EP1920842 - Microchip and microchip inspection system [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 24.04.2009 Database last updated on 20.07.2024 | Most recent event Tooltip | 24.04.2009 | Application deemed to be withdrawn | published on 27.05.2009 [2009/22] | Applicant(s) | For all designated states Konica Minolta Medical & Graphic, Inc. 1 Sakura-machi, Hino-shi Tokyo 191-8511 / JP | [2008/20] | Inventor(s) | 01 /
Nakajima, Akihisa Konica Minolta Techn. Center, Inc. 1 Sakura-machi, Hino-shi Tokyo 191-8511 / JP | 02 /
Higashino, Kusunoki Konica Minolta Techn. Center, Inc. 1-2, Sakura-machi, Takatsuki-shi Tokyo 191-8511 / JP | 03 /
Sando, Yasuhiro Konica Minolta Techn.Center, Inc. 1-2, Sakura-machi, Takatsuki-shi Osaka 569-8503 / JP | 04 /
Aoki, Youichi Konica Minolta Techn. Center, Inc. 1 Sakura-machi, Hino-shi Tokyo 191-8511 / JP | [2008/20] | Representative(s) | Henkel & Partner mbB Patentanwaltskanzlei, Rechtsanwaltskanzlei Maximiliansplatz 21 80333 München / DE | [N/P] |
Former [2008/20] | Henkel, Feiler & Hänzel Patentanwälte Maximiliansplatz 21 80333 München / DE | Application number, filing date | 07119146.4 | 24.10.2007 | [2008/20] | Priority number, date | JP20060292359 | 27.10.2006 Original published format: JP 2006292359 | [2008/20] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1920842 | Date: | 14.05.2008 | Language: | EN | [2008/20] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 20.02.2008 | Classification | IPC: | B01L3/00, B01J19/00 | [2008/20] | CPC: |
B01L3/502707 (EP,US);
B01L2200/16 (EP,US);
B01L2300/042 (EP,US);
B01L2300/049 (EP,US);
B01L2300/069 (EP,US);
B01L2300/0816 (EP,US);
B01L2300/0867 (EP,US);
B01L2300/1822 (EP,US);
B01L2400/0439 (EP,US);
B01L2400/0677 (EP,US)
(-)
| Designated contracting states | [2009/04] |
Former [2008/20] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Mikrochip und Prüfsystem für Mikrochip | [2008/20] | English: | Microchip and microchip inspection system | [2008/20] | French: | Micropuce et système d'inspection de micropuce | [2008/20] | Examination procedure | 15.11.2008 | Application deemed to be withdrawn, date of legal effect [2009/22] | 12.01.2009 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [2009/22] |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]WO9426414 (SYNTEX INC [US]) [X] 1,4-6 * page 13, line 11 - line 36; figures 1-6; claims 2-6 *; | [XA]WO0046595 (ACLARA BIOSCIENCES INC [US]) [X] 1 * claims 13,17,18 * [A] 5; | [X]WO2004042357 (UNIV MICHIGAN [US], et al) [X] 1,3 * page 6, line 22 - line 30 * * page 22, line 8 - line 17 * * page 26, line 5 - page 27, line 20 *; | [X]US2005250200 (NAKAJIMA AKIHISA [JP], et al) [X] 1-7 * page 1, paragraphs 13-19164-168; figures 1,3; claims 9-11; table 1 *; | [X]WO2006044896 (APPLERA CORP [US], et al) [X] 1-7 * paragraphs [0007] , [0103]; claims 1,4,9,12,16,18 *; | [X]US2006171857 (STEAD RONALD H [CA], et al) [X] 4-6 * paragraphs [0007] - [0009] - [0043] , [0095] *; | [X]US2006228812 (HIGASHINO KUSUNOKI [JP], et al) [X] 4-6* paragraphs [0164] , [0179]; figures 1,6; table 1 * |