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Extract from the Register of European Patents

EP About this file: EP2190967

EP2190967 - COMPOSITION AND METHOD FOR REMOVING ION-IMPLANTED PHOTORESIST [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  26.04.2013
Database last updated on 29.06.2024
Most recent event   Tooltip26.04.2013Application deemed to be withdrawnpublished on 29.05.2013  [2013/22]
Applicant(s)For all designated states
Advanced Technology Materials, Inc.
7 Commerce Drive
Danbury, CT 06810 / US
[2010/22]
Inventor(s)01 / ZHOU, Renjie
9 Aster Way
Dayton, New Jersey 08810 / US
02 / COOPER, Emanuel
25 Atherstone Road
Scarsdale, New York 10583 / US
03 / KORZENSKI, Michael
110 Woodcrest Lane
Danbury, Connecticut 06810 / US
04 / JIANG, Ping
2 Mountainview Terrace, Apartment 4321
Danbury, Connecticut 06810 / US
 [2010/22]
Representative(s)ABG Intellectual Property Law, S.L.
Avenida de Burgos, 16D
Edificio Euromor
28036 Madrid / ES
[N/P]
Former [2010/22]ABG Patentes, S.L.
Avenida de Burgos 16D Edificio Euromor
28036 Madrid / ES
Application number, filing date08827598.720.08.2008
[2010/22]
WO2008US73650
Priority number, dateUS20070965456P20.08.2007         Original published format: US 965456 P
[2010/22]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2009026324
Date:26.02.2009
Language:EN
[2009/09]
Type: A2 Application without search report 
No.:EP2190967
Date:02.06.2010
Language:EN
The application published by WIPO in one of the EPO official languages on 26.02.2009 takes the place of the publication of the European patent application.
[2010/22]
Search report(s)International search report - published on:KR14.05.2009
(Supplementary) European search report - dispatched on:EP15.09.2010
ClassificationIPC:G03F7/42, H01L21/311
[2012/26]
CPC:
G03F7/423 (EP,US); H01L21/31133 (EP,US)
Former IPC [2010/22]C11D7/08, C11D7/26, C01B31/20, H01L21/02
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2010/22]
TitleGerman:ZUSAMMENSETZUNG UND VERFAHREN ZUR ENTFERNUNG VON IONENIMPLANTIERTEM FOTOLACK[2010/22]
English:COMPOSITION AND METHOD FOR REMOVING ION-IMPLANTED PHOTORESIST[2010/22]
French:COMPOSITION ET PROCÉDÉ POUR RETIRER UN PHOTORÉSIST À IMPLANTATION IONIQUE[2010/22]
Entry into regional phase17.03.2010National basic fee paid 
17.03.2010Search fee paid 
17.03.2010Designation fee(s) paid 
17.03.2010Examination fee paid 
Examination procedure17.03.2010Examination requested  [2010/22]
04.04.2011Amendment by applicant (claims and/or description)
23.05.2011Despatch of a communication from the examining division (Time limit: M06)
23.11.2011Reply to a communication from the examining division
12.12.2011Despatch of a communication from the examining division (Time limit: M02)
07.02.2012Reply to a communication from the examining division
25.05.2012Cancellation of oral proceeding that was planned for 11.06.2012
11.06.2012Date of oral proceedings (cancelled)
18.07.2012Communication of intention to grant the patent
29.11.2012Application deemed to be withdrawn, date of legal effect  [2013/22]
14.01.2013Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2013/22]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  23.05.2011
Fees paidRenewal fee
25.08.2010Renewal fee patent year 03
24.08.2011Renewal fee patent year 04
10.08.2012Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XY]FR2371705  (IBM [US]) [X] 1,3-5,9-12,14 * claims 1-7,9 * * page 3, line 4 - line 14 * * page 1, line 18 - line 24 * * page 2, line 29 - line 32; examples 1-5 * * page 3, line 34 - line 38 * [Y] 2,7,8,13,15;
 [XY]US6294145  (HALL LINDSEY H [US], et al) [X] 1,3,4,10-12,14 * column 2, line 13 - line 32; examples 1,2; claims 1,2 * * column 1, line 38 * [Y] 2,7,8,13;
 [XY]US2006081180  (AOKI HIDEMITSU [JP], et al) [X] 1,3-5,9,10,12,14 * paragraph [0071] * * paragraph [0047] * * First Embodiment; paragraph [0057] - paragraph [0061] * * Fourth Embodiment; paragraph [0079] - paragraph [0082] * * figures 1,3,10 * * paragraph [0048] - paragraph [0052] * [Y] 2,7,8,13,15;
 [XP]WO2007143127  (DU PONT [US], et al) [XP] 1,3-6,11 * page 15 - page 16; examples 5, 7, 8 * * page 8, line 29 - line 32 *;
 [Y]US4101440  (AKAGI MOTOO, et al) [Y] 2,7,8,13 * column 3, line 66 - column 4, line 22; claim 3 * * column 5, line 44 - line 46; example 2 *;
 [A]US2004197261  (TUFANO THOMAS PETER [US], et al) [A] 1,5,6 * paragraph [0024]; claim 6 *
 [XY]  - BERGIN B.K., KAPLAN L.H., "Resist Stripping Process Using Caro's Acid. March 1976.", IBM TECHNICAL DISCLOSURE BULLETIN, New York, US, (19760301), vol. 18, no. 10, page 3225, XP002596067 [X] 1,3-5,9 * the whole document * [Y] 2,7,8,13
International search[A]US6489281  (SMITH KIM R [US], et al);
 [A]US2006183654  (SMALL ROBERT J [US]);
 [A]US2004038840  (LEE SHIHYING [US], et al)
by applicantFR2371705
 WO2007143127
 US7188644
 US6698619
 US20070916966
 WO2008US63276
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.