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Extract from the Register of European Patents

EP About this file: EP2076791

EP2076791 - APPARATUS, IMAGING DEVICE AND METHOD FOR DETECTING X-RAY RADIATION [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  26.02.2016
Database last updated on 07.10.2024
Most recent event   Tooltip13.10.2017Lapse of the patent in a contracting state
New state(s): BG, CY, HU, MT, SE, TR
published on 15.11.2017  [2017/46]
Applicant(s)For:AT  BE  BG  CH  CY  CZ  DK  EE  ES  FI  FR  GB  GR  HU  IE  IS  IT  LI  LT  LU  LV  MC  MT  NL  PL  PT  RO  SE  SI  SK  TR 
Koninklijke Philips N.V.
High Tech Campus 5
5656 AE Eindhoven / NL
For:DE 
Philips Intellectual Property & Standards GmbH
Lübeckertordamm 5
20099 Hamburg / DE
[2015/17]
Former [2013/39]For:AT  BE  BG  CH  CY  CZ  DK  EE  ES  FI  FR  GB  GR  HU  IE  IS  IT  LI  LT  LU  LV  MC  MT  NL  PL  PT  RO  SE  SI  SK  TR 
Koninklijke Philips N.V.
High Tech Campus 5
5656 AE Eindhoven / NL
For:DE 
Philips Intellectual Property & Standards GmbH
Lübeckertordamm 5
20099 Hamburg / DE
Former [2009/28]For:AT  BE  BG  CH  CY  CZ  DK  EE  ES  FI  FR  GB  GR  HU  IE  IS  IT  LI  LT  LU  LV  MC  MT  NL  PL  PT  RO  SE  SI  SK  TR 
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
For:DE 
Philips Intellectual Property & Standards GmbH
Lübeckertordamm 5
20099 Hamburg / DE
Inventor(s)01 / STEADMAN, Roger
High Tech Campus Building 44
5656 AE Eindhoven / NL
02 / ZEITLER, Guenter
High Tech Campus Building 44
5656 AE Eindhoven / NL
03 / HERRMANN, Christoph
High Tech Campus Building 44
5656 AE Eindhoven / NL
04 / BAEUMER, Christian
High Tech Campus Building 44
5656 AE Eindhoven / NL
 [2009/28]
Representative(s)de Haan, Poul Erik, et al
Philips International B.V.
Philips Intellectual Property & Standards
High Tech Campus 5
5656 AE Eindhoven / NL
[N/P]
Former [2012/34]Verweij, Petronella Danielle, et al
Philips Intellectual Property & Standards
P.O. Box 220
5600 AE Eindhoven / NL
Former [2009/28]Schouten, Marcus Maria
Philips Intellectual Property & Standards P.O. Box 220
5600 AE Eindhoven / NL
Application number, filing date07826816.622.10.2007
[2009/28]
WO2007IB54283
Priority number, dateEP2006012293325.10.2006         Original published format: EP 06122933
[2009/28]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2008050283
Date:02.05.2008
Language:EN
[2008/18]
Type: A2 Application without search report 
No.:EP2076791
Date:08.07.2009
Language:EN
The application published by WIPO in one of the EPO official languages on 02.05.2008 takes the place of the publication of the European patent application.
[2009/28]
Type: B1 Patent specification 
No.:EP2076791
Date:22.04.2015
Language:EN
[2015/17]
Search report(s)International search report - published on:EP10.07.2008
ClassificationIPC:G01T1/17
[2009/28]
CPC:
G01T1/17 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2015/17]
Former [2009/28]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:VORRICHTUNG, ABBILDUNGSVORRICHTUNG UND VERFAHREN ZUR RÖNTGENSTRAHLUNGSERKENNUNG[2009/28]
English:APPARATUS, IMAGING DEVICE AND METHOD FOR DETECTING X-RAY RADIATION[2009/28]
French:APPAREIL, DISPOSITIF D'IMAGERIE ET PROCEDE POUR DETECTER UN RAYONNEMENT DE RAYONS X[2009/28]
Entry into regional phase25.05.2009National basic fee paid 
25.05.2009Designation fee(s) paid 
25.05.2009Examination fee paid 
Examination procedure03.03.2009Amendment by applicant (claims and/or description)
25.05.2009Examination requested  [2009/28]
06.06.2014Despatch of a communication from the examining division (Time limit: M04)
08.10.2014Reply to a communication from the examining division
12.11.2014Communication of intention to grant the patent
03.03.2015Fee for grant paid
03.03.2015Fee for publishing/printing paid
03.03.2015Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  06.06.2014
Opposition(s)25.01.2016No opposition filed within time limit [2016/13]
Fees paidRenewal fee
02.11.2009Renewal fee patent year 03
02.11.2010Renewal fee patent year 04
31.10.2011Renewal fee patent year 05
31.10.2012Renewal fee patent year 06
31.10.2013Renewal fee patent year 07
31.10.2014Renewal fee patent year 08
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU22.10.2007
AT22.04.2015
BE22.04.2015
BG22.04.2015
CY22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
MC22.04.2015
MT22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SE22.04.2015
SI22.04.2015
SK22.04.2015
TR22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
GB22.10.2015
IE22.10.2015
LU22.10.2015
CH31.10.2015
LI31.10.2015
[2017/39]
Former [2016/45]AT22.04.2015
BE22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
MC22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SI22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
GB22.10.2015
IE22.10.2015
LU22.10.2015
CH31.10.2015
LI31.10.2015
Former [2016/37]AT22.04.2015
BE22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
MC22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SI22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
GB22.10.2015
LU22.10.2015
CH31.10.2015
LI31.10.2015
Former [2016/34]AT22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
MC22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SI22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
GB22.10.2015
LU22.10.2015
CH31.10.2015
LI31.10.2015
Former [2016/28]AT22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
MC22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SI22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
LU22.10.2015
Former [2016/26]AT22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SI22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
LU22.10.2015
Former [2016/24]AT22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SI22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
Former [2016/21]AT22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
IT22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
Former [2016/10]AT22.04.2015
CZ22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
PL22.04.2015
RO22.04.2015
SK22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
Former [2016/09]AT22.04.2015
DK22.04.2015
EE22.04.2015
ES22.04.2015
FI22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
Former [2016/07]AT22.04.2015
DK22.04.2015
ES22.04.2015
FI22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
Former [2015/51]AT22.04.2015
ES22.04.2015
FI22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
Former [2015/50]ES22.04.2015
FI22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
GR23.07.2015
IS22.08.2015
PT24.08.2015
Former [2015/49]ES22.04.2015
FI22.04.2015
LT22.04.2015
LV22.04.2015
NL22.04.2015
GR23.07.2015
PT24.08.2015
Former [2015/42]NL22.04.2015
Cited inInternational search[Y]GB1154825  (COMMISSARIAT ENERGIE ATOMIQUE [FR]) [Y] 1,2,15,16 * page 2, column 1, line 6 - column 2, line 87; figure 1 *;
 [A]WO03040757  (UNIV TEXAS [US], et al) [A] 1 * page 19, line 16 - line 23; figure 5b *;
 [A]WO0192914  (ELGEMS LTD [IL], et al) [A] 1 * page 9, line 29 - page 10, line 20; figure 1a * * page 11, line 28 - page 12, line 4; figure 1c *
 [Y]  - LEWELLEN T K ET AL, "EVALUATION OF A CLINICAL SCINTILLATION CAMERA WITH PULSE TAIL EXTRAPOLATION ELECTRONICS", JOURNAL OF NUCLEAR MEDICINE, SOCIETY OF NUCLEAR MEDICINE, RESTON, VA, US, (19890901), vol. 30, no. 9, ISSN 0161-5505, pages 1554 - 1558, XP000046196 [Y] 1,2,15,16 * page 1555, column 1, line 9 - column 2, line 26; figure 1 *
ExaminationJPH05180944
by applicantGB1154825
    - C. FIORINI ET AL., "First Experimental Characterization of ROTOR: the New Switched-Current VLSI Amplifier for X-ray Spectroscopy with Silicon Drift Detectors", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (200006), vol. 47, no. 3, pages 823 - 828
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.