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Extract from the Register of European Patents

EP About this file: EP2215454

EP2215454 - METHOD FOR OPERATING AN FTIR SPECTROMETER, AND FTIR SPECTROMETER [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  02.11.2018
Database last updated on 21.09.2024
FormerExamination is in progress
Status updated on  30.06.2017
Most recent event   Tooltip02.11.2018Withdrawal of applicationpublished on 05.12.2018  [2018/49]
Applicant(s)For all designated states
ABB AG
Kallstadter Strasse 1
68309 Mannheim / DE
[2010/32]
Inventor(s)01 / WILL, Norbert
Im Münchsgraben 48
61130 Nidderau / DE
02 / HIELSCHER, Bernd
Gartenstrasse 1
61118 Bad Vilbel / DE
03 / BECKER, Christoph
Max-Beckmann Strasse 14
60599 Frankfurt / DE
04 / ANDRES, Berthold
Hufeisenstrasse 9a
63599 Biebergemünd / DE
05 / RATHKE, Carsten
Taunusblick 31
61137 Schöneck / DE
 [2010/32]
Representative(s)Schmidt, Karl Michael
ABB AG
GF-IP
Oberhausener Strasse 33
40472 Ratingen / DE
[N/P]
Former [2010/32]Schmidt, Karl Michael
ABB AG GF-IP Oberhausener Strasse 33
40472 Ratingen / DE
Application number, filing date08851951.721.11.2008
[2010/32]
WO2008EP09854
Priority number, dateDE2007105634522.11.2007         Original published format: DE102007056345
[2010/32]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO2009065595
Date:28.05.2009
Language:DE
[2009/22]
Type: A1 Application with search report 
No.:EP2215454
Date:11.08.2010
Language:DE
The application published by WIPO in one of the EPO official languages on 28.05.2009 takes the place of the publication of the European patent application.
[2010/32]
Search report(s)International search report - published on:EP28.05.2009
ClassificationIPC:G01N21/27, G01N21/35
[2010/32]
CPC:
G01N21/276 (EP,US); G01N21/13 (US); G01N21/274 (US);
G01N21/3504 (EP,US); G01J2003/2866 (US); G01J2003/2879 (US);
G01J3/28 (US); G01J3/42 (US); G01N2021/0357 (US);
G01N2021/0367 (US); G01N2021/3196 (US); G01N2021/3595 (EP,US);
G01N21/03 (US); G01N21/05 (EP,US); G01N21/31 (US);
G01N21/35 (US); G01N33/0004 (US); G01N33/0006 (US) (-)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2010/32]
TitleGerman:VERFAHREN ZUM BETRIEB EINES FTIR-SPEKTROMETERS, SOWIE FTIR-SPEKTROMETER SELBST[2010/32]
English:METHOD FOR OPERATING AN FTIR SPECTROMETER, AND FTIR SPECTROMETER[2010/32]
French:PROCÉDÉ DE FONCTIONNEMENT D'UN SPECTROMÈTRE FTIR ET SPECTROMÈTRE FTIR LUI-MÊME[2010/32]
Entry into regional phase22.06.2010National basic fee paid 
22.06.2010Designation fee(s) paid 
22.06.2010Examination fee paid 
Examination procedure22.06.2010Examination requested  [2010/32]
12.08.2010Amendment by applicant (claims and/or description)
28.06.2017Despatch of a communication from the examining division (Time limit: M04)
07.11.2017Reply to a communication from the examining division
18.09.2018Date of oral proceedings
18.10.2018Minutes of oral proceedings despatched
19.10.2018Despatch of communication that the application is refused, reason: substantive examination {1}
29.10.2018Application withdrawn by applicant  [2018/49]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  28.06.2017
Fees paidRenewal fee
23.11.2010Renewal fee patent year 03
23.11.2011Renewal fee patent year 04
23.11.2012Renewal fee patent year 05
28.11.2013Renewal fee patent year 06
25.11.2014Renewal fee patent year 07
24.11.2015Renewal fee patent year 08
23.11.2016Renewal fee patent year 09
24.11.2017Renewal fee patent year 10
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[X]US2004245470  (NADEZHDINSKII ALEXANDER I [RU] ET AL) [X] 1-10 * paragraphs [0012] , [0037] , [0040] , [0043] - [0045] - [0059] - [0062] - [0077] , [0081]; figure 2 *;
 [A]DE102004031643  (ABB PATENT GMBH [DE]) [A] 1-10 * paragraph [0014] *
 [X]  - KEPPLER K A ET AL, "Precision Measurements of Acetylene Spectra at 1.4 - 1.7 microns Recorded with 352.5-m Pathlength", JOURNAL OF MOLECULAR SPECTROSCOPY, vol. 175, no. 2, (199602), pages 411 - 420, URL: http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6WK8-45N4XWK-1J&_user=987766&_rdoc=1&_fmt=&_orig=search&_sort=d&view=c&_acct=C000049880&_version=1&_urlVersion=0&_userid=987766&md5=5a5461c21f7d8668b18120adb9b31724, (20090211), XP002514505 [X] 1-10 * page 412, column 1, line 8 - page 413, column 1, line 21; tables 1,2 *

DOI:   http://dx.doi.org/10.1006/jmsp.1996.0047
 [X]  - GUELACHVILI G ET AL, "High resolution wavenumber standards for the infrared", SPECTROCHIMICA ACTA, PART A (MOLECULAR AND BIOMOLECULAR SPECTROSCOPY) ELSEVIER NETHERLANDS, vol. 52A, no. 7, (19960715), pages 717 - 732, URL: http://www.sciencedirect.com/science?_ob=ArticleListURL&_method=list&_ArticleListID=865284497&_sort=d&_st=4&_acct=C000049880&_version=1&_urlVersion=0&_userid=987766&md5=4036febe07861fcbfa47fa1523f63062, (20090211), XP002514506 [X] 1-10 * page 718 - page 719; table 3 *
 [X]  - PERRIN A ET AL, "New analysis of the nu5 and 2nu9 bands of HNO3 by infrared and millimeter wave techniques: line positions and intensi", JOURNAL OF MOLECULAR SPECTROSCOPY, vol. 228, no. 2, (200412), pages 375 - 391, URL: http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6WK8-4BX79GN-1&_user=987766&_rdoc=1&_fmt=&_orig=search&_sort=d&view=c&_acct=C000049880&_version=1&_urlVersion=0&_userid=987766&md5=dd7f8c752ae187ebfa5580bbbe001bc9, (20090211), XP002514879 [X] 1-10 * paragraph [04.2] *

DOI:   http://dx.doi.org/10.1016/j.jms.2004.02.002
 [A]  - BERTIE, "Specification of Components, Methods, and Parameters in Fourier Transform Spectroscopy by Michelson and Related Interferometers: IUPAC Recommendations 1998", APPLIED SPECTROSCOPY, vol. 55, no. 4, (2001), pages 510 - 513, URL: http://www.opticsinfobase.org/DirectPDFAccess/5FB5E5A4-BDB9-137E-CEC26D7B52A2FAB3_121996.pdf?da=1&id=121996&seq=0&CFID=19582746&CFTOKEN=44899014, (20090211), XP002514507 [A] 1-10 * page 510, column 1, line 1 - page 512, column 2, line 26 *

DOI:   http://dx.doi.org/10.1366/0003702011952055
ExaminationUS5777735
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