide à l'examen pour microscopes | [2007/18] | Examination procedure | 07.02.2007 | Examination requested [2007/18] | 14.09.2007 | Despatch of a communication from the examining division (Time limit: M04) | 21.12.2007 | Reply to a communication from the examining division | 12.06.2008 | Despatch of a communication from the examining division (Time limit: M06) | 20.11.2008 | Reply to a communication from the examining division | 27.08.2009 | Communication of intention to grant the patent | 02.12.2009 | Fee for grant paid | 02.12.2009 | Fee for publishing/printing paid | Parent application(s) Tooltip | EP06001015.4 / EP1684107 | Opposition(s) | 06.12.2010 | No opposition filed within time limit [2011/06] | Fees paid | Renewal fee | 17.01.2008 | Renewal fee patent year 03 | 19.01.2009 | Renewal fee patent year 04 | 19.01.2010 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]US4609814 (NOBUAKI KITAJIMA [JP], et al) [X] 1-3,5-7 * figure 4 * * column 4, line 22 - line 41 *; | [A]US2001039421 (HEILBRUN MARL PETER [US], et al) [A] * abstract ** paragraph [0077] *; | [X]US2002095081 (VILSMEIER STEFAN [DE]) [X] 1-7 * paragraph [0036] - paragraph [0040] *; | [X]WO02065069 (HYPERMED INC [US], et al) [X] 1-7 * page 10, line 3 - line 27 *; | [X]US2004197017 (OLSCHEWSKI FRANK [DE], et al) [X] 1-3,5-7 * figure - * * paragraph [0005] - paragraph [0023] * * paragraph [0035] - paragraph [0041] * | by applicant | JP2000275539 |