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Extract from the Register of European Patents

EP About this file: EP1835342

EP1835342 - Positive resist composition and pattern forming method using the same [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  24.06.2016
Database last updated on 25.09.2024
Most recent event   Tooltip24.06.2016Application deemed to be withdrawnpublished on 27.07.2016  [2016/30]
Applicant(s)For all designated states
FUJIFILM Corporation
26-30, Nishiazabu 2-chome
Minato-ku
Tokyo / JP
[N/P]
Former [2007/38]For all designated states
FUJIFILM Corporation
26-30, Nishiazabu 2-chome Minato-ku
Tokyo / JP
Inventor(s)01 / Mizutani, Kazuyoshi
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
02 / Iwato, Kaoru
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
03 / Kodama, Kunihiko
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
04 / Tsuchihashi, Toru
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
 [2008/01]
Former [2007/38]01 / Mizutani, Kazuyoshi
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
02 / Iwato, Kaoru
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
03 / Kodama, Kunihiro
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
04 / Tsuchihashi, Toru
c/o FUJIFILM Corporation 4000, Kawashiri
Yoshida-cho Haibara-gun Shizuoka / JP
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastraße 30
81925 München / DE
[N/P]
Former [2007/38]HOFFMANN EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date07005158.613.03.2007
[2007/38]
Priority number, dateJP2006006938214.03.2006         Original published format: JP 2006069382
JP2006024724412.09.2006         Original published format: JP 2006247244
[2007/38]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1835342
Date:19.09.2007
Language:EN
[2007/38]
Type: A3 Search report 
No.:EP1835342
Date:04.06.2008
[2008/23]
Search report(s)(Supplementary) European search report - dispatched on:EP08.05.2008
ClassificationIPC:G03F7/039
[2007/38]
CPC:
G03F7/0392 (EP,US); G03F7/0045 (KR); G03F7/0397 (KR);
Y10S430/106 (EP,KR,US); Y10S430/108 (EP,US); Y10S430/111 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2007/38]
TitleGerman:Positive Resistzusammensetzung und Verfahren zur Strukturformung damit[2007/38]
English:Positive resist composition and pattern forming method using the same[2007/38]
French:Composition de réserve positive et procédé de formation de motif l'utilisant[2007/38]
Examination procedure24.11.2008Amendment by applicant (claims and/or description)
03.12.2008Examination requested  [2009/03]
03.07.2014Despatch of a communication from the examining division (Time limit: M06)
22.12.2014Reply to a communication from the examining division
12.10.2015Despatch of a communication from the examining division (Time limit: M04)
23.02.2016Application deemed to be withdrawn, date of legal effect  [2016/30]
22.03.2016Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2016/30]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  03.07.2014
Fees paidRenewal fee
30.03.2009Renewal fee patent year 03
16.03.2010Renewal fee patent year 04
25.03.2011Renewal fee patent year 05
15.03.2012Renewal fee patent year 06
20.03.2013Renewal fee patent year 07
18.03.2014Renewal fee patent year 08
10.03.2015Renewal fee patent year 09
Penalty fee
Additional fee for renewal fee
31.03.201610   M06   Not yet paid
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Documents cited:Search[A]JPS5868743  ;
 JPS5868743  [ ] (HITACHI LTD) [ ] * page 247; figure 1 *;
 [X]EP0284868  (GEN ELECTRIC [US]) [X] 1,10 * page 6; example 2 *;
 [X]EP0337258  (BASF AG [DE]) [X] 1-10 * page 9; example 1 *;
 [AD]EP0663616  (FUJITSU LTD [JP]) [AD] 1-10 * page 60, lines 1-30 *;
 [X]EP0829766  (SHIPLEY CO LLC [US]) [X] 1-10 * page 10, lines 25-28 * * page 14, lines 30-40 * * claims 1,14 *;
 [X]EP1273969  (FUJI PHOTO FILM CO LTD [JP]) [X] 1-10 * page 81, structure P-51 * * page 83, paragraph 193 * * page 84, paragraph 199 *;
 [X]US2003022103  (LEE GEUN SU [KR], et al) [X] 1,10 * page 4; example 5 *;
 [X]  - ICHIMURA K. ET AL., "Highly sensitive positive resists for holography", PROCEEDINGS OF THE SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, USA, (1990), vol. 1212, pages 73 - 75, XP002475596 [X] 1,10 * page 73, abstract * * page 75; figure 2 *

DOI:   http://dx.doi.org/10.1117/12.17969
 [A]  - DATABASE WPI, 0, Derwent World Patents Index, vol. 1983, no. 22, Database accession no. 1983-52847K, XP002475597 & JPS5868743 A 19830423 (HITACHI LTD) [A] 1-10 * abstract *
ExaminationEP1892575
 EP1906247
by applicantJPS5868743
 EP0284868
 EP0337258
 JPH07234511
 EP0829766
 EP1273969
 US2003022103
    - K. ICHIMURA; Y. OHE, "Practical Holography IV", SPIE, (1990), vol. 1212, pages 73 - 75
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.