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Extract from the Register of European Patents

EP About this file: EP1862839

EP1862839 - Microscope with improved resolution [Right-click to bookmark this link]
StatusPatent maintained as amended
Status updated on  24.01.2020
Database last updated on 14.05.2024
Most recent event   Tooltip24.01.2020Patent maintained (B2 publication)published on 26.02.2020  [2020/09]
Applicant(s)For all designated states
Carl Zeiss Microscopy GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
[2020/09]
Former [2013/32]For all designated states
Carl Zeiss Microscopy GmbH
Carl Zeiss Promenade 10
07745 Jena / DE
Former [2007/49]For all designated states
Carl Zeiss MicroImaging GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
Inventor(s)01 / Kempe, Michael
Am Mönchenberge 8
07751 Jena / DE
 [2007/49]
Representative(s)Patentanwälte Geyer, Fehners & Partner mbB
Perhamerstrasse 31
80687 München / DE
[2020/09]
Former [2013/32]Geyer, Fehners & Partner
Patentanwälte Perhamerstrasse 31
80687 München / DE
Former [2012/06]Hampe, Holger
Carl Zeiss Jena GmbH, Zentralbereich Recht und Patente, Patentabteilung
07740 Jena / DE
Former [2007/49]Hampe, Holger
Carl Zeiss Jena GmbH, Zentralbereich Recht und Patente, Patentabteilung
07740 Jena / DE
Application number, filing date07010431.025.05.2007
[2007/49]
Priority number, dateDE2006102620431.05.2006         Original published format: DE102006026204
[2007/49]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1862839
Date:05.12.2007
Language:DE
[2007/49]
Type: B1 Patent specification 
No.:EP1862839
Date:08.02.2012
Language:DE
[2012/06]
Type: B2 New European patent specification 
No.:EP1862839
Date:26.02.2020
Language:DE
[2020/09]
Search report(s)(Supplementary) European search report - dispatched on:EP28.09.2007
ClassificationIPC:G02B21/16, G02B21/00
[2007/49]
CPC:
G02B21/0056 (EP,US); G02B21/0076 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2020/09]
Former [2007/49]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Mikroskop mit erhöhter Auflösung[2007/49]
English:Microscope with improved resolution[2007/49]
French:Microscope à résolution améliorée[2007/49]
Examination procedure25.05.2007Examination requested  [2007/49]
27.06.2008Despatch of a communication from the examining division (Time limit: M06)
11.02.2009Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
20.04.2009Reply to a communication from the examining division
06.08.2009Despatch of a communication from the examining division (Time limit: M06)
16.02.2010Reply to a communication from the examining division
10.06.2010Despatch of a communication from the examining division (Time limit: M07)
20.01.2011Reply to a communication from the examining division
24.08.2011Communication of intention to grant the patent
23.12.2011Fee for grant paid
23.12.2011Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  27.06.2008
Opposition(s)Opponent(s)01  07.11.2012  13.11.2012  ADMISSIBLE
Leica Microsystems CMS GmbH
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
Opponent's representative
Grabovac, Dalibor
GH-Patent
Patentanwaltskanzlei
Bahnhofstraße 2
65307 Bad Schwalbach / DE
 [N/P]
Former [2014/32]
Opponent(s)01  07.11.2012  13.11.2012  ADMISSIBLE
Leica Microsystems CMS GmbH
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
Opponent's representative
Grabovac, Dalibor
GH-Patent
Patentanwaltskanzlei
Bahnhofstrasse 2
65307 Bad Schwalbach / DE
Former [2013/09]
Opponent(s)01  07.11.2012  13.11.2012  ADMISSIBLE
Leica Microsystems CMS GmbH
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
Opponent's representative
Grabovac, Dalibor
GH-Patent, Patentanwaltskanzlei
Badweg 3
65307 Bad Schwalbach / DE
Former [2012/50]
Opponent(s)01  07.11.2012   
Leica Microsystems CMS GmbH
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
Opponent's representative
Grabovac, Dalibor
Badweg 3
65307 Bad Schwalbach / DE
21.12.2012Invitation to proprietor to file observations on the notice of opposition
01.07.2013Reply of patent proprietor to notice(s) of opposition
16.12.2014Date of oral proceedings
06.07.2015Despatch of interlocutory decision in opposition
06.07.2015Despatch of minutes of oral proceedings
27.08.2019Legal effect of interlocutory decision in opposition
13.11.2019Despatch of communication that the patent will be maintained as amended
16.01.2020Fee for printing new specification paid
Appeal following opposition16.09.2015Appeal received No.  T1854/15
13.11.2015Statement of grounds filed
27.08.2019Result of appeal procedure: appeal of the opponent was rejected
27.08.2019Date of oral proceedings
02.09.2019Minutes of the oral proceedings despatched
Request for further processing for:The application is deemed to be withdrawn due to failure to reply to the examination report
20.04.2009Request for further processing filed
20.04.2009Full payment received (date of receipt of payment)
Request granted
18.06.2009Decision despatched
Fees paidRenewal fee
25.05.2009Renewal fee patent year 03
28.05.2010Renewal fee patent year 04
24.05.2011Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU25.05.2007
CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
IT08.02.2012
LT08.02.2012
LV08.02.2012
MT08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
SK08.02.2012
TR08.02.2012
BG08.05.2012
GR09.05.2012
ES19.05.2012
AT25.05.2012
LU25.05.2012
BE31.05.2012
CH31.05.2012
LI31.05.2012
MC31.05.2012
IS08.06.2012
PT08.06.2012
[2014/34]
Former [2014/27]CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
IT08.02.2012
LT08.02.2012
LV08.02.2012
MT08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
SK08.02.2012
TR08.02.2012
BG08.05.2012
GR09.05.2012
ES19.05.2012
AT25.05.2012
LU25.05.2012
BE31.05.2012
CH31.05.2012
LI31.05.2012
MC31.05.2012
IS08.06.2012
PT08.06.2012
Former [2014/21]CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
IT08.02.2012
LT08.02.2012
LV08.02.2012
MT08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
SK08.02.2012
TR08.02.2012
BG08.05.2012
GR09.05.2012
ES19.05.2012
AT25.05.2012
BE31.05.2012
CH31.05.2012
LI31.05.2012
MC31.05.2012
IS08.06.2012
PT08.06.2012
Former [2013/36]CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
IT08.02.2012
LT08.02.2012
LV08.02.2012
MT08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
SK08.02.2012
BG08.05.2012
GR09.05.2012
ES19.05.2012
AT25.05.2012
BE31.05.2012
CH31.05.2012
LI31.05.2012
MC31.05.2012
IS08.06.2012
PT08.06.2012
Former [2013/35]CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
IT08.02.2012
LT08.02.2012
LV08.02.2012
MT08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
SK08.02.2012
BG08.05.2012
GR09.05.2012
ES19.05.2012
BE31.05.2012
CH31.05.2012
LI31.05.2012
MC31.05.2012
IS08.06.2012
PT08.06.2012
Former [2013/33]CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
IT08.02.2012
LT08.02.2012
LV08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
SK08.02.2012
BG08.05.2012
GR09.05.2012
ES19.05.2012
BE31.05.2012
CH31.05.2012
LI31.05.2012
MC31.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/50]CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
IT08.02.2012
LT08.02.2012
LV08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
SK08.02.2012
GR09.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/49]CY08.02.2012
CZ08.02.2012
DK08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
LT08.02.2012
LV08.02.2012
NL08.02.2012
PL08.02.2012
RO08.02.2012
SE08.02.2012
SI08.02.2012
GR09.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/48]CY08.02.2012
EE08.02.2012
FI08.02.2012
IE08.02.2012
LT08.02.2012
LV08.02.2012
NL08.02.2012
PL08.02.2012
SE08.02.2012
GR09.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/47]CY08.02.2012
FI08.02.2012
IE08.02.2012
LT08.02.2012
LV08.02.2012
NL08.02.2012
PL08.02.2012
GR09.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/41]CY08.02.2012
FI08.02.2012
LT08.02.2012
LV08.02.2012
NL08.02.2012
PL08.02.2012
GR09.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/39]FI08.02.2012
LT08.02.2012
LV08.02.2012
NL08.02.2012
PL08.02.2012
GR09.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/37]FI08.02.2012
LT08.02.2012
NL08.02.2012
PL08.02.2012
GR09.05.2012
IS08.06.2012
PT08.06.2012
Former [2012/36]LT08.02.2012
NL08.02.2012
GR09.05.2012
IS08.06.2012
Former [2012/35]LT08.02.2012
NL08.02.2012
IS08.06.2012
Former [2012/34]LT08.02.2012
IS08.06.2012
Former [2012/33]LT08.02.2012
Documents cited:Search[A]US2002141052  (IKETAKI YOSHINORI [JP]) [A] 1-8 * figure - * * paragraph [0067] - paragraph [0077] *;
 [X]  - KLAR T A ET AL, "Breaking Abbe's diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes", PHYSICAL REVIEW E. STATISTICAL PHYSICS, PLASMAS, FLUIDS, AND RELATED INTERDISCIPLINARY TOPICS, AMERICAN INSTITUTE OF PHYSICS, NEW YORK, NY, US, (20011126), vol. 64, no. 6, ISSN 1063-651X, pages 66613 - 1, XP002305574 [X] 1-4,6-8 * the whole document *

DOI:   http://dx.doi.org/10.1103/PhysRevE.64.066613
 [A]  - N. BOKOR ET AL., "Investigation of polarization effects for high-numerical-aperture first-order Laguerrw-Gaussian beams by 2D scanning with a single fluorescent microbead", OPTICS EXPRESS, (20051226), vol. 13, no. 26, pages 10440 - 10447, XP002450216 [A] 1-8 * the whole document *

DOI:   http://dx.doi.org/10.1364/OPEX.13.010440
 [A]  - O. HAEBERLÉ, B. SIMON, "Improving the lateral resolution in confocal fluorescence microscopy using laterally interfering excitation beams", OPTICS COMMUNICATIONS, (20060315), vol. 259, pages 400 - 408, XP002450217 [A] 1 * abstract *

DOI:   http://dx.doi.org/10.1016/j.optcom.2005.09.004
OppositionDE10056382
 DE10105391
 DE10340965
 DE102004032953
    - Takeshi Watanabe et al, "Two-color far-field super-resolution microscope using a doughnut beam", Chem. Phys. Lett., (2003), vol. 371, pages 634 - 639
    - Török P. et al.; "The Use of Gauss-Laguerre Vector Beams in STED Microscopy"; Optics Express; 26 Jul. 2004; pp. 3605-3617; vol. 12, No. 15; Optical Society of America; USA.
    - T. Watanabe et al, "Generation of a Doughnut-shaped beam using a spiral phase plate", Rev. Sei. Instrum., (2004), vol. 75, no. 5131
    - Eugen Hecht, Optik, 2. Nachdruck, Deutschland, Addison-Wesley GmbH, (1992), ISBN 3-925118-86-1
    - Engel et al.; "Creating /./3 focal holes with a MachZehnder interferometer"; Applied Physics B77: Lasers and Optics; Aug. 2003; pp. 11-17; No. 1; Springer Berlin; Heidelberg, Finland.
    - Klar Thomas A. et al, "Fluorescence microscopy with diffraction resolution barrier broken by stimulated emission", PNAS, (2000), vol. 97, no. 15, pages 8206 - 8210
    - Klar Thomas A.: "Progress in Stimulated Emission Depletion Microscopy", Dissertation, Univ. Heidelberg, 2001
    - Satoshi Habuchi et al, "Reversible single-molecule photo switching in the GFPlike fluorescent protein Dronpa", PNAS, (2005), vol. 102, no. 27, pages 9511 - 9516
    - Delmar S. Larsen et al, "Photoisomerization and Photoionization of the Photoactive Yellow Protein Chromophore in Solution", Biophysical Journal, (200404), vol. 86, no. 4, pages 2538 - 2550
    - Tadday et al. "New laser system for measurements of dissociation rates of small molecules with picosecond temporal resolution," 1998, Proceedings of SPIE, vol. 3271, pp. 210-218.
    - Marsh et al., "Stimulated emission depletion following two photon excitation," 2002, Proceedings of SPIE, vol. 4812. pp. 45-54.
    - Hell et al.; "Ground-state-depletion Fluorescence Microscopy: A Concepts for Breaking the Diffraction Resolution"; Applied Physics B: Lasers and Optics; May 1995; pp. 495-497; vol. 60, No. 5; Springer Berlin; Heidelberg, Finland.
    - Willig K.I. et al, "STED microscopy reveals that synaptotagmin remains clustered after synaptic vesicle exocytosis", Nature, (20060413), vol. 440, pages 935 - 939
    - Klar Thomas A. et al, "Subdiffraction resolution in far-field fluorescence microscopy", Optics Letters, (1999), vol. 24, no. 14, pages 954 - 956
    - Watanabe T. et al, "Two-point-separation in super-resolution fluorescence microscope based on up-conversion fluorescence depletion technique", Opt Express, (20031201), vol. 11, no. 24, pages 3271 - 3276
    - Bergmann, Schaefer: Lehrbuch der Experimentalphysik, Band III, Optik, 8. Auflage, 1987
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.