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EP2051056
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EP About this file: EP2051056
| EP2051056 - MTF MEASURING SYSTEM, MTF MEASURING METHOD, MTF MEASURING UNIT AND MTF MEASURING PROGRAM [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 24.08.2012 Database last updated on 24.07.2024 | Most recent event Tooltip | 24.08.2012 | Withdrawal of application | published on 26.09.2012 [2012/39] | Applicant(s) | For all designated states Acutelogic Corporation Mitsuwa Ogawamachi Bldg. 3F 3-7-1, Kanda-Ogawamachi Chiyoda-ku Tokyo 101-0052 / JP | [2009/17] | Inventor(s) | 01 /
MASUDA, Takashi c/o ACUTELOGIC CORPORATION Mitsuwa Ogawamachi Bldg. 3F. 3-7-1, Kanda-ogawamachi, Chiyoda-ku Tokyo 101-0052 / JP | 02 /
YOSHIDA, Kouki c/o ACUTELOGIC CORPORATION Mitsuwa Ogawamachi Bldg. 3F. 3-7-1, Kanda-ogawamachi, Chiyoda-ku Tokyo 101-0052 / JP | 03 /
AOKI, Takaharu c/o ACUTELOGIC CORPORATION Mitsuwa Ogawamachi Bldg. 3F. 3-7-1, Kanda-ogawamachi, Chiyoda-ku Tokyo 101-0052 / JP | 04 /
WAKI, Kenichiro c/o ACUTELOGIC CORPORATION Mitsuwa Ogawamachi Bldg. 3F. 3-7-1, Kanda-ogawamachi, Chiyoda-ku Tokyo 101-0052 / JP | [2009/17] | Representative(s) | Vossius & Partner Patentanwälte Rechtsanwälte mbB Siebertstrasse 3 81675 München / DE | [N/P] |
| Former [2009/17] | Vossius & Partner Siebertstrasse 4 81675 München / DE | Application number, filing date | 07792316.7 | 03.08.2007 | [2009/17] | WO2007JP65670 | Priority number, date | JP20060214437 | 07.08.2006 Original published format: JP 2006214437 | [2009/17] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2008018573 | Date: | 14.02.2008 | Language: | JA | [2008/07] | Type: | A1 Application with search report | No.: | EP2051056 | Date: | 22.04.2009 | Language: | EN | [2009/17] | Search report(s) | International search report - published on: | JP | 14.02.2008 | Classification | IPC: | G01M11/02 | [2009/17] | CPC: |
G01M11/0292 (EP,KR,US);
G01M99/008 (KR);
G02B27/4205 (KR);
G01N2021/9583 (KR)
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, PL, PT, RO, SE, SI, SK, TR [2009/17] | Title | German: | MTF-MESSSYSTEM, MTF-MESSVERFAHREN, MTF-MESSVERFAHREN UND MTF-MESSPROGRAMM | [2009/17] | English: | MTF MEASURING SYSTEM, MTF MEASURING METHOD, MTF MEASURING UNIT AND MTF MEASURING PROGRAM | [2009/17] | French: | SYSTEME DE MESURE DE MTF, PROCEDE DE MESURE DE MTF, UNITE DE MESURE DE MTF ET PROGRAMME DE MESURE DE MTF | [2009/17] | Entry into regional phase | 03.02.2009 | Translation filed | 24.02.2009 | National basic fee paid | 24.02.2009 | Search fee paid | 24.02.2009 | Designation fee(s) paid | 24.02.2009 | Examination fee paid | Examination procedure | 24.02.2009 | Examination requested [2009/17] | 17.08.2012 | Application withdrawn by applicant [2012/39] | Fees paid | Renewal fee | 24.08.2009 | Renewal fee patent year 03 | 24.08.2010 | Renewal fee patent year 04 | 25.08.2011 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [Y]JP2003185531 (OLYMPUS OPTICAL CO); | [Y]JPS562519 (RICOH KK); | [Y]JP2000511288 ; | [Y]JP2004132703 (CHINONTEC KK) | by applicant | JP2002350285 | JP2006214437 |