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Extract from the Register of European Patents

EP About this file: EP1920842

EP1920842 - Microchip and microchip inspection system [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  24.04.2009
Database last updated on 20.07.2024
Most recent event   Tooltip24.04.2009Application deemed to be withdrawnpublished on 27.05.2009  [2009/22]
Applicant(s)For all designated states
Konica Minolta Medical & Graphic, Inc.
1 Sakura-machi, Hino-shi
Tokyo 191-8511 / JP
[2008/20]
Inventor(s)01 / Nakajima, Akihisa Konica Minolta Techn. Center, Inc.
1 Sakura-machi, Hino-shi
Tokyo 191-8511 / JP
02 / Higashino, Kusunoki Konica Minolta Techn. Center, Inc.
1-2, Sakura-machi, Takatsuki-shi
Tokyo 191-8511 / JP
03 / Sando, Yasuhiro Konica Minolta Techn.Center, Inc.
1-2, Sakura-machi, Takatsuki-shi
Osaka 569-8503 / JP
04 / Aoki, Youichi Konica Minolta Techn. Center, Inc.
1 Sakura-machi, Hino-shi
Tokyo 191-8511 / JP
 [2008/20]
Representative(s)Henkel & Partner mbB
Patentanwaltskanzlei, Rechtsanwaltskanzlei
Maximiliansplatz 21
80333 München / DE
[N/P]
Former [2008/20]Henkel, Feiler & Hänzel
Patentanwälte Maximiliansplatz 21
80333 München / DE
Application number, filing date07119146.424.10.2007
[2008/20]
Priority number, dateJP2006029235927.10.2006         Original published format: JP 2006292359
[2008/20]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1920842
Date:14.05.2008
Language:EN
[2008/20]
Search report(s)(Supplementary) European search report - dispatched on:EP20.02.2008
ClassificationIPC:B01L3/00, B01J19/00
[2008/20]
CPC:
B01L3/502707 (EP,US); B01L2200/16 (EP,US); B01L2300/042 (EP,US);
B01L2300/049 (EP,US); B01L2300/069 (EP,US); B01L2300/0816 (EP,US);
B01L2300/0867 (EP,US); B01L2300/1822 (EP,US); B01L2400/0439 (EP,US);
B01L2400/0677 (EP,US) (-)
Designated contracting states[2009/04]
Former [2008/20]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Mikrochip und Prüfsystem für Mikrochip[2008/20]
English:Microchip and microchip inspection system[2008/20]
French:Micropuce et système d'inspection de micropuce[2008/20]
Examination procedure15.11.2008Application deemed to be withdrawn, date of legal effect  [2009/22]
12.01.2009Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2009/22]
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Documents cited:Search[X]WO9426414  (SYNTEX INC [US]) [X] 1,4-6 * page 13, line 11 - line 36; figures 1-6; claims 2-6 *;
 [XA]WO0046595  (ACLARA BIOSCIENCES INC [US]) [X] 1 * claims 13,17,18 * [A] 5;
 [X]WO2004042357  (UNIV MICHIGAN [US], et al) [X] 1,3 * page 6, line 22 - line 30 * * page 22, line 8 - line 17 * * page 26, line 5 - page 27, line 20 *;
 [X]US2005250200  (NAKAJIMA AKIHISA [JP], et al) [X] 1-7 * page 1, paragraphs 13-19164-168; figures 1,3; claims 9-11; table 1 *;
 [X]WO2006044896  (APPLERA CORP [US], et al) [X] 1-7 * paragraphs [0007] , [0103]; claims 1,4,9,12,16,18 *;
 [X]US2006171857  (STEAD RONALD H [CA], et al) [X] 4-6 * paragraphs [0007] - [0009] - [0043] , [0095] *;
 [X]US2006228812  (HIGASHINO KUSUNOKI [JP], et al) [X] 4-6* paragraphs [0164] , [0179]; figures 1,6; table 1 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.