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Extract from the Register of European Patents

EP About this file: EP2278714

EP2278714 - Power stage [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.07.2016
Database last updated on 11.09.2024
Most recent event   Tooltip17.08.2018Lapse of the patent in a contracting state
New state(s): BG		published on 19.09.2018  [2018/38]
Applicant(s)For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
[2015/38]
Former [2011/04]For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
Inventor(s)01 / Nowak, Kasia
c/o NXP Semiconductors
IP Department
Betchworth House
57-65 Station Road
Redhill, Surrey RH1 1DL / GB
02 / Acar, Mustafa
c/o NXP Semiconductors
IP Department
Betchworth House
57-65 Station Road
Redhill, Surrey RH1 1DL / GB
 [2015/38]
Former [2011/04]01 / Nowak, Kasia
c/o NXP Semiconductors IP Department Betchworth House 57-65 Station Road
Redhill, Surrey RH1 1DL / GB
02 / Acar, Mustafa
c/o NXP Semiconductors IP Department Betchworth House 57-65 Station Road
Redhill, Surrey RH1 1DL / GB
Representative(s)Hardingham, Christopher Mark, et al
NXP Semiconductors
Intellectual Property Group
Abbey House
25 Clarendon Road
Redhill, Surrey RH1 1QZ / GB
[N/P]
Former [2015/38]Hardingham, Christopher Mark, et al
NXP B.V.
Intellectual Property & Licensing
Red Central
60 High Street
Redhill, Surrey RH1 1SH / GB
Former [2011/04]Hardingham, Christopher Mark, et al
NXP Semiconductors Intellectual Property Department Betchworth House 67-65 Station Road Redhill
Surrey RH1 1DL / GB
Application number, filing date09164445.002.07.2009
[2011/04]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP2278714
Date:26.01.2011
Language:EN
[2011/04]
Type: B1 Patent specification 
No.:EP2278714
Date:16.09.2015
Language:EN
[2015/38]
Search report(s)(Supplementary) European search report - dispatched on:EP26.11.2009
ClassificationIPC:H03K19/003, H03K19/0185
[2011/04]
CPC:
H03K19/018521 (EP,US); H03K19/00315 (EP,US); H03K19/018528 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   SM,   TR [2015/38]
Former [2011/04]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  SE,  SI,  SK,  SM,  TR 
TitleGerman:Leistungsstufe[2011/04]
English:Power stage[2011/04]
French:Étage de puissance[2011/04]
Examination procedure25.05.2010Amendment by applicant (claims and/or description)
26.07.2011Examination requested  [2011/35]
11.07.2014Despatch of a communication from the examining division (Time limit: M04)
06.11.2014Reply to a communication from the examining division
04.12.2014Despatch of a communication from the examining division (Time limit: M04)
01.04.2015Reply to a communication from the examining division
13.05.2015Communication of intention to grant the patent
05.08.2015Fee for grant paid
05.08.2015Fee for publishing/printing paid
05.08.2015Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  11.07.2014
Opposition(s)17.06.2016No opposition filed within time limit [2016/34]
Fees paidRenewal fee
01.08.2011Renewal fee patent year 03
31.07.2012Renewal fee patent year 04
31.07.2013Renewal fee patent year 05
31.07.2014Renewal fee patent year 06
31.07.2015Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU02.07.2009
AT16.09.2015
BE16.09.2015
BG16.09.2015
CY16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
MC16.09.2015
MK16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SI16.09.2015
SK16.09.2015
SM16.09.2015
TR16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
[2018/38]
Former [2018/33]HU02.07.2009
AT16.09.2015
BE16.09.2015
CY16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
MC16.09.2015
MK16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SI16.09.2015
SK16.09.2015
SM16.09.2015
TR16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2018/29]HU02.07.2009
AT16.09.2015
BE16.09.2015
CY16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
MC16.09.2015
MK16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SI16.09.2015
SK16.09.2015
SM16.09.2015
TR16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2018/28]HU02.07.2009
AT16.09.2015
BE16.09.2015
CY16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
MC16.09.2015
MK16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SI16.09.2015
SK16.09.2015
SM16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2017/22]AT16.09.2015
BE16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
MC16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SI16.09.2015
SK16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2017/03]AT16.09.2015
BE16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SI16.09.2015
SK16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2016/49]AT16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SI16.09.2015
SK16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2016/39]AT16.09.2015
CZ16.09.2015
DK16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SK16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2016/24]AT16.09.2015
CZ16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
PL16.09.2015
RO16.09.2015
SE16.09.2015
SK16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
PT18.01.2016
Former [2016/23]CZ16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
RO16.09.2015
SE16.09.2015
SK16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
Former [2016/22]CZ16.09.2015
EE16.09.2015
ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
SE16.09.2015
NO16.12.2015
GR17.12.2015
IS16.01.2016
Former [2016/21]ES16.09.2015
FI16.09.2015
HR16.09.2015
IT16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
SE16.09.2015
NO16.12.2015
GR17.12.2015
Former [2016/20]ES16.09.2015
FI16.09.2015
HR16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
SE16.09.2015
NO16.12.2015
GR17.12.2015
Former [2016/14]FI16.09.2015
HR16.09.2015
LT16.09.2015
LV16.09.2015
NL16.09.2015
SE16.09.2015
NO16.12.2015
GR17.12.2015
Former [2016/11]FI16.09.2015
HR16.09.2015
LT16.09.2015
LV16.09.2015
SE16.09.2015
NO16.12.2015
GR17.12.2015
Former [2016/09]FI16.09.2015
LT16.09.2015
LV16.09.2015
NO16.12.2015
GR17.12.2015
Former [2016/08]LT16.09.2015
NO16.12.2015
Former [2016/07]LT16.09.2015
Documents cited:Search[IA]US2002186058  (PRODANOV VLADIMIR I [US]) [I] 1-3,6 * paragraphs [0002] , [0004] , [0008] , [0011] , [0030] , [0047] , [0049] , [0050]; figures 1a,1b,5b,5c * [A] 4,8;
 [A]US7400173  (KWONG DAVID K [US], et al) [A] 1,4-6,9 * abstract * * column 2, line 49 - line 57 * * column 6, line 56 - line 65 * * column 7, line 5 - line 22 * * column 7, line 62 - column 8, line 17 * * column 8, line 48 - line 55 * * column 10, line 8 - line 22 * * column 11, line 11 - line 17 *;
 [A]US2002021144  (MORGAN MARK W [US], et al) [A] 1-3,6 * abstract * * paragraphs [0033] , [0040] , [0041] , [0044] *;
 [A]EP1564884  (THINE ELECTRONICS INC [JP]) [A] 1,4,6 * abstract * * paragraphs [0001] , [0008] *;
 [A]US2001052623  (KAMEYAMA ATSUSHI [JP], et al) [A] 1-3 * abstract * * paragraphs [0017] , [0088] , [0090] *
Examination   - Excerpt: Technology options for low power ED - Harry Veendrick, DEEP-SUBMICRON CMOS ICS. FROM BASICS TO ASICS (2ND ED.), KLUWER ACADEMIC PUBLISHERS, PAGE(S) 340 - 342, (20000101), ISBN 90-440-0111-6, XP009178832
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.