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Extract from the Register of European Patents

EP About this file: EP1956113

EP1956113 - Plasma-enhanced ALD of tantalum nitride films [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  04.12.2009
Database last updated on 24.04.2024
Most recent event   Tooltip04.12.2009Application deemed to be withdrawnpublished on 06.01.2010  [2010/01]
Applicant(s)For all designated states
ASM America, Inc.
3440 East University Drive
Phoenix, AZ 85034-7200 / US
[2008/33]
Inventor(s)01 / Elers, Kai-Erik
Lautamiehentie 2 B 42
Vantaa 01510 / FI
 [2008/33]
Representative(s)polypatent
Braunsberger Feld 29
51429 Bergisch Gladbach / DE
[N/P]
Former [2008/33]Polypatent
Braunsberger Feld 29
51429 Bergisch Gladbach / DE
Application number, filing date08000724.816.01.2008
[2008/33]
Priority number, dateUS2007062774926.01.2007         Original published format: US 627749
[2008/33]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1956113
Date:13.08.2008
Language:EN
[2008/33]
Search report(s)(Supplementary) European search report - dispatched on:EP17.04.2008
ClassificationIPC:C23C16/455, C23C16/30
[2008/33]
CPC:
C23C16/34 (EP,US); C23C16/4554 (EP,US)
Designated contracting statesDE,   FR [2009/17]
Former [2008/33]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  NO,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Plasmaunterstützte Atomlagenabscheidung von Tantalnitridfilmen[2008/33]
English:Plasma-enhanced ALD of tantalum nitride films[2008/33]
French:ALD amélioré au plasma de films au nitrure de tantale[2008/33]
Examination procedure29.01.2009Examination requested  [2009/12]
14.02.2009Loss of particular rights, legal effect: designated state(s)
09.03.2009Despatch of a communication from the examining division (Time limit: M04)
14.04.2009Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR
21.07.2009Application deemed to be withdrawn, date of legal effect  [2010/01]
21.08.2009Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2010/01]
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Documents cited:Search[XY]US2003219942  (CHOI KYUNG-IN [KR], et al) [X] 1-10,12,14-22,25 * paragraphs [0012] , [0019] - [0023] - [0036] - [0042] - [0056] , [0060]; figure 3D; claim 37 * [Y] 11,13;
 [X]US7144806  (FAIR JAMES A [US], et al) [X] 1-7,9,10,14-18,21,22,25 * column 6, line 1 - column 7, line 56; figure 3; claims 1,7,9,12-20 * * column 8, lines 21-40; figure 5 *;
 [X]WO2006093260  (ULVAC INC [JP], et al) [X] 1-10,14-25 * figures 1,5,7; examples 1-4 *;
 [X]US2005095443  (KIM HYUNGJUN [US], et al) [X] 1-10,12,15-18,21-25 * paragraphs [0026] - [0028] - [0041] - [0043]; figures 3,5; example 1; claims 1,10,13 *;
 [Y]WO03102265  (APPLIED MATERIALS INC [US]) [Y] 11 * paragraph [0035] *;
 [Y]  - PARK J-S ET AL, "Plasma-enhanced atomic layer deposition of Ta-N thin films", JOURNAL OF THE ELECTROCHEMICAL SOCIETY, ELECTROCHEMICAL SOCIETY. MANCHESTER, NEW HAMPSHIRE, US, (200201), vol. 149, no. 1, ISSN 0013-4651, pages C28 - C32, XP002268295 [Y] 13 * figure 2 *

DOI:   http://dx.doi.org/10.1149/1.1423642
by applicantUS6863727
 US2004231799
 US4058430
 US5711811
 US6511539
 WO9617107
    - "Growth Mechanisms and Dynamics", Handbook of Crystal Growth 3, ELSEVIER, (1994), pages 601 - 663
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.