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Extract from the Register of European Patents

EP About this file: EP2150857

EP2150857 - ILLUMINATION NON-UNIFORMITY QUANTIFICATION METHOD AND APPARATUS [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  12.10.2012
Database last updated on 03.08.2024
Most recent event   Tooltip12.10.2012Application deemed to be withdrawnpublished on 14.11.2012  [2012/46]
Applicant(s)For all designated states
Micronic Mydata AB
Box 3141
183 03 Täby / SE
[2010/52]
Former [2010/06]For all designated states
MICRONIC LASER SYSTEMS AB
Nytorpsvägen 9
183 03 Täby / SE
Inventor(s)01 / SANDSTRÖM, Torbjörn
Banvägen 56
S-435 43 Pixbo / SE
 [2010/06]
Application number, filing date08759932.022.05.2008
[2010/06]
WO2008EP56331
Priority number, dateUS20070939416P22.05.2007         Original published format: US 939416 P
[2010/06]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2008142145
Date:27.11.2008
Language:EN
[2008/48]
Type: A1 Application with search report 
No.:EP2150857
Date:10.02.2010
Language:EN
The application published by WIPO in one of the EPO official languages on 27.11.2008 takes the place of the publication of the European patent application.
[2010/06]
Search report(s)International search report - published on:EP27.11.2008
ClassificationIPC:G03F7/20
[2010/06]
CPC:
G03F7/70583 (EP,KR,US); G03F7/70483 (EP,KR,US); G03F7/70025 (KR);
G03F7/70091 (KR); G03F7/70558 (KR)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2010/06]
TitleGerman:BELEUCHTUNGSUNGLEICHFÖRMIGKEITSQUANTIFIZIERUNGSVERFAHREN UND VORRICHTUNG[2010/06]
English:ILLUMINATION NON-UNIFORMITY QUANTIFICATION METHOD AND APPARATUS[2010/06]
French:PROCEDE ET APPAREIL DE QUANTIFICATION DE NON-UNIFORMITE D'ECLAIRAGE[2010/06]
Entry into regional phase21.12.2009National basic fee paid 
21.12.2009Designation fee(s) paid 
21.12.2009Examination fee paid 
Examination procedure17.03.2009Request for preliminary examination filed
International Preliminary Examining Authority: EP
21.12.2009Examination requested  [2010/09]
07.04.2010Despatch of a communication from the examining division (Time limit: M06)
14.10.2010Reply to a communication from the examining division
10.11.2011Despatch of a communication from the examining division (Time limit: M06)
22.05.2012Application deemed to be withdrawn, date of legal effect  [2012/46]
26.06.2012Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2012/46]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  07.04.2010
Fees paidRenewal fee
25.05.2010Renewal fee patent year 03
25.05.2011Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
31.05.201205   M06   Not yet paid
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Cited inInternational search[X]EP0744641  (SVG LITHOGRAPHY SYSTEMS INC [US]) [X] 1-6,9,10,22,25,28,29 * abstract * * figures 1,6-8 * * column 1, lines 18-20,24,25 * * column 5, lines 21-23 * * column 6, lines 5-23 *;
 [A]JPH0540240  (MATSUSHITA ELECTRIC IND CO LTD) [A] 1-29 * abstract *;
 [DA]  - SHI X, HESSELINK L, "Design of a C aperture to achieve lambda/10 resolution and resonant transmission", JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B, (200407), vol. 21, no. 7, pages 1305 - 1317, XP002494425 [DA] 1-29 * the whole document *

DOI:   http://dx.doi.org/10.1364/JOSAB.21.001305
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