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EP2144166
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EP About this file: EP2144166
| EP2144166 - DIAGNOSTIC SYSTEM [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 10.01.2020 Database last updated on 08.06.2024 | |
| Former | Examination is in progress Status updated on 07.04.2017 | Most recent event Tooltip | 10.01.2020 | Application deemed to be withdrawn | published on 12.02.2020 [2020/07] | Applicant(s) | For all designated states NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | [N/P] |
| Former [2010/02] | For all designated states NEC Corporation 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | Inventor(s) | 01 /
FUJIMAKI, Ryohei c/o NEC CORPORATION 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | 02 /
TSUKAHARA, Hidenori c/o NEC CORPORATION 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | 03 /
SATOU, Akinori c/o NEC CORPORATION 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | [2010/02] | Representative(s) | Betten & Resch Patent- und Rechtsanwälte PartGmbB Maximiliansplatz 14 80333 München / DE | [N/P] |
| Former [2010/02] | Betten & Resch Patentanwälte Theatinerstrasse 8 80333 München / DE | Application number, filing date | 08738655.3 | 13.03.2008 | [2010/02] | WO2008JP54667 | Priority number, date | JP20070086898 | 29.03.2007 Original published format: JP 2007086898 | [2010/02] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2008120552 | Date: | 09.10.2008 | Language: | JA | [2008/41] | Type: | A1 Application with search report | No.: | EP2144166 | Date: | 13.01.2010 | Language: | EN | [2010/02] | Search report(s) | International search report - published on: | JP | 09.10.2008 | (Supplementary) European search report - dispatched on: | EP | 09.12.2010 | Classification | IPC: | G06F11/22, G05B23/02 | [2011/02] | CPC: |
G05B23/0297 (EP,US);
G05B23/0272 (EP);
G06F11/2257 (EP,US)
|
| Former IPC [2010/02] | G06F11/22 | Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR [2010/02] | Title | German: | DIAGNOSESYSTEM | [2010/02] | English: | DIAGNOSTIC SYSTEM | [2010/02] | French: | SYSTÈME DE DIAGNOSTIC | [2010/02] | Entry into regional phase | 05.10.2009 | Translation filed | 29.10.2009 | National basic fee paid | 29.10.2009 | Search fee paid | 29.10.2009 | Designation fee(s) paid | 29.10.2009 | Examination fee paid | Examination procedure | 21.10.2008 | Request for preliminary examination filed International Preliminary Examining Authority: JP | 29.10.2009 | Examination requested [2010/02] | 28.06.2011 | Amendment by applicant (claims and/or description) | 11.04.2017 | Despatch of a communication from the examining division (Time limit: M04) | 11.08.2017 | Reply to a communication from the examining division | 02.05.2019 | Despatch of a communication from the examining division (Time limit: M04) | 13.09.2019 | Application deemed to be withdrawn, date of legal effect [2020/07] | 10.10.2019 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2020/07] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 11.04.2017 | Fees paid | Renewal fee | 31.03.2010 | Renewal fee patent year 03 | 31.03.2011 | Renewal fee patent year 04 | 31.03.2012 | Renewal fee patent year 05 | 02.04.2013 | Renewal fee patent year 06 | 31.03.2014 | Renewal fee patent year 07 | 31.03.2015 | Renewal fee patent year 08 | 31.03.2016 | Renewal fee patent year 09 | 10.03.2017 | Renewal fee patent year 10 | 13.03.2018 | Renewal fee patent year 11 | 13.03.2019 | Renewal fee patent year 12 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [IA]US5949676 (ELSLEY RICHARD K [US]) [I] 11-13 * column 1, line 7 - column 5, line 23 * * column 9, line 44 - column 11, line 55; claim 7 *[A] 1,6,14,15; | [IA]US2005240545 (SCHACHTELY ALAN T [US], et al) [I] 11-13 * paragraph [0004] - paragraph [0006]; figure 3 * * paragraph [0016] - paragraph [0042]; claim 1 * [A] 1,6,14,15 | International search | [Y]JPH0830152 (FUJI XEROX CO LTD); | [Y]JPH11338729 (NEC CORP, et al) | by applicant | JPH05307484 | JP2002169611 | JP2005345154 | JP2007018530 | JP2007086898 | - J. TAKEUCHI; K. YAMANISHI, "A unifying framework that detects outliers and change points from time series", IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING, (2006), vol. 18, no. 4, pages 482 - 492 |