blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1981069

EP1981069 - Method of producing group III-V compound semiconductor, Schottky barrier diode, light emitting diode, laser diode, and method of fabricating the diodes [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  06.06.2014
Database last updated on 17.07.2024
Most recent event   Tooltip06.06.2014Application deemed to be withdrawnpublished on 09.07.2014  [2014/28]
Applicant(s)For all designated states
Sumitomo Electric Industries, Ltd.
5-33 Kitahama 4-chome, Chuo-ku
Osaka-shi, Osaka 541-0041 / JP
[2008/42]
Inventor(s)01 / Ueno, Masaki
Itami Works of Sumitomo Electric Industries, Ltd. 1-1, Koyakita 1-chome
Itami-shi Hyogo 664-0016 / JP
02 / Saitoh, Yu
Itami Works of Sumitomo Electric Industries, Ltd. 1-1, Koyakita 1-chome
Itami-shi Hyogo 664-0016 / JP
 [2008/42]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstrasse 4
80802 München / DE
[N/P]
Former [2008/42]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Leopoldstrasse 4
80802 München / DE
Application number, filing date08003392.125.02.2008
[2008/42]
Priority number, dateJP2007010402711.04.2007         Original published format: JP 2007104027
[2008/42]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1981069
Date:15.10.2008
Language:EN
[2008/42]
Type: A3 Search report 
No.:EP1981069
Date:26.06.2013
Language:EN
[2013/26]
Search report(s)(Supplementary) European search report - dispatched on:EP29.05.2013
ClassificationIPC:H01L21/205, H01L21/02, C23C16/30, // H01L29/872
[2013/26]
CPC:
H01L21/02576 (EP,US); B82Y20/00 (EP,US); C23C16/303 (EP,US);
H01L21/02389 (EP,US); H01L21/02458 (EP,US); H01L21/02505 (EP,US);
H01L21/0254 (EP,US); H01L21/0257 (EP,US); H01L21/0262 (EP,US);
H01L29/66212 (EP,US); H01L29/66462 (EP,US); H01L29/7786 (EP,US);
H01L29/872 (EP,US); H01L33/0075 (EP,US); H01L33/325 (EP,US);
H01L29/2003 (EP,US); H01S2304/04 (EP,US); H01S5/2009 (EP,US);
H01S5/305 (EP,US); H01S5/3054 (EP,US); H01S5/3211 (EP,US);
H01S5/34333 (EP,US) (-)
Former IPC [2008/42]H01L21/205
Designated contracting states(deleted) [2014/10]
Former [2008/42]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  NO,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Verfahren zur Herstellung eines Gruppe-III-V-Verbindungshalbleiters, Schottky-Barrierendiode, Lichtemissionsdiode, Laserdiode und Herstellungsverfahren für die Dioden[2008/42]
English:Method of producing group III-V compound semiconductor, Schottky barrier diode, light emitting diode, laser diode, and method of fabricating the diodes[2008/42]
French:Procédé de production de semi-conducteur de composant de groupe III-V, diode à barrière schottky, diode électroluminescente, et procédé de fabrication de diodes[2008/42]
Examination procedure25.02.2008Examination requested  [2008/42]
03.01.2014Application deemed to be withdrawn, date of legal effect  [2014/28]
03.02.2014Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2014/28]
Fees paidRenewal fee
26.02.2010Renewal fee patent year 03
25.02.2011Renewal fee patent year 04
28.02.2012Renewal fee patent year 05
26.02.2013Renewal fee patent year 06
Penalty fee
Additional fee for renewal fee
28.02.201407   M06   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[I]US2006047132  (SHENAI-KHATKHATE DEODATTA V [US], et al) [I] 1-16 * the whole document *;
 [A]EP1633003  (SUMITOMO ELECTRIC INDUSTRIES [JP]) [A] 8-10 * paragraph [0042] *;
 [A]US2005283016  (TSUDERA TAKANOBU [JP], et al) [A] 1-4 * the whole document *;
 [A]US2006075959  (MATSUBARA MASANOBU [JP], et al) [A] 1-4 * the whole document *
 [A]  - DUPUIS R D, "Epitaxial growth of III-V nitride semiconductors by metalorganic chemical vapor deposition", JOURNAL OF CRYSTAL GROWTH, ELSEVIER, AMSTERDAM, NL, (1997), vol. 178, no. 1-2, doi:10.1016/S0022-0248(97)00079-1, ISSN 0022-0248, pages 56 - 73, XP004084975 [A] 1-7,11,12 * pages 62-63, chapter '3.1.4 Doping' *

DOI:   http://dx.doi.org/10.1016/S0022-0248(97)00079-1
 [A]  - Kuech, Jensen, "OMVPE of Compound Semiconductors", Kuech, Jensen, Vossen, Kern, Thin Film Processes II, Academic Press, (1991), pages 369 - 432, ISBN 0-12-728251-3, XP009169713 [A] 1-7,11,12 * pages 427-430, chapter IX.C.1 *
by applicantJP2006342101
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.