Deutsch English Français

Contact

EP2040067

European procedure

Quick help

Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...

News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...

Extract from the Register of European Patents

EP About this file: EP2040067

EP2040067 - Anion concentration measuring device and element [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 08.07.2016 Database last updated on 03.10.2024
Most recent event Tooltip	08.07.2016	Application deemed to be withdrawn	published on 10.08.2016 [2016/32]
Applicant(s)	For all designated states Hitachi High-Technologies Corporation 24-14, Nishishinbashi 1-chome Minato-ku Tokyo 105-8717 / JP
	[N/P]
Former [2009/13]	For all designated states Hitachi High-Technologies Corporation 24-14, Nishishinbashi 1-chome Minato-ku Tokyo 105-8717 / JP
Inventor(s)	01 / Kamahori, Masao c/o Hitachi Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building, 6-1 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP
	02 / Ishige, Yu c/o Hitachi Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building, 6-1 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP
	03 / Yamashita, Kotaro c/o Hitachi High-Technologies Corporation Naka Division 882, Ichige, Hitachinaka-shi Ibaraki 312-8504 / JP
	04 / Shibata, Yasuhisa c/o Hitachi High-Technologies Corporation Naka Division 882, Ichige, Hitachinaka-shi Ibaraki 312-8504 / JP
	05 / Miyake, Masafumi c/o Hitachi High-Technologies Corporation Naka Division 882, Ichige, Hitachinaka-shi Ibaraki 312-8504 / JP
	06 / Nagamine, Kuniaki c/o Hitachi Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building, 6-1 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP
	[2009/26]
Former [2009/13]	01 / Kamahori, Masao c/o Hitachi Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building, 6-1 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP
	02 / Ishige, Yu c/o Hitachi Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building, 6-1 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP
	03 / Yamashita, Kotaro c/o Hitachi High-Technologies Corporation Naka Division 882, Ichige, Hitachinaka-shi Obaraki 312-8504 / JP
	04 / Shibata, Yasuhisa c/o Hitachi High-Technologies Corporation Naka Division 882, Ichige, Hitachinaka-shi Obaraki 312-8504 / JP
	05 / Miyake, Masafumi c/o Hitachi High-Technologies Corporation Naka Division 882, Ichige, Hitachinaka-shi Obaraki 312-8504 / JP
	06 / Nagamine, Kuniaki c/o Hitachi Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building, 6-1 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP
Representative(s)	Strehl Schübel-Hopf & Partner Maximilianstrasse 54 80538 München / DE
	[2009/13]
Application number, filing date	08014646.7	18.08.2008
	[2009/13]
Priority number, date	JP20070242790	19.09.2007 Original published format: JP 2007242790
	JP20080149385	06.06.2008 Original published format: JP 2008149385
	[2009/13]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP2040067
	Date:	25.03.2009
	Language:	EN
	[2009/13]
	Type:	A3 Search report
	No.:	EP2040067
	Date:	02.01.2013
	Language:	EN
	[2013/01]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	29.11.2012
Classification	IPC:	G01N27/333, G01N27/414	[2009/13]
	CPC:	G01N27/3335 (EP,US); G01N27/414 (EP,US)
Designated contracting states	DE, FR [2013/36]
Former [2009/13]	AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR
Title	German:	Anionkonzentrations-Messvorrichtung und Element	[2009/13]
	English:	Anion concentration measuring device and element	[2009/13]
	French:	Dispositif et élément de mesure de la concentration d'anions	[2009/13]
Examination procedure	31.03.2010	Examination requested [2010/20]
	02.07.2013	Amendment by applicant (claims and/or description)
	03.07.2013	Loss of particular rights, legal effect: designated state(s)
	08.08.2013	Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR
	01.03.2016	Application deemed to be withdrawn, date of legal effect [2016/32]
	31.03.2016	Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2016/32]
Fees paid	Renewal fee
	24.08.2010	Renewal fee patent year 03
	23.08.2011	Renewal fee patent year 04
	28.08.2012	Renewal fee patent year 05
	28.08.2013	Renewal fee patent year 06
	28.08.2014	Renewal fee patent year 07
	Penalty fee
	Additional fee for renewal fee
	31.08.2015	08 M06 Not yet paid
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[Y]EP0300364 (HITACHI LTD [JP]) [Y] 1,3,9,10* page 3, line 26 - page 7, line 8; figures 1,2 *;
		[Y]JPH03259739 (TAIYO YUDEN KK) [Y] 1-3,7-10,14,15 * abstract * * column 4, paragraph 2 - column 11, paragraph 4; figures 1-4 *;
		[Y]EP1619496 (HITACHI LTD [JP]) [Y] 1-15 * paragraphs [0002] , [0014] - [0042]; figures 1-3,7-9,12-15,19 *;
		[Y] - KNOLL W ET AL, "Supramolecular engineering at functionalized surfaces", SYNTHETIC METALS, ELSEVIER SEQUOIA, LAUSANNE, CH, vol. 61, no. 1-2, doi:10.1016/0379-6779(93)91193-6, ISSN 0379-6779, (19931123), pages 5 - 11, (19931123), XP023787715 [Y] 4-6,11-13 * page 8, column 2, paragraphs 1-2; figure 6 * DOI: http://dx.doi.org/10.1016/0379-6779(93)91193-6
		[Y] - FLINK S ET AL, "SENSOR FUNCTIONALITIES IN SELF-ASSEMBLED MONOLAYERS", ADVANCED MATERIALS, WILEY VCH VERLAG, DE, (20000915), vol. 12, no. 18, doi:10.1002/1521-4095(200009)12:18<1315::AID-ADMA1315>3.3.CO;2-B, ISSN 0935-9648, pages 1315 - 1328, XP000959967 [Y] 4-6,11-13 * page 1319, column 2, paragraph 2 * * page 1323, column 1, paragraph 2; figure 12 * DOI: http://dx.doi.org/10.1002/1521-4095(200009)12:18<1315::AID-ADMA1315>3.3.CO;2-B
		[Y] - NANTANIT WANICHACHEVA ET AL, "Surface-Based Lithium Ion Sensor: An Electrode Derivatized with a Self-Assembled Monolayer", ANALYTICAL CHEMISTRY, (20061001), vol. 78, no. 20, doi:10.1021/ac0603429, ISSN 0003-2700, pages 7132 - 7137, XP055044629 [Y] 1,3,9,10 * page 7132, column 1, paragraph 1 - page 7133, column 1, paragraph 1; figure 1 * * page 7135, column 1, paragraph 7 - column 2, paragraph 2 * DOI: http://dx.doi.org/10.1021/ac0603429
	by applicant	JP2004184365
		WO2006113440
		JP2007242790
		JP2008149385
		- J. AM. CHEM. SOC., (1998), vol. 120, pages 4652 - 4657
		- ANAL. CHEM., (2006), vol. 78, pages 7132 - 7137
		- LANGMUIR, (2006), vol. 22, pages 10732 - 10738

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

Legal notice
Terms of use
24.2.25; 34p